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Electrostatically-Driven Polysilicon Probe Array with High-Aspect-Ratio Tip for an Application to Probe-Based Data Storage  

Jeon Jong-Up (울산대학교 기계자동차공학부)
Lee Chang-Soo (삼성종합기술원)
Choi Jae-Joon (삼성종합기술원)
Min Dong-Ki (삼성종합기술원)
Jeon Dong-Ryeol (명지대학교 물리학과)
Publication Information
Journal of the Korean Society for Precision Engineering / v.23, no.6, 2006 , pp. 166-173 More about this Journal
Abstract
In this study, a probe array has been developed for use in a data storage device that is based on scanning probe microscope (SPM) and MEMS technology. When recording data bits by poling the PZT thin layer and reading them by sensing its piezoresponse, commercial probes of which the tip heights are typically shorter than $3{\mu}m$ raise a problem due to the electrostatic forces occurring between the probe body and the bottom electrode of a medium. In order to reduce this undesirable effect, a poly-silicon probe with a high aspect-ratio tip was fabricated using a molding technique. Poly-silicon probes fabricated by the molding technique have several features. The tip can be protected during the subsequent fabrication processes and have a high aspect ratio. The tip radius can be as small as 15 nm because sharpening oxidation process is allowed. To drive the probe, electrostatic actuation mechanism was employed since the fabrication process and driving/sensing circuit is very simple. The natural frequency and DC sensitivity of a fabricated probe were measured to be 18.75 kHz and 16.7 nm/V, respectively. The step response characteristic was investigated as well. Overshoot behavior in the probe movement was hardly observed because of large squeeze film air damping forces. Therefore, the probe fabricated in this study is considered to be very useful in probe-based data storages since it can stably approach toward the medium and be more robust against external shock.
Keywords
Scanning probe microscope; Data storage; Polysilicon probe; Molding; High-aspect-ratio tip;
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