• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.9
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• pp.57-64
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• 2008

This paper proposes a new test data compression scheme which has good performance. The proposed scheme is composed of adding transition stage and shifting transition stage using don't care remapping technique. The experimental results show that the new scheme provides higher compression ratio than RL-huffman encoding which is the one of the highest performance schemes, and requires smaller hardware overhead. Therefore it can be widely used as a practical solution for test data compression.