• Journal of the Korean Society of Safety
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• v.32 no.2
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• pp.34-37
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• 2017

In recent emerging industry, Display field becomes bigger and bigger, and also semiconductor technology becomes high density integration. In Flat Panel Display, there is an issue that electrostatic phenomenon results in fine dust adsorption as electrostatic capacity increases due to bigger size. Destruction of high integrated circuit and pattern deterioration occur in semiconductor and this causes the problem of weakening of thermal resistance. In order to solve this sort of electrostatic failure in this process, Soft X-ray ionizer is mainly used. Soft X-ray Ionizer does not only generate electrical noise and minute particle but also is efficient to remove electrostatic as it has a wide range of ionization. X-ray Generating efficiency has an effect on soft X-ray Ionizer affects neutralizing performance. There exist variable factors such as type of anode, thickness, tube voltage etc., and it takes a lot of time and financial resource to find optimal performance by manufacturing with actual X-ray tube source. MCNPX (Monte Carlo N-Particle Extended) is used for simulation to solve this kind of problem, and optimum efficiency of X-ray generation is anticipated. In this study, X-ray generation efficiency was measured according to target material thickness using MCNPX under the conditions that tube voltage is 5 keV, 10 keV, 15 keV and the target Material is Tungsten(W), Gold(Au), Silver(Ag). At the result, Gold(Au) shows optimum efficiency. In Tube voltage 5 keV, optimal target thickness is $0.05{\mu}m$ and Largest energy of Light flux appears $2.22{\times}10^8$ x-ray flux. In Tube voltage 10 keV, optimal target Thickness is $0.18{\mu}m$ and Largest energy of Light flux appears $1.97{\times}10^9$ x-ray flux. In Tube voltage 15 keV, optimal target Thickness is $0.29{\mu}m$ and Largest energy of Light flux appears $4.59{\times}10^9$ x-ray flux.

• Publications of The Korean Astronomical Society
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• v.15 no.spc1
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• pp.73-83
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• 2000

X-ray astronomy deals with measurements of the electromagnetic radiation in the energy range of $E\~0.1-100 keV (\lambda\~0.12-120{\AA})$. The wavelength of X-ray is comparable to the size of atoms, so that the photons in the X-ray range are usually produced and absorbed by the atomic processes. Since the launch of the first X-ray astronomy satellite 'Uhuru' in 1970, technological advances in a launch capability and a detection capability make X-ray astronomy one of the most rapidly evolving fields of astronomical research. Particularly, a spectral resolving power $E/{\Delta}E$ has been increased by an order of 2 - 3 (in the energy range of 0.1 - 10 keV) during the past 30years. In this paper, I briefly review a developing process of the resolving power and spectroscopic techniques. Then I describe important emission/absorption lines in X-ray astronomy, as well as diagnostics of gas property with line parameters.

• Nuclear Engineering and Technology
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• v.54 no.3
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• pp.1062-1070
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• 2022

In the present communication, pure and stable α-Bismuth Oxide (Bi₂O₃) nanoparticles (NPs) were synthesized by low temperature solution combustion method using urea as a fuel and calcined at 500℃. The synthesized sample was characterized by using powder X-ray Diffraction (PXRD), Scanning Electron Microscopy (SEM), Energy dispersive X-ray analysis (EDAX), Transmission Electron Microscopy (TEM), Fourier Transform Infrared Spectroscopy (FTIR) and UV-Visible absorption spectroscopy. The PXRD pattern confirms the formation of mono-clinic, stable and low temperature phase α-Bi₂O₃. The direct optical energy band gap was estimated by using Wood and Tauc's relation which was found to be 2.81 eV. The characterized sample was studied for X-ray/gamma ray shielding properties in the energy range 0.081-1.332 MeV using NaI (Tl) detector and multi channel analyzer (MCA). The measured shielding parameters agrees well with the theory, whereas, slight deviation up to 20% is observed below 356 keV. This deviation is mainly due to the influence of atomic size of the target medium. Furthermore an accurate theory is necessary to explain the interaction of X-ray/gamma ray with the NPs.The present work opens new window to use this facile, economical, efficient, low temperature method to synthesize nanomaterials for X-ray/gamma ray shielding purpose.

