Journal of the Institute of Electronics Engineers of Korea SD (대한전자공학회논문지SD)

The Institute of Electronics and Information Engineers (대한전자공학회)
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A New High Performance Test-data Compression Scheme Using Transition Modification

천이 수정을 통한 고 성능 테스트 데이터 압축 기법

  • Park, Jae-Seok (Department of Electrical Electronic Engineering, Yonsei University) ;
  • Yang, Myung-Hoon (Department of Electrical Electronic Engineering, Yonsei University) ;
  • Kim, Yong-Joon (Department of Electrical Electronic Engineering, Yonsei University) ;
  • Park, Young-Kyu (Department of Electrical Electronic Engineering, Yonsei University) ;
  • Yoon, Hyun-Jun (Department of Electrical Electronic Engineering, Yonsei University) ;
  • Kang, Sung-Ho (Department of Electrical Electronic Engineering, Yonsei University)
  • 박재석 (연세대학교 전기전자공학과) ;
  • 양명훈 (연세대학교 전기전자공학과) ;
  • 김용준 (연세대학교 전기전자공학과) ;
  • 박영규 (연세대학교 전기전자공학과) ;
  • 윤현준 (연세대학교 전기전자공학과) ;
  • 강성호 (연세대학교 전기전자공학과)
  • Published : 2008.09.25
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Abstract

This paper proposes a new test data compression scheme which has good performance. The proposed scheme is composed of adding transition stage and shifting transition stage using don't care remapping technique. The experimental results show that the new scheme provides higher compression ratio than RL-huffman encoding which is the one of the highest performance schemes, and requires smaller hardware overhead. Therefore it can be widely used as a practical solution for test data compression.

본 논문은 높은 압축 성능을 가진 테스트 데이터 압축 기법을 제안한다. 제안하는 기법은 돈 케어 리맵핑을 이용한 천이 추가 단계와 천이 이전 단계로 구성된다. 실험 결과는 새로운 기법이 가장 높은 성능의 기법들 중 하나인 RL-huffman보다 높은 압축률을 제공하고 더 작은 하드웨어 면적을 필요로 함을 보여준다. 따라서 이 기법은 테스트 데이터 압축을 위한 실제적인 해법으로 널리 쓰일 수 있다.

Keywords

References

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