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A New High Performance Test-data Compression Scheme Using Transition Modification  

Park, Jae-Seok (Department of Electrical Electronic Engineering, Yonsei University)
Yang, Myung-Hoon (Department of Electrical Electronic Engineering, Yonsei University)
Kim, Yong-Joon (Department of Electrical Electronic Engineering, Yonsei University)
Park, Young-Kyu (Department of Electrical Electronic Engineering, Yonsei University)
Yoon, Hyun-Jun (Department of Electrical Electronic Engineering, Yonsei University)
Kang, Sung-Ho (Department of Electrical Electronic Engineering, Yonsei University)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.45, no.9, 2008 , pp. 57-64 More about this Journal
Abstract
This paper proposes a new test data compression scheme which has good performance. The proposed scheme is composed of adding transition stage and shifting transition stage using don't care remapping technique. The experimental results show that the new scheme provides higher compression ratio than RL-huffman encoding which is the one of the highest performance schemes, and requires smaller hardware overhead. Therefore it can be widely used as a practical solution for test data compression.
Keywords
RL-huffman; Test data compression; Low power test;
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