MRAM Technology for High Density Memory Application

  • Kim, Chang-Shuk (MRAM at the Memory R&D Center in Hynix Semiconductor Inc.) ;
  • Jang, In-Woo (MRAM at the Memory R&D Center in Hynix Semiconductor Inc.) ;
  • Lee, Kye-Nam (MRAM at the Memory R&D Center in Hynix Semiconductor Inc.) ;
  • Lee, Seaung-Suk (MRAM at the Memory R&D Center in Hynix Semiconductor Inc.) ;
  • Park, Sung-Hyung (MRAM at the Memory R&D Center in Hynix Semiconductor Inc.) ;
  • Park, Gun-Sook (MRAM at the Memory R&D Center in Hynix Semiconductor Inc.) ;
  • Ban, Geun-Do (MRAM at the Memory R&D Center in Hynix Semiconductor Inc.) ;
  • Park, Young-Jin (MRAM at the Memory R&D Center in Hynix Semiconductor Inc.)
  • Published : 2002.09.01

Abstract

MRAM(magnetic random access memory) is a promising candidate for a universal memory with non-volatile, fast operation speed and low power consumption. The simplest architecture of MRAM cell is a combination of MTJ(magnetic tunnel junction) as a data storage part and MOS transistor as a data selection part. This article will review the general development status of MRAM and discuss the issues. The key issues of MRAM technology as a future memory candidate are resistance control and low current operation for small enough device size. Switching issues are controllable with a choice of appropriate shape and fine patterning process. The control of fabrication is rather important to realize an actual memory device for MRAM technology.

Keywords

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