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MICROLEAKAGE OF 2-STEP ADHESIVE SYSTEMS IN DIAMOND-PREPARED CAVITY

다이아몬드 기구로 삭제한 와동에서 2단계 접착제의 미세누출 비교

  • Lee, Myung-Goo (Department of Conservative Dentistry, College of Dentistry, Chosun University) ;
  • Cho, Kwon-Hwan (Department of Conservative Dentistry, College of Dentistry, Chosun University) ;
  • Cho, Young-Gon (Department of Conservative Dentistry, College of Dentistry, Chosun University)
  • 이명구 (조선대학교 치과대학 치과보존학교실) ;
  • 조권환 (조선대학교 치과대학 치과보존학교실) ;
  • 조영곤 (조선대학교 치과대학 치과보존학교실)
  • Published : 2007.09.29

Abstract

The purpose of this study was to compare the marginal microleakage of different 2-step adhesive systems in Class V cavities prepared with different diamond points. Forty Class V cavities were prepared with two different (coarse or fine) diamond points on cervical third of extracted molars. The occlusal and gingival margin of cavities was located in enamel and dentin, respectively. They were divided into one of four equal groups (n = 10) and ; Group 1-prepared with coarse diamond point (EX-41), restored with Single Bond and Z 250, Group 2-prepared with fine diamond piont (TF-21F), restored with Sing)e Bond and Z 250, Group 3-prepared with coarse diamond point (EX-41), restored with Clearfil SE Bond and Clearfil AP-X, Group 4-prepared with fine diamond point (TF-21F), restored with Clearfil SE Bond and Clearfil AP-X. Specimens were thermocycled, immersed in a 2% methylene blue solution for 24 hours, and bisected longitudinally. They were observed leakages at enamel and dentinal margins. Data were analyzed using Mann-Whitney and Wilcoxon signed ranked test. In this study, marginal microleakage or Single Bond was not affected by type of diamond points. But Clearfil SE Bond showed higher marginal microleakage at both enamel and dentinal margin when Class V cavity was prepared with coarse diamond point.

이 연구는 거친 입자와 미세한 입자의 다이아몬드 포인트로 형성한 5급 와동에서 서로 다른 2단계 접착시스템 사용시 법랑질과 상아질 변연에서의 미세누출 차이를 상호 비교하기 위하여 시행하였다. 40개의 발거한 대구치의 협면 치경부에 각각 $106-205\;{\mu}m$의 거친 다이아몬드 포인트 (EX-41)와 $53-63\;{\mu}m$의 미세한 다이아몬드 포인트 (TF-21F)를 이용하여 20개씩 5급 와동을 형성한 후 사용된 접착시스템과 복합레진에 따라 다음과 같이 4개의 군으로 분류하였다; 1군은 EX-41 포인트로 형성한 와동에 Single Bond와 Z 250을 사용한 군, 2군은 TF-21F 포인트로 형성한 와동에 Single Bond와 Z 250을 사용한 군, 3군은 EX-41 포인트로 형성한 와동에 Clearfil SE Bond와 Clearfil AP-X를 사용한 군, 4군은 TF-21F 포인트로 형성한 와동에 Clearfil SE Bond와 Clearfil AP-X를 사용한 군으로 분류하였다. 각 군은 $5^{\circ}C$$55^{\circ}C$의 증류수에서 500회 열 순환한 후 2% methylene blue용액에 1일 동안 침적하였다. 각 군의 치아를 협설로 절단하여 광학 입체현미경 하에서 법랑질과 상아질 변연에서의 색소침투 정도를 관찰하여 미세누출 점수를 평가하고, 각 군 간의 유의성을 검정하여 다음과 같은 결과를 얻었다. 이 연구를 종합하면, 5급 와동에서 Single Bond는 이 연구에 사용한 다이아몬드 포인트의 종류에 따른 변연 미세누출 차이를 보이지 않았으나 Clearfil SE Bond는 거친 다이아몬드 포인트 보다는 미세한 다이아몬드 포인트를 사용하는 것이 법랑질과 상아질 변연 모두에서 낮은 미세누출을 보였다.

Keywords

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Cited by

  1. Effect of cutting instruments on the dentin bond strength of a self-etch adhesive vol.35, pp.1, 2010, https://doi.org/10.5395/JKACD.2010.35.1.013
  2. Microshear bond strength of a self-etching primer adhesive to enamel according to the type of bur vol.36, pp.6, 2011, https://doi.org/10.5395/JKACD.2011.36.6.477