• 한국표면공학회지
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• 제32권1호
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• pp.61-66
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• 1999

The Spin-dependent tunneling magnetoresistance (TMR) effect was observed in $NiFe/Al_2O_3$/Co thin films. The samples were prepared by magnetron sputtering in a system with a base pressure of $3\times10^{-6}$Torr. the insulating $Al_2O_3$layer was prepared by r.f. plasma oxydation method of a metallic Al layer. The ferromagnetic and insulating layers were deposited through metallic masks to produce the cross pattern form. The junction has an active area of $0.3\times0.3\textrm{mm}^2$ and the $Al_2O_3$layer is deposited through a circular mask with a diameter of 1mm. It is very important that insulating layer is formed very thinly and uniformly in tunneling junction. The ferromagnetic layer was fabricated in optimum conditions and the surface of that was very flat, which was observed by AFM. Tunneling junction was confirmed through nonlinear I-V curve. $NiFe/Al_2O_3$/Co junction was observed for magnetization behavior and magnetoresistance property and magnetoresistance property is dependent on magnetization behavior and magnetoresistance property and magnetoresistance property is dependent on magnetization behavior of t재 ferromagnetic layer. The maximum magnetoresistance ratio was about 6.5%.

• 한국전기전자재료학회논문지
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• 제14권11호
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• pp.934-940
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• 2001

Magnetic properties were investigated for Si/SiO$_2$/NiFe(300 )/A1$_2$O$_3$(t)/Co(200 ) junction related with the parameters of $Al_2$O$_3$. Insulating $Al_2$O$_3$ layer was formed by depositing a 5~40 thick Al layer, followed by a 90~120s RF plasma oxidation in an $O_2$ atmosphere. Magnetoresistance was not observed for tunnel junction with 5~10 thick Al layer, but magnetoresistance was observed large for tunnel junction with 15~40 thick Al layer. Oxidation time did not largely influence magnetoresistance. Tunnel magnetoresistance effect depended on magnetization behavior of two ferromagnetic layers. Tunneling junction was confirmed through nonlinear I-V curve. In this work, tunneling magnetoresistance(TMR) up to 30 % was observed. This apparent TMR is an artifact of the nonuniform current flow over the junction in the cross geometry of the electrodes.

• Journal of Magnetics
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• 제14권1호
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• pp.11-14
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• 2009

We investigated the I-V curves and differential tunneling conductance of two, CoFeB/MgO/CoFeB-based, magnetic tunnel junctions (MTJs): one with a low tunneling magnetoresistance (TMR; 22%) and the other with a high TMR (352%). This huge TMR difference was achieved by different MgO sputter conditions rather than by different annealing or deposition temperature. In addition to the TMR difference, the junction resistances were much higher in the low-TMR MTJ than in the high-TMR MTJ. The low-TMR MTJ showed a clear parabolic behavior in the dI/dV-V curve. This high resistance and parabolic behavior were well explained by the Simmons' simple barrier model. However, the tunneling properties of the high-TMR MTJ could not be explained by this model. The characteristic tunneling properties of the high-TMR MTJ were a relatively low junction resistance, a linear relation in the I-V curve, and conduction dips in the differential tunneling conductance. We explained these features by applying the coherent tunneling model.

• Journal of Magnetics
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• 제8권2호
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• pp.89-92
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• 2003

The tunneling magnetoresistance (TMR) of a ramp-edge type junction with SrTiO$_3$barrier layer has been stud-ied. The samples with a structure of glass/NiO(600${\AA}$)/Co(100${\AA}$)/SrTiO$_3$(400 ${\AA}$)/SrTiO$_3$(20-100${\AA}$)/NiFe(100${\AA}$) were prepared by the sputtering and etched by the electron cyclotron (ECR) argon ion milling. Nonlinear I-V characteristics were obtained from a ramp-type tunneling junctions, having the dominant difference between two different external magnetic fields (${\pm}$100 Oe) perpendicular to the junction edge line. In the SrTiO$_3$ barrier thickness of 40${\AA}$, the TMR was 52.7% at a bias voltage of -50 mV The bias voltage dependence of resistance and TMR in a ramp-type tunneling junction was similar with those of the layered TMR junction.

• 한국자기학회:학술대회 개요집
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• 한국자기학회 2015년도 임시총회 및 하계학술연구발표회
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• pp.156-157
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• 2015

we have presented the enhanced interlayer tunneling magnetoresistance in doped $La_{1+2x}Sr_{2-2x}Mn_2O_7$ single crystal below $T_C$. The drastically out-of-plane magnetoresistance observed in magnetic fields perpendicular to the bilayers indicates that spin-polarized magnetic layers in single crystal show as a stack of ordered spin valve.

