• 한국정밀공학회지
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• 제15권10호
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• pp.156-164
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• 1998

Electronic Speckle Pattern Interferometry(ESPI) has been used to measure surface deformations of engineering components and materials in industrial areas. ESPI, a non-contact and non-destructive technique, is capable of providing full-field results with high spatial resolution and high speed. One of the important application using electronic speckle pattern interferometry is electronic speckle contouring of a diffused object for 3-D shape analysis and topography measurement. Generally the electronic speckle contouring is suitable for providing measurement range from millimeters to several centimeters. In this study, we introduce the contouring method by modified dual-beam speckle pattern interferometer and the shift of the two illumination beams through optical fiber in order to obtain the contour fringe patterns. We also describe formation process of depth contour fringes and grid contour fringes by shifting direction of the two illumination beams. Before the experiments, we performed the geometric analysis for dual-beam-shifted ESPI contouring, and then, the electronic speckle contouring experiment with various specimens. For quantitative analysis of the contour fringes, we used 4-frame phase shifting method with PZT Finally, good agreement between the geometric analysis and experimetal results is obtained.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2002년도 추계학술대회 논문집
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• pp.400-403
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• 2002

This paper presents a shearographic technique for measuring in-plane strains. During the measurement, the test object is illuminated alternately with two laser beams, symmetrically with respect to the viewing direction. Employing a phase shift technique, the phase distributions due to object deformation for each beam are obtained separately. The difference of the two phase distributions depicts the derivative of in-plane surface displacements. The technique is equivalent to a system of many strain gages.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 1993년도 추계학술대회 논문집
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• pp.493-498
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• 1993

This paper proposes a high precision measurement technique to obtain the height of gage block. The proposed technique is consisted of two steps : In the first step, laser position transducer and electric micrometer are adopted to obtain a coarse value of the height of gage block, and then, second, heterodyne laser interferometry is adopted to acquire the precision value. The experiment results show that accuract in the order of a few nanometer is achieved for the gage blacks of as high as a few millimeter.

• 한국재료학회지
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• 제20권1호
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• pp.37-41
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• 2010

Creep tests were conducted under a condition of constant stress on two aluminum-based alloys containing particles: Al-5% Mg-0.25% Fe and Al-5% Zn-0.22% Fe. The role of grain boundary sliding was examined in the plane of the surface using a square grid printed on the surface by carbon deposition and perpendicular to the surface using two-beam interferometry. Estimates of the contribution of grain boundary sliding to the total strain, $\varepsilon_{gbs}/\varepsilon_t$ reveal two trends; (i) the sliding contribution is consistently higher in the Al-Mg-Fe alloy, and (ii) the sliding contribution is essentially independent of strain in the Al-Mg-Fe alloy, but it shows a significant decrease with increasing strain in the Al-Zn-Fe alloy. Sliding is inhibited by the presence of particles and its contributions to the total strain are low. This inhibition is attributed to the interaction between the grain boundary dislocations responsible for sliding and particles in the boundaries.

• 한국공작기계학회:학술대회논문집
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• 한국공작기계학회 1998년도 춘계학술대회 논문집
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• pp.239-244
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• 1998

ESP(Electronic Speckle Pattern Interferometry) is an optical technique to measure deforamtion of engineering components and materials in industrial areas. ESPI, a non-contact and non-destructive measuring method, is capable of providing full-field results with high spatial resolution and high speed. One of important application aspects using electronic speckle pattern interferometry is to generate contours of a diffuse object in order to provide data for 3-D shape analysis and topography measurement. The electronic speckle contouring is suitable for providing measurement range from millimeters to several centimeters. In this study, we introduce the contouring method by modified dual-beam speckle pattern interferometer and a shift of the two illumination beams through optical fiber in order to obtain the contour fringe patterns. Before the experiments, we performed the geometric analysis for dual-beam-shifted ESPI contouring. And by this geometric analysis, we performed the electronic speckle contouring experiment. We used 4-frame phase shifting method with PZT for quantitative analysis of contour fringes. Finally, we showed good agreements between the geometric analysis and experimental results.

