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H. Murai, K. Egawa, J. Takashima, H. Naito, and N. Nakatsuka, “Useful inspection method of rubbing polyimide film with optical anisotropy using reflection ellipsometry,” SID 06 Digest, 490-493 (2006).
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D.-K. Yang and S.-T. Wu, Fundamentals of Liquid Crystal Devices (John Wiley & Sons, Chichester, UK, 2006), Chapter 1, pp. 8-9.
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3 |
P. Yeh and C. Gu, Optics of Liquid Crystal Displays (John Wiley & Sons, New York, USA, 1999), Chapter 1.
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佐藤 勇介, Technology information association, LCD/polarization of optical material.control of birefringence.measurement and application (Technology Information Association, 2008), Chapter 5.
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I. Hirosawa, “Method of characterizing rubbed polyimide film for liquid crystal display devices using reflection ellipsometry,” Jpn. J. Appl. Phys. 35, 5873-5875 (1996).
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I. Hirosawa, “Relation between molecular orientation and rubbing strength observed by reflection ellipsometry,” Jpn. J. Appl. Phys. 36, 5192-5196 (1997).
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S. Y. Kim, Ellipsometry (Ajou University Press, Korea, 2000), Chapter 3-4.
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8 |
H. R. Kim and S. Y. Kim, “Precise measurement of optical anisotropy of rubbed PI on patterned glass and its nanoscale variation,” J. Opt. Soc. Korea, to be submitted.
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9 |
B. F. Macdonald, W. Zheng, and R. J. Cole, “Reflection anisotropy spectroscopy: a probe of rubbed polyimide liquid crystal alignment layers,” J. Appl. Phys. 93, 4442-4446 (2003).
DOI
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H. Murai, K. Egawa, J. Takashima, H. Naito, and N. Nakatsuka, “Mura-detection method by using a slit-beam ellipsometer,” J. SID 15, 281-286 (2007).
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11 |
S. S. Kim, H. J. Kim, and S. D. Lee, Display Engineering (Chungbum Publishing Co., Ltd., Korea, 2005), Chapter 3-5.
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