• Title/Summary/Keyword: white vapor

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Investigation of Structural and Optical Properties of III-Nitride LED grown on Patterned Substrate by MOCVD (Patterned substrate을 이용하여 MOCVD법으로 성장된 고효율 질화물 반도체의 광특성 및 구조 분석)

  • Kim, Sun-Woon;Kim, Je-Won
    • Korean Journal of Materials Research
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    • v.15 no.10
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    • pp.626-631
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    • 2005
  • GaN-related compound semiconductors were grown on the corrugated interface substrate using a metalorganic chemical vapor deposition system to increase the optical power of white LEDs. The patterning of substrate for enhancing the extraction efficiency was processed using an inductively coupled plasma reactive ion etching system and the surface morphology of the etched sapphire wafer and that of the non-etched surface were investigated using an atomic force microscope. The structural and optical properties of GaN grown on the corrugated interface substrate were characterized by a high-resolution x-ray diffraction, transmission electron microscopy, atomic force microscope and photoluminescence. The roughness of the etched sapphire wafer was higher than that of the non-etched one. The surface of III-nitride films grown on the hemispherically patterned wafer showed the nano-sized pin-holes that were not grown partially. In this case, the leakage current of the LED chip at the reverse bias was abruptly increased. The reason is that the hemispherically patterned region doesn't have (0001) plane that is favor for GaN growth. The lateral growth of the GaN layer grown on (0001) plane located in between the patterns was enhanced by raising the growth temperature ana lowering the reactor pressure resulting in the smooth surface over the patterned region. The crystal quality of GaN on the patterned substrate was also similar with that of GaN on the conventional substrate and no defect was detected in the interface. The optical power of the LED on the patterned substrate was $14\%$ higher than that on the conventional substrate due to the increased extraction efficiency.

Analysis of the Effect on the Performance of Ceramic Metal Halide Lamp by the Loss of Elements that have been Filled in Arc Tube (아크튜브내의 구성물 손실이 세라믹 메탈 핼라이드 램프의 특성에 미치는 영향분석)

  • Jang, Hyeok-Jin;Yang, Jong-Kyung;Park, Dae-Hee
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.58 no.12
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    • pp.2446-2452
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    • 2009
  • A Ceramic Metal-halide lamp is achieved by adding multiple metals to a basic mercury discharge. Because the vapor pressure of most metals is very much lower than mercury itself, metal-halide salts of the desired metals, having higher vapor pressures, are used to introduce the material into the basic discharge. The metal compounds are usually polyatomic iodides, which vaporize and subsequently dissociate as they diffuse into the bulk plasma. Metals with multiple visible transitions are necessary to achieve high photometric efficiency and good color. Compounds of Sc, Dy, Ho, Tm, Ce, Pr, Yb and Nd are commonly used. The maximum visible efficacy of a Ceramic Metal Halide lamp, under the constant of a white light source, is predicted to be about 450lm/W. This is controlled principally by the chemical fill chosen for a particular lamp. Current these lamps achieve 130lm/W and these life time are the maximum 16,000[hr]. So factors of performance lower are necessary to improve lamp performance. In this paper, we analyzed factors of performance lower by accelerated deterioration test. The lamp was operated with short duration turn-on/turn-off procedure to enhance the effect due to electrode sputtering during lamp ignition. The tested lamp that was operated with a longer turn-on/off(20/20 minutes) showed blackening, changed distance between electrodes and lowered color rendering & color temperature by losses of Dy at 421.18nm, I at 511nm, T1 at 535nm and Na at 588nm compared with the new lamp.

