Proceedings of the Korean Society of Precision Engineering Conference (한국정밀공학회:학술대회논문집)
- 2002.10a
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- Pages.400-403
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- 2002
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- 2005-8446(pISSN)
Non-Contacted Strain Analysis by Dual-beam Shearography
변형 해석을 위한 Dual-beam Shearography
Abstract
This paper presents a shearographic technique for measuring in-plane strains. During the measurement, the test object is illuminated alternately with two laser beams, symmetrically with respect to the viewing direction. Employing a phase shift technique, the phase distributions due to object deformation for each beam are obtained separately. The difference of the two phase distributions depicts the derivative of in-plane surface displacements. The technique is equivalent to a system of many strain gages.
Keywords