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http://dx.doi.org/10.5515/KJKIEES.2008.19.9.968

Analysis of TE-Wave Scattering from Transversal-Shifted Tandem Slits Using Wiener-Hopf Techniques and Fourier Transform Analysis  

Seo, Tae-Yoon (School of Electronics, Telecommunication and Computer Engineering, Korea Aerospace University)
Ahn, Sung-Hwan (School of Electronics, Telecommunication and Computer Engineering, Korea Aerospace University)
Lee, Jae-Wook (School of Electronics, Telecommunication and Computer Engineering, Korea Aerospace University)
Cho, Choon-Sik (School of Electronics, Telecommunication and Computer Engineering, Korea Aerospace University)
Publication Information
The Journal of Korean Institute of Electromagnetic Engineering and Science / v.19, no.9, 2008 , pp. 968-977 More about this Journal
Abstract
In this paper, an analysis of TE-wave scattering from transversal-shifted tandem slits using fourier transform analysis and Wiener-Hopf technique are derived and the electrical performances have been compared with a commercially availabel software. In Fourier transform analysis, it is shown that a fast-convergent series solution can be obtained when the distance between the slits is very narrow, while in Wiener-Hopf technique, it is found that the highly-accurate approximation can be obtained when the gap between the slits becomes wider. In addition, this paper has dealt with a good agreement between two analytical solutions.
Keywords
Wiener-Hopf; Fourier Transform; Scattering; Tandem Slits;
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