References
- IEEE Circuits and Devices magazine v.8 Silicon carbide turns on its power M.M.Rahman;S.Furukawa https://doi.org/10.1109/101.121310
- J. Mater. Res. v.7 Prospects for device implementation of wide bandgap semiconductors J.H.Edgar https://doi.org/10.1557/JMR.1992.0235
- Appl. Phys. Lett v.60 Uniform SiC thin-film growth on Si by low pressure rapid thermal chemical vapor deposition A.J.Steckl;J.P.Li https://doi.org/10.1063/1.107104
- Appl. Phys. Lett. v.59 Controlled growth of 3C-SiC and 6H-SiC films on low-tilt-angle vicinal (0001) 6H-SiC wafers J.A.Poweell;J.B.Petit;J.H.Edgar;I.G.Jenkins;L.G.Matus;J.W.Yang;P.Pirouz;W.J.Choyke;L.Clemen;M.Yoganathan https://doi.org/10.1063/1.105587
- Appl. Phys. Lett. v.70 Initial stage for heteroepitaxy of 3C-SiC on the Si(001) surface in dimethylgermane source molecular beam epitaxy T.Hatayama;N.Tanaka;T.Fuyuki;H.Matsunami https://doi.org/10.1063/1.118569
- J. Appl. Phys. v.78 Epitaxial growth of 3C-SiC films on 4 in diam (100) silican wafers by atmospheric pressure chemical vapor deposition Christian A. Zorman;Aaron J. Fleischman;Andrew S. Dewa;Mehran Mehregany;Chacko Jacob;Shigehiro nishino;Pirouz Pirouz https://doi.org/10.1063/1.359745
- J. Crystal Growth v.158 Epitaxial growth of 3C-SiC on Si(111) from hexamethyldisilane C.H.Wu;C.Jacob;X.J.Ning;S.Nishino;P.Pirouz https://doi.org/10.1016/0022-0248(95)00464-5
- Ungyong Mulli v.12 no.3 A study for the CVD growth of 3C-SiC on SOI (Silicon on Insulator) substrates C.K.Moon;B.T.Lee;J.K.Kim;J.H.Park;S.J.Jang
- J. Mater. Res. v.14 no.1 Microstructural investigation of low temperature chemical vapor deposited 3C-SiC/Si thin films using single-source Precursors B.T.Lee;D.K.Kim;Y.H.Seo;S.J.Jang(etc.) https://doi.org/10.1557/JMR.1999.0006
- J. Mater. Res. v.16 no.1 Chemical-vapor-deposition growth and characterization of epitaxial 3C-SiC films on SOI substrates with thin silicon top layers C.K.Moon;J.H.Park;H.J.Song;S.J.Jang;B.T.Lee(etc.) https://doi.org/10.1557/JMR.2001.0007
- Cystal Growth v.10 no.1 Growth characteristics of single-crystalline 6H-SiC homoepitaxial layers grown by a thermal CVD S.J.Jang;W.H.Seol;J.K.Assoc
- J. Appl. Phys. v.64 Chemical vapor deposition and characterization of 6H-SiC thin films on off-axis 6H-SiC substrates H.S.Kong;J.T.Glass;R.F.Davis https://doi.org/10.1063/1.341608
- Cystal Growth v.9 no.3 Growth characteristics of 4H-SiC homoepitaxial Iayers grown by thermal CVD S.J.Jang;M.T.Jeong;W.H.Seol;J.H.Park;J.K.Assoc
- IEEE Electron Device Lett v.16 Planar, ion implanted, high voltage 6H-SiC P-N junction diodes P.M.Shenoy;B.J.Baliga https://doi.org/10.1109/55.464815
- Phys. Rev. B v.33 Relative Raman intensities of the folded modes in SiC poytypes S.Nakashima;H.Katahama;Y.Nakakura;A.Mitsuishi https://doi.org/10.1103/PhysRevB.33.5721
- Korean Phys. Soc. Abstract v.16 no.1 A study for the heteroepitaxial growth of SiC/Si by thermal CVD S.J.Jang;W.H.Seol;J.H.Park
- Phys. Rev. B v.22 Site effect on the impurity levels in 4H, 6H. and 15R SiC M.Ikeda;H.Matsunami;T.Tanaka https://doi.org/10.1103/PhysRevB.22.2842