• Journal of radiological science and technology
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• v.32 no.4
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• pp.393-399
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• 2009

In this study, we measured the dose distribution of scattered ray in X-ray radiography room using an ion chamber and examined the dependency of scattered ray content on the scattered ray source and exposure condition. To study the factors of scattered ray occurrence in the acryl phantom, we measured the change in the scatted ray content according to the X-ray tube voltage (40~140 kV) and the field size ($10{\times}10\;cm^2$, $20{\times}20\;cm^2$, $35{\times}35\;cm^2$). For the $35{\times}35\;cm^2$ field size, the side-scattering rate ranged from 3.1% to 14.5%. The scattered ray contributions of the phantom, collimator, X-ray tube and wall were also measured. The scattered ray contribution of the phantom was higher than 95.4% for the entire tube voltage, and those of the collimator, X-ray tube and wall were 2.6%, 1.3% and 0.7%, respectively.

• Journal of Radiation Protection and Research
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• v.10 no.1
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• pp.14-28
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• 1985

The development of mono energetic photon sources using $K_{\alpha}$ fluorescence X-ray of pure material was carried out in the energy range below 100 keV. The monoenergetic photons are very useful in the calibration of the radiation measuring instruments and can be produced as the $K_{\alpha}$ fluorescence X-ray by irradiating the bremsstrahlung to the thin pure metal foils called ‘radiators’. In this experiment, several radiators such as $_{47}Ag,\;_{50}Sn,\;_{68}Er,\;_{70}Yb,\;and\;_{82}Pb$ provide the wide monoenergetic photon energy ranging from 20 keV to 80 keV. By the spectrometry with HpGe LEPS, spectral purity factors which measure the monochrometicity for the $K_{\alpha}$ fluorescence X-ray, were determined as $0.64{\sim}0.94$. Dosimetry for the purpose of the determination of the exposure rate with a 600cc thin window ionization chamber, which was calibrated by the standard free-air ionization chamber, was performed. Exposure rates ranging $8.3{\sim}232.5mR/h$ was obtained according to the $K_{\alpha}$ fluorescence X-ray energy for each radiator.

• Journal of Radiation Protection and Research
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• v.26 no.3
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• pp.287-290
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• 2001

The 9.17MeV gamma-rays from the $^{13}C(p,\;{\gamma})^{14}N,\;^{14}N({\gamma},\;{\gamma})^{14}N$ reactions were measured. The incident 9.17MeV gamma-ray was produced from the $^{13}C(p,\;{\gamma})^{14}N$ reaction at Ep=1.75MeV resonance. The 1.75MeV proton beam was accelerated using the 3MV SNU-AMS Tandetron and 1.7MV KIGAM Tandem accelerators. The enriched 13C target was $121{\mu}g/cm^2$ self-supporting foil, and we used liquid nitrogen as a resonant absorption target. We used a HP-Ge detector with 30% efficiency and less 2keV energy resolution. We developed new method to detect the scattered 9.17MeV gamma-ray from the nitrogen target by using the energy difference between the Doppler shifted gamma-ray from the $^{13}C(p,\;{\gamma})^{14}N$ reaction and the resonant absorbed and rescattered gamma-ray from the $^{14}N({\gamma},\;{\gamma})^{14}N$ reaction.

• Journal of The Korean Astronomical Society
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• v.29 no.spc1
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• pp.41-42
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• 1996

A possible cosmic X-ray background(XRB) radiation related to original antimatter is considered. If the universe is made of separating domains of antimatter and matter, the photons produced by the annihilation of electron-positron and proton-antiproton on the last scattering surface would reach us in the energy $\~$0.45 keV and $\~$60 keV respectively because of the redshift. The spectrums of X-ray radiation from annihilation are deduced and a possible observational figure is described also.

