한국전기전자재료학회:학술대회논문집 (Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference)
- 한국전기전자재료학회 2005년도 하계학술대회 논문집 Vol.6
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- Pages.15-16
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- 2005
$Ge_1Se_1Te_2$ 상변화 재료를 이용한 고성능 비휘발성 메모리에 대한 연구
A high performance nonvolatile memory cell with phase change material of $Ge_1Se_1Te_2$
- Lee, Jae-Min (Department of Electronic Materials Engineering, Kwangwoon Univ.) ;
- Shin, Kyung (Department of Electronic Materials Engineering, Kwangwoon Univ.) ;
- Chung, Hong-Bay (Department of Electronic Materials Engineering, Kwangwoon Univ.)
- 발행 : 2005.07.07
초록
Chalcogenide phase change memory has high performance to be next generation memory, because it is a nonvolatile memory processing high programming speed, low programming voltage, high sensing margin, low consumption and long cycle duration. We have developed a new material of PRAM with