한국전자파학회논문지 (The Journal of Korean Institute of Electromagnetic Engineering and Science)

  • 제15권3호
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  • Pages.271-277
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  • 2004
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  • 1226-3133(pISSN)
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  • 2288-226X(eISSN)
한국전자파학회 (The Korean Institute of Electromagnetic Engineering and Science)
권호 표지

손실층 Sub-mount를 갖는 CPW MMIC용 실리콘 MEMS 패키지

Si-MEMS package Having a Lossy Sub-mount for CPW MMICs

  • 발행 : 2004.03.01
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초록

초고주파 및 밀리미터파 통신 시스템의 집적회로 및 실장 기술로서 CPW기반의 전송선로를 갖는 MMIC 개발이 크게 증가하고 있으나, 실장시 패키지에서 발생되는 기생공진 현상으로 인해 그 성능이 크게 저하될 수 있다. 이런 기생 공진 현상을 억제시키기 위하여 도핑된 lossy 실리콘 웨이퍼를 칩 캐리어로 사용하고, HRS wafer를 사용하여 표면 및 벌크 MEMS 공정이 가능한 실리콘 MEMS 패키지가 해석적으로 제안되었다. 제안된 구조를 제작하여 세 가지의 칩 캐리어(conductor-back metal, 15 Ω$.$cm lossy Si, 15 ㏀$.$cm HRS)위에서 측정하여 실리콘 MEMS 패키지의 특성을 확인하였다. 제안된 실리콘 MEMS 패키지는 15 Ω$.$cm lossy 실리콘 칩 캐리어를 사용하여, 기생 공진 현상을 효과적으로 억제시킬 수 있었다. 전체 패키지에서 중앙의 GaAs CPW 패턴을 de-embedding하여 순수한 CPW MMIC 용의 실리콘 MEMS 패키지는 40 ㎓에서 삽입 손실은 - 2.0 ㏈이며, 전력 손실은 - 7.5 ㏈의 결과를 얻었다.

A Si(Silicon) MEMS(Micro Electro Mechanical System) package using a doped lossy Si carrier for CPW(Coplanar Waveguide) MMICs(Microwave and Millimeter-wave Integrated Circuits) is proposed in order to reduce parasitic problems of leakage, coupling and resonance. The proposed chip-carrier scheme is verified by fabricating and measuring a GaAs CPW on the two types of carriers(conductor-back metal, doped lossy Si) in the frequency from 0.5 to 40 ㎓. The proposed MEMS package using the lightly doped lossy(15 Ω$.$cm) Si chip-carrier and the HRS(High Resistivity Silicon, 15 ㏀$.$cm) shows the optimized loss and parasitic problems-free since the doped lossy Si-carrier effectively absorbs and suppresses the resonant leakage. The Si MEMS package for CPW MMICs has an insertion loss of only - 2.0 ㏈ and a power loss of - 7.5 ㏈ at 40 ㎓.

키워드

참고문헌

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