• 한국광학회지
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• 제3권3호
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• pp.172-177
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• 1992

레이저 광선의 시준정도를 정확하게 측정하기 위하여 새로운 양방향 층밀리기 간섭계를 구성하였다. 한개의 쐐기판과 두개의 평면거울로 구성된 간섭계는 서로 반대방향으로 층밀리기된 두개의 간섭무늬 모양에 의햐여 시준정도를 나타낸다. 새로운 간섭계는 기존의 방법들에 비하여 분해능이 두 배로 향상되었으며 또한 간섭무늬 자체내에 시준된 경우를 나타내는 기준표시도 갖는다. 쐐기판의 $90^{\circ}$ 회전에 의한 간섭무늬 변화와 두 간섭무늬를 서로 중첩시켜 생긴 무아레 무늬 등에 의한 시준측정에 관하여 자세리 논하였으며 측정결과도 제시하였다.

• 한국광학회지
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• 제14권6호
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• pp.643-648
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• 2003

위상편이 회절격자 간섭계의 회절격자는 간섭을 일으키는 측정광과 기준광을 분할하고, 재결합하여 간섭무늬를 생성하고, 또한 위상을 편이시키는 다양한 용도로 사용되는 핵심부품이다. 위상편이 회절격자 간섭계는 회절격자에서 회절되는 다양한 회절차수의 광들을 측정광과 기준광으로 선정하고 서로 간섭시켜 간섭무의를 얻을 수 있는데, 그 회절차수와 사용하는 회절격자의 형상에 따라서 측정광과 기준광의 효율이 달라져서 간섭무늬의 가시도가 달라진다. 본 논문에서는 두 가지 위상편이 회절격자 간섭계에서 측정광과 기준광의 상대적인 효율을 격자에서 일어나는 회절현상의 전자기학적인 수치모사를 통해 산출해내어 각 간섭계에 최적인 회절격자의 형상을 선정한다.

• 한국광학회지
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• 제8권4호
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• pp.267-276
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• 1997

서로 대칭되는 이중 조명을 이용한 홀로그래피 네파간섭계를 구성하여 횡변위와 종변위를 동시에 측정하였다. 물체파와 재생파의 간섭을 일으킨 후 위상이동법으로 변위위상도를 작성하였으며 최소제곱법맞춤으로 위상도의 잡음을 제거하였다. 이러한 방법으로 네파간섭계의 두 광로에 존재하는 위성의 차와 합에 대한 정보를 구하였으며, 파장 632.8 nm인 헬륨-네온 레이저 광선에 대하여 종변위와 횡변위는 각각 정밀도 .lambda./40 및 .lambda./100 이내로 측정되었다.

• Journal of the Optical Society of Korea
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• 제16권3호
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• pp.263-269
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• 2012

In this paper, we propose a new dual optical encryption method for binary data and secret key based on 2-step phase-shifting digital holography for a cryptographic system. Schematically, the proposed optical setup contains two Mach-Zehnder type interferometers. The inner interferometer is used for encrypting the secret key with the common key, while the outer interferometer is used for encrypting the binary data with the same secret key. 2-step phase-shifting digital holograms, which result in the encrypted data, are acquired by moving the PZT mirror with phase step of 0 or ${\pi}/2$ in the reference beam path of the Mach-Zehnder type interferometer. The digital hologram with the encrypted information is a Fourier transform hologram and is recorded on CCD with 256 gray level quantized intensities. Computer experiments show the results to be encryption and decryption carried out with the proposed method. The decryption of binary secret key image and data image is performed successfully.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2016년도 제50회 동계 정기학술대회 초록집
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• pp.361.1-361.1
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• 2016

Due to their high sensitivity, fast response, small energy consumption and ease of integration, nanoelectromechanical systems (NEMS) have attracted much interest in various applications such as high speed memory devices, energy harvesting devices, frequency tunable RF receivers, and ultra sensitive mass sensors. Since the device performance of NEMS is closely related with the mechanical and flexural properties of the material in NEMS, analysis of the mechanical and flexural properties such as intrinsic tensile stress and Young's modulus is a crucial factor for designing the NEMS structures. In the present work, the intrinsic mechanical properties of highly stressed silicon nitride (SiN) beams are investigated as a function of the beam length using two different techniques: (i) dynamic flexural measurement using optical interferometry and (ii) quasi-static flexural measurement using atomic force microscopy. The reliability of the results is analysed by comparing the results from the two different measurement techniques. In addition, the mass density, Young's modulus and internal stress of the SiN beams are estimated by combining the techniques, and the prospect of SiN based NEMS for application in high sensitive mass sensors is discussed.