Hexagonal Boron Nitride Monolayer Growth without Aminoborane Nanoparticles by Chemical Vapor Deposition

  • Han, Jaehyu;Yeo, Jong-Souk
    • Proceedings of the Korean Vacuum Society Conference
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    • 2014.02a
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    • pp.409-409
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    • 2014
  • Recently hexagonal boron nitride (h-BN), III-V compound of boron and nitrogen with strong covalent $sp^2$ bond, is a 2 dimensional insulating material with a large direct band gap up to 6 eV. Its outstanding properties such as strong mechanical strength, high thermal conductivity, and chemical stability have been reported to be similar or superior to graphene. Because of these excellent properties, h-BN can potentially be used for variety of applications such as dielectric layer, deep UV optoelectronic device, and protective transparent substrate. Ultra flat and charge impurity-free surface of h-BN is also an ideal substrate to maintain electrical properties of 2 dimensional materials such as graphene. To synthesize a single or a few layered h-BN, chemical vapor deposition method (CVD) has been widely used by using an ammonia borane as a precursor. Ammonia borane decomposes into hydrogen (gas), monomeric aminoborane (solid), and borazine (gas) that is used for growing h-BN layer. However, very active monomeric aminoborane forms polymeric aminoborane nanoparticles that are white non-crystalline BN nanoparticles of 50~100 nm in diameter. The presence of these BN nanoparticles following the synthesis has been hampering the implementation of h-BN to various applications. Therefore, it is quite important to grow a clean and high quality h-BN layer free of BN particles without having to introduce complicated process steps. We have demonstrated a synthesis of a high quality h-BN monolayer free of BN nanoparticles in wafer-scale size of $7{\times}7cm^2$ by using CVD method incorporating a simple filter system. The measured results have shown that the filter can effectively remove BN nanoparticles by restricting them from reaching to Cu substrate. Layer thickness of about 0.48 nm measured by AFM, a Raman shift of $1,371{\sim}1,372cm^{-1}$ measured by micro Raman spectroscopy along with optical band gap of 6.06 eV estimated from UV-Vis Spectrophotometer confirm the formation of monolayer h-BN. Quantitative XPS analysis for the ratio of boron and nitrogen and CS-corrected HRTEM image of atomic resolution hexagonal lattices indicate a high quality stoichiometric h-BN. The method presented here provides a promising technique for the synthesis of high quality monolayer h-BN free of BN nanoparticles.

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Effect of Flue Gas Heat Recovery on Plume Formation and Dispersion

  • Wu, Shi Chang;Jo, Young Min;Park, Young Koo
    • Particle and aerosol research
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    • v.8 no.4
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    • pp.161-172
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    • 2012
  • Three-dimensional numerical simulation using a computational fluid dynamics (CFD) was carried out in order to investigate the formation and dispersion of the plume discharged from the stack of a thermal power station. The simulation was based on the standard ${\kappa}{\sim}{\varepsilon}$ turbulence model and a finite-volume method. Warm and moist exhaust from a power plant stack forms a visible plume as entering the cold ambient air. In the simulation, moisture content, emission velocity and temperature of the flue gas, air temperature and wind speed were dealt with the main parameters to analyze the properties of the plume composed mainly of water vapor. As a result of the simulation, the plume could be more apparent in cold winter due to a big difference of latent heat capacity. At no wind condition, the white plume rises 120 m upward from the top of the stack, and expands to 40 m around from the stack in cold winter after flue gas heat recovery. The influencing distance of relative humidity will be about 100 m to 400 m downstream from the stack with a cross wind effect. The decrease of flue gas temperature by heat recovery of thermal energy facilitates the formation of the plume and restrains its dispersion. Wind speed with vertical distribution affects the plume dispersion as well as the density.

Comparison of Equilibrium Moisture Contents for Conventional Kiln Dried- and High Temperature Dried Softwood Lumber by Moisture Content Determination (관행열기건조(慣行熱氣乾操)와 고온건조(高溫乾燥) 침엽수재(針葉樹材)의 함수율(含水率) 측정법(測定法)에 의한 평형함수율(平衡含水率) 비교(比較))

  • Jung, Hee-Suk;Smith, William B.
    • Journal of the Korean Wood Science and Technology
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    • v.22 no.4
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    • pp.37-42
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    • 1994
  • The adsorption of water vapor and equilibrium moisture content(EMC) of the specimens for four softwood species dried by conventional- and high temperature method and equilibrated to 15% of the target EMC condition at 25$^{\circ}C$ were determined by oven drying method and with moisture meters. The amount of adsorption for high temperature dried red pine was significantly higher than that of conventional kiln dried wood, while those of eastern white pine, eastern hemlock and Norway spruce were not significantly different between drying methods. EMCs of these four species determined by oven drying method and with capacitive admittance moisture meter were not significantly different between drying methods. EMC of high temperature dried red pine determined with resistance moisture meter was significantly higher than that of conventional kiln dried wood. But EMCs of other species did not show significant difference between drying methods. EMCs of conventional and high-temperature dried wood determined with electronic moisture meters, especially in the case of the capacitive-admittance moisture meter measurement, were lower than that determined by oven drying method.

