The Journal of Korean Institute of Electromagnetic Engineering and Science (한국전자파학회논문지)

The Korean Institute of Electromagnetic Engineering and Science (한국전자파학회)
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Analysis of TE-Wave Scattering from Transversal-Shifted Tandem Slits Using Wiener-Hopf Techniques and Fourier Transform Analysis

Wiener-Hopf Technique와 Fourier Transform Analysis를 이용한 병렬 슬릿의 TE파 산란 해석

  • Seo, Tae-Yoon (School of Electronics, Telecommunication and Computer Engineering, Korea Aerospace University) ;
  • Ahn, Sung-Hwan (School of Electronics, Telecommunication and Computer Engineering, Korea Aerospace University) ;
  • Lee, Jae-Wook (School of Electronics, Telecommunication and Computer Engineering, Korea Aerospace University) ;
  • Cho, Choon-Sik (School of Electronics, Telecommunication and Computer Engineering, Korea Aerospace University)
  • 서태윤 (한국항공대학교 항공전자 및 정보통신공학부) ;
  • 안성환 (한국항공대학교 항공전자 및 정보통신공학부) ;
  • 이재욱 (한국항공대학교 항공전자 및 정보통신공학부) ;
  • 조춘식 (한국항공대학교 항공전자 및 정보통신공학부)
  • Published : 2008.09.30
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Abstract

In this paper, an analysis of TE-wave scattering from transversal-shifted tandem slits using fourier transform analysis and Wiener-Hopf technique are derived and the electrical performances have been compared with a commercially availabel software. In Fourier transform analysis, it is shown that a fast-convergent series solution can be obtained when the distance between the slits is very narrow, while in Wiener-Hopf technique, it is found that the highly-accurate approximation can be obtained when the gap between the slits becomes wider. In addition, this paper has dealt with a good agreement between two analytical solutions.

본 논문에서는 Fourier-transform analysis와 Wiener-Hopf technique을 사용하여 병렬 슬릿에 의한 TE파 산란의 완전한 표현식을 유도하고 두 방법의 특징을 비교하고자 한다. Fourier transform analysis는 슬릿의 폭이 좁은 경우에는 빠른 수렴해를 얻을 수 있으며, Wiener-Hopf technique은 슬릿의 폭이 넓을 경우(상호 유도 결합이 적은 경우)에 매우 정확한 근사식 결과를 나타내며, 위의 두 해석 결과는 비교적 일치하는 결과들을 보여준다.

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References

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