• 한국자기학회지
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• 제12권6호
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• pp.201-205
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• 2002

경사형 모서리접합을 이용한 터널링 자기저항(tunneling magnetoresistance; TMR) 특성을 연구하였다. 박막 증착과 식각은 스퍼터링과 사이크로트론 전자공명 (electron cyclotron resonance; ECR) 장치를 각각 사용하였다. Si$_3$N$_4$ 장벽층을 이용한 접합의 다층구조는 NiO(60)/Co(10)/NiO(60)/Si$_3$N$_4$(2-6)/NiFe(10) (nm)이었다. 상하부 반강자성체 NiO에 삽입된 wedged 형태의 고정층 Co와 장벽층 Si$_3$N$_4$위에 경사진 비대칭 구조에서 자유층 NiFe간의 접합에서 일어나는 특이한 스핀의존 터널링 현상이 관찰되었다. 외부자장이 0Oe일 때와 접합경계선에 수직방향으로 90Oe일 때 측정한 접합소자의 전류전압특성 곡선이 현저하게 구별되어 나타났다. TMR의 인가 전압의존성은 $\pm$10 V일 때도 약 -10%을 유지하는 매우 안정된 자기저항 특성을 보여주었다.

• Journal of Magnetics
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• 제7권2호
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• pp.59-62
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• 2002

Magnetic tunnel junctions (MTJs) were fabricated with high bias for plasma oxidation and the effects of annealing on the temperature dependence of tunneling magnetoresistance (TMR) were investigated experimentally. As-grown, TMR increases, peaks around 160 K, and decreases with increasing temperature from 80 K to 300 K. When MTJs are annealed, $T_{max}$, the temperature at which maximum TMR is obtained, decreases as annealing temperature increases to the optimal point. In order to explain this abnormal temperature dependence of TMR, the difference of conductance between parallel and antiparallel alignments of magnetizations as a function of temperature is also analyzed. The shifts of $T_{max}$ due to annealing process are described phenomenologically with spin-dependent transfer rates of electrons tunnel through the barrier.

• 한국자기학회지
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• 제15권6호
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• pp.311-314
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• 2005

본 연구에서는 Al-Oxide(AIOx) 에 Ti를 첨가하여. Ti 함량에 따라 자기터널접합의 자기터널링 현상 변화 및 TiA l합금박막의 미세구조, 표면거칠기 변화를 관찰하였다. Ti를 첨가한 TiAlOx 절연층을 사용하여 기존 AlOx를 사용한 경우 보다 높은 터널링 자기저항(Tunneling Magnetoresistance, TMR) 비를 가지는 자기터널접합을 제작하였다. TMR 비의 증가 요인은 Ti를 첨가함에 따라, TiAl 합금박막의 입계가 작아지고, 치밀한 구조를 가져, 우수한 계면평활도를 가지는 균일한 TiAlOx 절연층이 형성되어, 소자의 구조적 안정성이 향상되었기 때문으로 분석하였다. 또한 향상된 구조적 안정성으로 인해 소자의 열적, 전기적 안정성도 크게 증가하였다.

• 한국자기학회지
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• 제3권1호
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• pp.29-33
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• 1993

$1{\times}10^{-6}$Torr의 진공에서 열저항 가열식 진공증착 방법으로 제작한 $Permalloy/Al_{2}O_{3}/Co$ 강자성 터널집합의 자기저항 효과를 조사하였다. 이 논문에서는 제작한 강자성 터널접합 시료의 전류-전압 특성과 자기 valve 효과를 측정하고, 시료진동형자기계로 측 정한 자기이력곡선을 통하여 터널저항의 히스테리시스성 자장 의존성을 조사하였다. 터널링은 전류-전압 특성을 측정함으로써 확인 되어진다. 자기저항의 히스테리시스 곡선은 자화의 히스테 리시스 곡선과 잘 대응한다. 측정한 자기저항비 ${\Delta}R/R$은 실온에서 약 0.6% 였다.

• 대한전자공학회:학술대회논문집
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• 대한전자공학회 1999년도 하계종합학술대회 논문집
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• pp.950-953
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• 1999

Spin tunneling giant magnetoresistance effect was studied to utilize in the application of random access memory. Ferromagnetic/Insulator/Ferromagnetic films were sputtered on glass substrates and perpendicular current was applied. Measurements of magneto- resistance of the junction showed 8.6% of MR ratio. Voltage output depends on the magnetization directions of the write line and read line, thus enabling the system to be used as a random access memory