• 제목/요약/키워드: voltage standard

검색결과 977건 처리시간 0.025초

A temperature sensor with low standard deviation with generating reference voltage for use in IoT applications (IoT 어플리케이션에서 활용하는 참조 전압을 같이 생성할 수 있는 표준 편차가 낮은 온도 센서)

  • Juwon Oh;Younggun Pu;Yeonjae Jung;Kangyoon Lee
    • Transactions on Semiconductor Engineering
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    • 제2권2호
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    • pp.10-14
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    • 2024
  • This paper presents a circuit design aimed at generating the required reference voltage and temperature sensor voltage in conjunction with an ADC, utilizing the current generated by temperature characteristics of BJT components for sensor data conversion. Additionally, two control methods are introduced to reduce the standard deviation of the circuit, resulting in over a ten-fold decrease in standard deviation. The proposed circuit occupies an area of 0.057mm2 and was implemented using 55nm RF process.

Evaluation of Errors of Electronic Voltage Transformer using High Voltage Capacitance Bridge and Standard Capacitive divider (고전압 전기용량 브지리와 표준용량분압기를 이용한 전자식 전압변성기의 평가)

  • Han, Sang-Gil;Kim, Yoon-Hyoung;Jung, Jae-Kap;Kang, Jeon-Hong;Lee, Sang-Hwa;Han, Sang-Ok
    • Proceedings of the KIEE Conference
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    • 대한전기학회 2008년도 추계학술대회 논문집 전기설비전문위원
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    • pp.61-63
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    • 2008
  • We established a system to evaluate the ratio error and phase angle error of electronic voltage transformer using high voltage capacitance bridge and standard capacitors. The uncertainty of evaluation system is about 0.005% in ratio error and 1.5 min in phase angel error.

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Performance Evaluation with Protective Function test of Inverter for Solar Power Generation (태양광발전용 인버터 보호기능시험 성능평가)

  • Yoon, Yong-Ho
    • The Transactions of The Korean Institute of Electrical Engineers
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    • 제67권11호
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    • pp.1570-1575
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    • 2018
  • The increased penetration of PV is impacting on grid operation and in particular the voltage within the local grid can be significantly influenced by the various PV systems. The increased penetration of PV is impacting on grid operation and in particular the voltage within the local grid can be significantly influenced by the various PV systems. This paper describes domestic technical standard of Photovoltaic(PV) PCS(Power Conditioning Systems)- Characteristics of the utility interface. Especially protective function test items of 1) Output overvoltage protection test, 2) Output undervoltage protection test, 3) Frequency rise protection test, 4) Frequency fall protection test, 5) System voltage's momentary interruptions, 6) System voltage distortion capability test. Therefore in this paper protective function test item of facilities evaluation detailed standards for new renewable energy, small, medium and large photovoltaic inverter standard is studied and analyzed and finally full tested by PV inverter performance function.

A Study on Ratio Error and Phase Angle Error Caused by an External Burden in Voltage Transformer (외부부담이 전압변성기의 비오차와 위상각오차에 미치는 영향에 대한 연구)

  • 정재갑;권성원;김규태;김명수
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • 제53권3호
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    • pp.137-142
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    • 2004
  • A voltage transformer(VT) used for the estabilishment of high voltage national standard, has generally ratio error and phase angle error. Both errors in VT depend critically on values of external burden of VT used. Both ratio ewer and phase angle error in existence of the external burden is calculated. These calculated values are very well consistent with the experimental result. The principle and the measurement method of VT in our institute are also explained.

Temperature Stable Current Source Using Simple Self-Bias Circuit

  • Choi, Jin-Ho
    • Journal of information and communication convergence engineering
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    • 제7권2호
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    • pp.215-218
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    • 2009
  • In this paper, temperature stable current and voltage references using simple CMOS bias circuit are proposed. To obtain temperature stable characteristics of bias circuit a bandgap reference concept is used in a conventional circuit. The parasitic bipolar transistors or MOS transistors having different threshold voltage are required in a bandgap reference. Thereby the chip area increase or the extra CMOS process is required compared to a standard CMOS process. The proposed reference circuit can be integrated on a single chip by a standard CMOS process without the extra CMOS process. From the simulation results, the reference current variation is less than ${\pm}$0.44% over a temperature range from - $20^{\circ}C$ to $80^{\circ}C$. And the voltage variation is from - 0.02% to 0.1%.

