DOI QR코드

DOI QR Code

Method for Measuring Mechanical Behaviors of Thin Films at High Temperature

고온에서 박막의 기계적 거동 측정 방법

  • 임상채 (전남대학교 대학원 기계시스템공학부) ;
  • 주재황 (전남대학교 대학원 기계시스템공학부) ;
  • 강기주 (전남대학교 공과대학 기계시스템공학부)
  • Published : 2003.01.01

Abstract

Recently, the authors have developed a new material test system fur thin film at the high temperature. It is so compact and precise with sub micron resolution that it seems to be a useful tool fur research of the oxide film growth, its mechanical behavior and failure mechanism. To this end. in this paper three methologies are described for in-situ monitoring of the displacement & strain and the temperature, the oxide thickness. These are the Laser Speckle analysis with digital image correlation technique, the two-color infra-red thermometer and the laser reflection interferometry respectively. The calibration results and some issues which should be addressed for practical application are presented.

Keywords

References

  1. Vinci, R. P. and Baker, S. P., Jan. 2002, 'Mechanical Properties in Small Dimensions,' MRS Bulletin, pp.12-51
  2. Kim, Youngman, 1997,' Elastic Modulus Measurement of Thin Film Using a Dynamic Method,' J. Electronic Materials, Vol. 26, pp. 1002-1008 https://doi.org/10.1007/s11664-997-0237-y
  3. Evans, A. G., Mumm, D. R., Hutchison, J. W., Meier, G. H., and Pettit, F. S., 2001, 'Mechanisms Controlling the Durability of Thermal Barrier Coatings,' Progress in Material Science, Vol. 46, pp. 505-553 https://doi.org/10.1016/S0079-6425(00)00020-7
  4. Clarke, D. R. and Pompe, W., 1999, 'Critical Radius for Interface Separation of a Compressively Stressed Film from a Rough Surface,' Acta Materialia, Vol. 47, pp. 1749-1756 https://doi.org/10.1016/S1359-6454(99)00078-6
  5. Sang Chai Lim, Ki-Ju Kang, 2001, ' Method for Measuring Mechanical Behaviors of Thin Films at High Temperature,' Proceeding of the Korean Welding Society Autumn Annual Meeting, Vol. 38, pp. 225-228
  6. Sutton, M. A. , Chae, T. L. , Turner, T. J. & Bruck, N. A., 1990, 'Developement of a Computer Vision Methodology for the Analysis of Surface Deformations in Magnified Images,' ASTM STM 1094, pp. 109-132
  7. Stoner, B. R., Williams, B. E., Wolter, S. D., Nishimara, K. and Glass, J. T., 1992, 'In-situ Growth Rate Measurement Plasma CVD of Diamond,' J. Mater. Res, Vol .7, pp. 257-260 https://doi.org/10.1557/JMR.1992.0257
  8. Rhines, F. N. and Wolf, J. S., 1970, 'The Role of Oxide Micro Structure and Growth Stresses in the High Temperature Scaling of Nickel,' Metallurgical Transaction Vol. 1, pp. 1701-1710 https://doi.org/10.1007/BF02642020