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Study of New Light Source with Nano Carbon Material (나노카본을 이용한 조명용 신광원에 관한 연구)

  • Kim, Kwang-Bok;Kim, Yong-Won;Jung, Han-Gi;Song, Yoon-Ho
    • Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
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    • 2006.05a
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    • pp.31-34
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    • 2006
  • The characteristic of carbon nano fiber (CNF) as electron emitters was described. Carbon nano fiber (CNF) of herringbone was prepared by thermal chemical vapor deposition(CVD), mixed with binders and conductive materials, and then were formed by screen-printing process. In order to increase effectively field emissions, the surface treatment of rubbing & peel-off was applied to the printed CNF emitters on cathode electrode. The measurements of field emission properties were carried out by using a diode structure inline vacuum chamber. CNF of herringbone type showed good emission properties that a turn on field was as low as $2.5V/{\mu}m$ and current density was as large as $0.15mA/cm^2$ of $4.5V/{\mu}m$ with electric field. After the vacuum packaged panel of 5-inch in diagonal, the measured white brightness was as high as $7000cd/m^2$ at 1900V of anode and 700V of gate voltage.

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A Study on Image Analysis of Graphene Oxide Using Optical Microscopy (광학 현미경을 이용한 산화 그래핀 이미지 분석 조건에 관한 연구)

  • Lee, Yu-Jin;Kim, Na-Ri;Yoon, Sang-Su;Oh, Youngsuk;Lee, Jea Uk;Lee, Wonoh
    • Composites Research
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    • v.27 no.5
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    • pp.183-189
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    • 2014
  • Experimental considerations have been performed to obtain the clear optical microscopic images of graphene oxide which are useful to probe its quality and morphological information such as a shape, a size, and a thickness. In this study, we investigated the contrast enhancement of the optical images of graphene oxide after hydrazine vapor reduction on a Si substrate coated with a 300 nm-thick $SiO_2$ dielectric layer. Also, a green-filtered light source gave higher contrast images comparing to optical images under standard white light. Furthermore, it was found that a image channel separation technique can be an alternative to simply identify the morphological information of graphene oxide, where red, green, and blue color values are separated at each pixels of the optical image. The approaches performed in this study can be helpful to set up a simple and easy protocol for the morphological identification of graphene oxide using a conventional optical microscope instead of a scanning electron microscopy or an atomic force microscopy.

Photoemission Electron Micro-spectroscopic Study of the Conductive Layer of a CVD Diamond (001)$2{\times}1$ Surface

