References
- International Technology Roadmap for Semiconductors (ITRS), Semiconductor Industry Association (2000)
- J. Ahn, H. Kim, K. J. Lee, S. Jeon, S. J. Kang, Y. Sun, R. G. Nuzzo, and J. A. Rogers, Nature Nanotechnol. 15, 1754-1757 (2006)
- S. J. Kang, C. Kocabas, T. Ozel, M. Shim, N. Pimparkar, M. A. Alam, S. Rotkin, and J. A. Rogers, Nature Nanotechnol. 2, 230-236 (2007) https://doi.org/10.1038/nnano.2007.77
- Z. Chen, J. Appenzeller, Y-M. Lin, J. S. Oakley, A. G. Rinzler, and J. Tang, Science 311, 1735 (2006) https://doi.org/10.1126/science.1122797
- G. F. Close, S. Yasuda, B. Paul, S. Fujita, and H-SP. Wong, Nano Lett. 8, 706 (2008) https://doi.org/10.1021/nl0730965
- A. E. Aliev, J. Oh, M. E. Kozlov, A. A. Kuznetsov, S. Fang, and A. F. Fonseca, Science 323, 1575-1578 (2009) https://doi.org/10.1126/science.1168312
- C. M. Aguirre, S. Auvray, S. Pigeon, R. Izquierdo, P. Desjardins, and R. Martel, Appl. Phys. Lett. 88, 183104 (2006) https://doi.org/10.1063/1.2199461
- M. W. Rowell, M. A. Topinka, M. D. McGehee, H-J. Prall, G. Dennler, and N. S. Sariciftci, Appl. Phys. Lett. 88, 233506 (2006) https://doi.org/10.1063/1.2209887
- S. K. Lee, J. H. Moon, S. H. Hwang, G. C. Kim, D. Y. Lee, D. H. Kim, and M. H. Jeon, J. Korean Vac. Soc. 17, 1, 67 (2008) https://doi.org/10.5757/JKVS.2008.17.1.067
- S. I. Jung, S. K. Choi, and S. B. Lee, J. Korean Vac. Soc. 17, 4, 365 (2008) https://doi.org/10.5757/JKVS.2008.17.4.365
- S. J. Kang, C. Kocabas, H-S. Kim, Q. Cao, M. A. Meitl, D-Y. Khang, and J. A. Rogers, Nano Lett. 7, 3343-3348 (2007) https://doi.org/10.1021/nl071596s
- S. Yasuda, D. N. Futaba, M. Yumura, S. Iijima, and K. Hata, Appl. Phys. Lett. 93, 143115 (2008) https://doi.org/10.1063/1.2987480
- K. Liu, Y. Sun, L. Chen, C. Feng, X. Feng, K. Jiang, Y. Zhao, and S. Fan, Nano Lett. 8, 700-705 (2008) https://doi.org/10.1021/nl0723073
- S. K. Pal, S. Talapatra, S. Kar, L. Ci, R. Vajtai, T. Borca-Tasciuc, L. S. Schadler, and P. M. Ajayan, Nanotechnol. 19, 045610 (2008) https://doi.org/10.1088/0957-4484/19/04/045610
- J. Martinez, T. D. Yuzvinsky, A. M. Fennimore, A. Zettl, R. Garcíia, and C. Bustamante, Nanotechnol. 16, 2493 (2005) https://doi.org/10.1088/0957-4484/16/11/004
- S. Akita and Y. Nakayama, Jpn. J. Appl. Phys. 41, 4887 (2002) https://doi.org/10.1143/JJAP.41.4887
- C. Kocabas, S. J. Kang, T. Ozel, M. Shim, and J. A. Rogers, J. Phys. Chem. C 111, 17879 (2007) https://doi.org/10.1021/jp071387w
- G. Zhang et al., Proc. Natl. Acad. Sci. U.S.A. 102, 16141 (2005) https://doi.org/10.1073/pnas.0507064102
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