• Journal of radiological science and technology
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• v.41 no.2
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• pp.129-134
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• 2018

The present study made a phantom for gamma ray of 140 keV radiated from $^{99m}Tc$, examined shielding effect of lead by thickness of the shielding material, and measured surface dose and depth dose by body depth. The OSL Nano Dot dosimeter was inserted at 0, 3, 15, 40, 90, and 180 mm depths of the phantom, and when there was no shield, 0.2 mm lead shield, 0.5 mm lead shield, The depth dose was measured. Experimental results show that the total cumulative dose of dosimeters with depth is highest at 366.24 uSv without shield and lowest at 94.12 uSv with 0.5 mm lead shield. The shielding effect of 0.2 mm lead shielding was about 30.18% and the shielding effect of 0.5 mm lead shielding was 74.30%, when the total sum of the accumulated doses of radiation dosimeter was 100%. The phantom depth and depth dose measurements showed the highest values at 0 mm depth for all three experiments and the dose decreases as the depth increases. This study proved that the thicker a shielding material, the highest its shielding effect is against gamma ray of 140 keV. However, it was known that shielding material can't completely shield a body from gamma ray; it reached deep part of a human body. Aside from the International Commission on Radiation Units and Measurements (ICRU) recommending depth dose by 10 mm in thickness, a plan is necessary for employees working in department of nuclear medicine where they deal with gamma ray, which is highly penetrable, to measure depth dose by body depth, which can help them manage exposed dose properly.

• Journal of radiological science and technology
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• v.30 no.3
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• pp.245-250
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• 2007

This research measured the shielding rates of apron 0.25 and 0.5 mmPb for X-ray energy in diagnosis radiation system and gamma-ray energy of $^{99m}Tc$-MDP and $^{18}F$-FDG. X-ray energies were measured on effective energy of $26.2{\sim}45.6\;keV$ when additional filtering plate of 0, 2 mmAl is used within the range of tube voltage $40{\sim}120\;kVp$, and at this time, apron 0.5 mmPb has shown about 5.5% of increase in its shielding rate over 0.25 mmPb at the highest quality. Besides, the aprons of the two types have shown high shielding rate of over 90% for direct X-ray and spatial dose rate. And, in case 0.25 and 0.5 mmPb aprons were used at 140keV of $^{99m}Tc$-MDP, the shielding effects were between 30 and 53%, and at high energy of 511 keV, $^{18}F$-FDG, the shielding effects of apron, $1.3{\sim}3.6%$, were very small.

• Journal of Radiation Protection and Research
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• v.40 no.2
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• pp.110-117
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• 2015

Recently, Due to the increased industry using radiation inspection equipment in the semiconductor, this demand of technology research is increasing. Although semiconductor inspection equipment is using low energy X-ray from 40 keV to 120 keV, Studies of radiation damage about the low energy X-ray are lacking circumstance in our country. Therefore, It is study that BJT (bipolar junction transistor) of one type of semiconductor elements are received radiation damage by low energy X-ray. BJT were used to the NXP semiconductor company's BC817-25 (NPN type), and Used the X-ray generator for the irradiation. Radiation damage of BJT was evaluated that confirm to analyse change of collector-emitter voltage of before and after X-ray irradiation when current gain fixed to 10. X-ray generator of tube voltage was setting 40 kVp, 60 kVp, 80 kVp, 100 kVp, 120 kVp and irradiation time was setting 180s, 360s, 540s into 180s intervals. As the result, We confirmed radiation damage in BJT by low energy X-ray under 120 keV energy, and Especially the biggest radiation damage was appeared at the 80 kVp. It is expected that ELDRS (enhanced low dose rate sensitivity) phenomenon occurs on the basis of 80 kVp. This studies expect to contribute effective dose administration of semiconductor inspection equipment using low energy X-ray, Also Research and Development of X-ray filter.