  • Kono, S.;Saitou, T.;Kawata, H.;Goto, T.
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.02a
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    • pp.7-8
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    • 2010
  • The surface conductive layer (SCL) of chemical vapor deposition (CVD) diamonds has attracting much interest. However, neither photoemission electron microscopic (PEEM) nor micro-spectroscopic (PEEMS) information is available so far. Since SCL retains in an ultra-high vacuum (UHV) condition, PEEM or PEEMS study will give an insight of SCL, which is the subject of the present study. The sample was made on a Ib-type HTHP diamond (001) substrate by non-doping CVD growthin a DC-plasma deposition chamber. The SCL properties of the sample in air were; a few tens K/Sq. in sheet resistance, ${\sim}180\;cm^2/vs$ in Hall mobility, ${\sim}2{\times}10^{12}/cm^2$ in carrier concentration. The root-square-mean surface roughness (Rq) of the sample was ~0.2nm as checked by AFM. A $2{\times}1$ LEED pattern and a sheet resistance of several hundreds K/Sq. in UHV were checked in a UHV chamber with an in-situ resist-meter [1]. The sample was then installed in a commercial PEEM/S apparatus (Omicron FOCUS IS-PEEM) which was composed of electro-static-lens optics together with an electron energy-analyzer. The presence of SCL was regularly monitored by measuring resistance between two electrodes (colloidal graphite) pasted on the two ends of sample surface. Figure 1 shows two PEEM images of a same area of the sample; a) is excited with a Hg-lamp and b) with a Xe-lamp. The maximum photon energy of the Hg-lamp is ~4.9 eV which is smaller that the band gap energy ($E_G=5.5\;eV$) of diamond and the maximum photon energy of the Xe-lamp is ~6.2 eV which is larger than $E_G$. The image that appear with the Hg-lamp can be due to photo-excitation to unoccupied states of the hydrogen-terminated negative electron affinity (NEA) diamond surface [2]. Secondary electron energy distribution of the white background of Figs.1a) and b) indeed shows that the whole surface is NEA except a large black dot on the upper center. However, Figs.1a) and 1b) show several features that are qualitatively different from each other. Some of the differences are the followings: the two main dark lines A and B in Fig.1b) are not at all obvious and the white lines B and C in Fig.1b) appear to be dark lines in Fig.1a). A PEEMS analysis of secondary electron energy distribution showed that all of the features A-D have negative electron affinity with marginal differences among them. These differences can be attributed to differences in the details of energy band bending underneath the surface present in SCL [3].

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Effect of EuO$_3$addition on hydrothermal stability of t-ZrO$_2$/Al$_2$O$_3$composites (t-ZrO$_2$/Al$_2$O$_3$복합체 상 안정성에 대한 Eu$_2$O$_3$첨가 효과)

  • 이득용;김대준;최성갑;이명현
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.10 no.3
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    • pp.233-238
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    • 2000
  • t-$ZrO_2/Al_2O_3$composites having a superior biocompatability and phase stability were prepared by adding 0~4 mol% of $Eu_2O_3$and sintered for 1 h at $1600^{\circ}C$ to evaluate phase stability, chromaticity and mechanical properties of the composites. No tetragonal to monoclinic phase transformation was observed for the composites containing $Eu_2O_3$after heat treatment for 20 h at $180^{\circ}C$ under 3.5 MPa water vapor pressure condition. As $Eu_2O_3$content increased, the color of the composites was changed from a slight white ivory to a light pink. The strength and the fracture toughness of the composites containing $Eu_2O_3$were above 620 MPa and 7.6 MPa.$m^{1/2}$, respectively, when $Eu_2O_3$was added up to 3 mol%.

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Analysis and reduction of thermal magnetic noise in liquid-He dewar for sensitive low-field nuclear magnetic resonance measurements

  • Hwang, S.M.;Yu, K.K.;Lee, Y.H.;Kang, C.S.;Kim, K.;Lee, S.J.
    • Progress in Superconductivity and Cryogenics
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    • v.15 no.2
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    • pp.20-23
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    • 2013
  • For sensitive measurements of micro-Tesla nuclear magnetic resonance (${\mu}T$-NMR) signal, a low-noise superconducting quantum interference device (SQUID) system is needed. We have fabricated a liquid He dewar for an SQUID having a large diameter for the pickup coil. The initial test of the SQUID system showed much higher low-frequency magnetic noise caused by the thermal magnetic noise of the aluminum plates used for the vapor-cooled thermal shield material. The frequency dependence of the noise spectrum showed that the noise increases with the decrease of frequency. This behavior could be explained from a two-layer model; one generating the thermal noise and the other one shielding the thermal noise by eddy-current shielding. And the eddy-current shielding effect is strongly dependent on the frequency through the skin-depth. To minimize the loop size for the fluctuating thermal noise current, we changed the thermal shield material into insulated thin Cu mesh. The magnetic noise of the SQUID system became flat down to 0.1 Hz with a white noise of 0.3 $fT/{\surd}Hz$, including the other noise contributions such as SQUID electronics and magnetically shielded room, etc, which is acceptable for low-noise ${\mu}T$-NMR experiments.