Test Generation for Speed-Independent Asynchronous Circuits with Undetectable Faults Identification

In this paper, we propose a test pattern generation algorithm on the basis of the identification of undetectable faults for Speed-Independent(SI) asynchronous control circuits. The proposed methodology generates tests from the specification of a target circuit, which describes the behavior of the circuit in the form of Signal Transition Graph (STG). The proposed identification method uses only topological information of a target circuit and reachability information of a fault-free circuit, which is generated in the form of Binary Decision Diagram(BDD) during pre-processing. Experimental results show that high fault coverage over single input stuck-at fault model is obtained for several synthesized SI circuits and the use of the identification process as a preprocessing decreases execution time of the proposed test generation with negligible costs.