Power Signal Flicker Detection Based on Filter Bank Technique (필터뱅크기법에 기반한 전력신호 플리커 검출)

  • Choi, Hun;Bae, Hyeon-Deok
    • The Transactions of The Korean Institute of Electrical Engineers
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    • 제65권1호
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    • pp.179-193
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    • 2016
  • In power quality monitoring, voltage fluctuation is one of the power quality problems, which cause light flickers. To determine the flicker severity, the flicker meter concept was developed in an IEC 61000-4-15 standard. Generally, voltage fluctuations are described as an amplitude modulation(AM). The flicker meter of IEC 61000-4-15 as an international standard for flicker measurement recommends square demodulation method to detect flicker signals from voltage fluctuation signals. This paper suggests a new effective method using filter bank to detect and estimate flicker signals, which do not need square demodulation. For the accurate detection of flicker signals, the filter bank is designed with a full consideration of the spectrum characteristics of voltage fluctuation signals described as AM. The frequency and magnitude of the detected flicker signals are estimated using recursive method. Computer simulations were performed on synthesized signals to prove validity of the proposed method.

Threshold Voltage Control of a-Si TFT by Delta Doping of Phosphorous

  • Soh, Hoe-Sup;Kim, Cheol-Se;Kim, Eung-Do
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2007년도 7th International Meeting on Information Display 제7권2호
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    • pp.1165-1167
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    • 2007
  • Delta doping method can separate the threshold voltage control region from the charge transport region in a-Si TFT, whereby the threshold voltage of a TFT could be modified. Threshold voltage could be changed by delta doping, while field effect mobility was estimated to be 80% of that of standard TFT.

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An Analysis of the Induced Voltage characteristic on 22.9kV-Y Distribution Lines (가공배전선에 의한 유도전압 특성 분석)

  • Lim, Yong-Hun
    • Proceedings of the KIEE Conference
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    • 대한전기학회 2003년도 하계학술대회 논문집 A
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    • pp.500-502
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    • 2003
  • This paper reviews calculating of induced voltage onto a communication line from 22.9kV-Y Distribution Lines. The coexistence of both power line and communication line in parallel generates the induction of significant longitudinal voltage in the weak current line. In order to evaluate a precise induced voltage, this paper indicated some problems about coefficient and numerical formula. It also presents some induced voltage production technology standard application.

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Threshold Voltage Shift for Doping Profile of Asymmetric Double Gate MOSFET (도핑분포함수에 따른 비대칭 이중게이트 MOSFET의 문턱전압이동현상)

  • Jung, Hakkee
    • Journal of the Korea Institute of Information and Communication Engineering
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    • 제19권4호
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    • pp.903-908
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    • 2015
  • This paper has analyzed threshold voltage shift for doping profile of asymmetric double gate(DG) MOSFET. Ion implantation is usually used in process of doping for semiconductor device and doping profile becomes Gaussian distribution. Gaussian distribution function is changed for projected range and standard projected deviation, and influenced on transport characteristics. Therefore, doping profile in channel of asymmetric DGMOSFET is affected in threshold voltage. Threshold voltage is minimum gate voltage to operate transistor, and defined as top gate voltage when drain current is $0.1{\mu}A$ per unit width. The analytical potential distribution of series form is derived from Poisson's equation to obtain threshold voltage. As a result, threshold voltage is greatly changed by doping profile in high doping range, and the shift of threshold voltage due to projected range and standard projected deviation significantly appears for bottom gate voltage in the region of high doping concentration.

Evaluation for Ratio Error of Voltage Transformer Comparator using Standard Resistors (표준저항기를 이용한 전압변성기 비교기의 비오차 평가)

  • Han, Sang-Gil;Kim, Yoon-Hyoung;Jung, Jae-Kap;Han, Sang-Ok
    • The Transactions of the Korean Institute of Electrical Engineers P
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    • 제57권4호
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    • pp.412-416
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    • 2008
  • We have developed the calibration technique of the VT comparator using nonreactive standard resistors, which evaluates both accuracy and linearity of the VT comparator by comparing experimental values with theoretical values. The correction values of VT comparator obtained by using both our method and wide ratio error VT are consistent within the expanded uncertainty. Furthermore the specification for ratio error of VT comparator have been revaluated.