한국정보디스플레이학회:학술대회논문집
- 2007.08b
- /
- Pages.1607-1610
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- 2007
Influence of Parasitic Capacitance on the Measurement of CCFL & EEFLs
- Kim, Ga-Eul (Department Electrophysics, Kwangwoon University) ;
- Kang, Mi-Jo (Department Electrophysics, Kwangwoon University) ;
- Lee, Min-Kyu (Department Electrophysics, Kwangwoon University) ;
- Jin, Dong-Jun (Department Electrophysics, Kwangwoon University) ;
-
Jeong, Hee-Suk
(Korea Institute of Lighting Technology)
;
- Kim, Jin-Shon (Korea Institute of Lighting Technology) ;
-
Kim, Jung-Hyun
(Department Electrophysics, Kwangwoon University)
;
- Koo, Je-Huan (Department Electrophysics, Kwangwoon University) ;
- Hong, Byoung-Hee (Department Electrophysics, Kwangwoon University) ;
- Kang, Juneg-Ill (Department Electrophysics, Kwangwoon University) ;
-
Choi, Eun-Ha
(Department Electrophysics, Kwangwoon University)
;
-
Cho, Guang-Sup
(Department Electrophysics, Kwangwoon University)
- Published : 2007.08.27
Abstract
The measurement technology of the electrical and optical properties of CCFL and EEFL for LCD-BLU is investigated. The lamp current and voltage are affected by the leakage of parasitic capacitance. The methods using the photometer and the integrating sphere are compared to determine the lamp efficiency.