참고문헌
- Barrett, R. C. and Quate, C. F., 'Charge Storage in a Nitride-Oxide-Silicon Medium by Scanning Capacitance Microscopy,' J. Appl. Phys., Vol. 70, No. 5, pp. 2725-2733, 1991 https://doi.org/10.1063/1.349388
- Sato, A. and Tsukamoto, Y., 'Nanornetre-Scale Recording and Erasing with the Scanning Tunneling Microscope,' Nature, Vol. 363, pp. 431-432, 1993 https://doi.org/10.1038/363431a0
- Takimoto, K., Kawade, H., Kishi, E., Yano, K., Sakai, K., Hatanaka, K., Eguchi, K. and Nakagiri, T., 'Switching and Memory Phenomena in LangmuirBlodgett Films with Scanning Tunneling Microscope,' Appl. Phys. Lett., Vol. 61, No. 25, pp. 3032-3034, 1992 https://doi.org/10.1063/1.108000
-
Hidaka, T., Maruyama, T., Saitoh, M., Mikoshiba, N., Shimizu, M., Shiosaki, T., Wills, L. A., Hiskes, R., Dicarolis, S. A. and Amano, J., 'Formation and Observation of 50 nm Polarized Domains in
$PbZr_{1_ x}Ti_xO_3$ Thin Film using Scanning Probe Microscope,' Appl. Phys. Lett., Vol. 68, No. 17, pp. 2358-2359, 1996 https://doi.org/10.1063/1.115857 - Lee, K., Shin, H., Moon, W. K., Jeon, J. U. and Pak, Y. E., 'Detection Mechanism of Spontaneous Polarization in Ferroelectric Thin Films using Electrostatic Force Microscopy,' Jpn. J. Appl. Phys., Vol. 38, No. 3A, pp. 264-266, 1999 https://doi.org/10.1143/JJAP.38.L264
-
Shin, H., Lee, K., Lim, G, Jeon, J. D., Pak, Y. E., Hong, S. and No, K., 'Formation and Observation of Ferroelectric Domains in
$PbZr_{1_x}Ti_xO_3$ (PZT) Thin ?Films using Atomic Force Microscopy,' Proc. 6th SPIE's Ann. Int. Symp. on Smart Structures and Materials, Switzerland, Vol. 3675, pp. 94-102, 1999 - Hong, S., Woo, J., Shin, H., Jeon, J. U., Pak, Y. E., Colla, E. L., Setter, N., Kim, E. and No, K., 'Principle of Ferroelectric Domain Imaging using Atomic Force Microscope,' J. Appl. Phys., Vol. 89, No.2, pp. 1377-1386, 2001 https://doi.org/10.1063/1.1331654
- Imura, R., Shintani, T., Nakamura, K. and Hosaka, S., 'Nanoscale Modification of Phase Change Materials with Near-Field Light,' Microelectronic Eng., Vol. 30, pp. 387-390, 1996 https://doi.org/10.1016/0167-9317(95)00269-3
- Ma, L. P., Yang, W. J., Xue, Z. Q. and Pang, S. J., 'Data Storage with 0.7nm Recording Marks on Crystalline Organic Thin Film by a Scanning Tunneling Microscope,' Appl. Phys. Lett., Vol. 73, No. 6, pp. 850-852, 1998 https://doi.org/10.1063/1.122022
- Binnig, G, Despont, M., Drechsler, U., Haberle, W., Lutwyche, M., Vettiger, P., Mamin, H. J., Chui, B. W. and Kenny, T. W., 'Ultrahigh-Density Atomic Force Microscopy Data Storage with Erase Capability,' Appl. Phys. Lett., Vol. 74, No.9, pp. 1329-1331, 1999 https://doi.org/10.1063/1.123540
- Vettiger, P., Brugger, J., Despont, M., Drechsler, U., Duig, U., Haberle, W., Lutwyche, M., Rothuizen, H., Stutz, R., Widmer, R. and Binnig, G, 'Ultrahigh Density, High-Data-Rate NEMS-Based AFM Data Storage System,' Microelectronic Eng., Vol. 46, pp. 11-17, 1999 https://doi.org/10.1016/S0167-9317(99)00006-4
- Itoh, T., Ohashi, T. and Suga, T., 'Noncontact Scanning Force Microscopy using a Direct-Oscillating Piezoelectric Microcantilever,' J. Vac. Sci. Technol. B, Vol. 14, No.3, pp. 1577-1581,1996 https://doi.org/10.1116/1.589193
- Minne, S. C., Yaralioglu, G, Manalis, S. R., Adams, J. D., Zesch, J., Atalar, A. and Quate, C. F., 'Automated Parallel High-Speed Atomic Force Microscopy,' Appl. Phys. Lett., Vol. 72, No. 18, pp. 2340-2342, 1998 https://doi.org/10.1063/1.121353
- Marcus, R. B., Ravi, T. S., Gmitter, T, Chin, K., Liu, D., Orvis, W. J., Ciarlo, D. R., Hunt, C. E. and Trujillo, J., 'Formation of Silicon Tips with <1nm Radius,' Appl. Phys. Lett. Vol. 56, No.3, pp. 236-238, 1990 https://doi.org/10.1063/1.102841