• Proceedings of the Korean Magnestics Society Conference
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• 2002.12a
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• pp.68-69
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• 2002

Magnetic tunnel junctions은 최근 자기저항용 재료나 MRAM용 소자로 사용하기 위한 연구가 활발하게 진행되고 있다. Magnetic tunnel junction을 저자계, 저전력용 소자로 사용되기 위해서는, 작은 switching field 값과 uniform한 switching field 분포를 가져야 한다. Micromagnetic simulation을 통하여 free layer의 두께와 포화 자화 값이 감소함에 따라서 switching field가 감소함을 알 수 있었다. 본 연구에서는 얇은 free layer를 사용하여 magnetic tunnel junction을 제조하고, 얇은 free layer가 자기저항에 미치는 영향에 대하여 알아보았다. (중략)

• Journal of Magnetics
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• v.6 no.4
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• pp.132-141
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• 2001

The switching characteristics and the magnetization-flop behavior in magnetic tunnel junctions exchange biased by synthetic antiferromagnets (SyAFs) are investigated by using a computer simulations based on a single-domain multilayer model. The bias field acting on the free layer is found to be sensitive to the thickness of neighboring layers, and the thickness dependence of the bias field is greater at smaller cell dimensions due to larger magnetostatic interactions. The resistance to magnetization flop increases with decreasing cell size due to increased shape anisotropy. When the cell dimensions are small and the synthetic antiferromagnet is weakly, or not pinned, the magnetization directions of the two layers sandwiching the insulating layer are aligned antiparallel due to a strong magnetostatic interaction, resulting in an abnormal magneto resistance (MR) change from the high-MR state to zero, irrespective of the direction of the free-layer switching. The threshold field for magnetization-flop is found to increase linearly with increasing antiferromagnetic exchange coupling in the synthetic antiferromagnet. Irrespective of the magnetic parameters and cell sizes, magnetization flop does not exist near zero applied field, indicating that magnetization flop is driven by the Zeeman energy.

• Wind and Structures
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• v.5 no.2_3_4
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• pp.337-346
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• 2002

Wind tunnel pressure measurements and numerical simulations based on the Reynolds Stress Model (RSM) are compared with full and model scale data in the flow area of impingement, separation and wake for $60^{\circ}$ and $90^{\circ}$ wind azimuth angles. The phase averaged fluctuating pressures simulated by the RSM model are combined with modelling of the small scale, random pressure field to produce the total, instantaneous pressures. Time averaged, rsm and peak pressure coefficients are consequently calculated. This numerical approach predicts slightly better the pressure field on the roof of the TTU (Texas Tech University) building when compared to the wind tunnel experimental results. However, it shows a deviation from both experimental data sets in the impingement and wake regions. The limitations of the RSM model in resolving the intermittent flow field associated with the corner vortex formation are discussed. Also, correlations between the largest roof suctions and the corner vortex "switching phenomena" are observed. It is inferred that the intermittency and short duration of this vortex switching might be related to both the wind tunnel and numerical simulation under-prediction of the peak roof suctions for oblique wind directions.

• Journal of the Korean Magnetics Society
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• v.16 no.6
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• pp.276-278
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• 2006

The switching characteristics of magnetic tunnel junctions (MTJs) comprising amorphous ferromagnetic CoFeSiB free layer have been investigated. CoFeSiB was used for the free layer to enhance the switching characteristics. The typical junction structure was $Si/SiO_{2}/Ta$ 45/Ru 9.5/IrMn 10/CoFe $7/AlO_{x}/CoFeSiB\;(t)/Ru\;60\;(in\;nm)$. CoFeSiB has low saturation magnetization ($M_{s}$) of $560\;emu/cm^{3}$ and high anisotropy constant ($K_{u}$) of $2800\;erg/cm^{3}$. These properties caused low coercivity ($H_{c}$) and high sensitivity in MTJs, and it also confirmed in submicrometer-sized elements by micromagnetic simulation based on the Landau-Lisfschitz-Gilbert equation. By increasing CoFeSiB free layer thickness, the switching characteristics became worse due to increase of the demagnetization field.

• Journal of Magnetics
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• v.14 no.3
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• pp.104-107
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• 2009

The effects of the magnetic property variation on current-induced magnetization switching in magnetic tunnel junction with perpendicular magnetic anistoropy (PMA) and the soft magnetic polarization-enhancement layers (PELs) inserted between the layers with PMA and the MgO layer was studied. A micromatnetic model was used to estimate the switching time of the free layer by different applied current densities, with changing saturation magnetization ($M_s$) of the PELs, interlayer exchange coupling between PMA layers and PELs. The switching time could be significantly reduced at low current densities, by increasing $M_s$ of PELs and decreasing interlayer exchange coupling.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.8 no.1
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• pp.38-42
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• 1983

The characteristic of a Tunnel Diode(TD) is approximated by the summation of two exponential terms, obtained from the haracteristic curves displayed on the curve tracer. Using this result, static characteristic of a TD pair was plotted by a computer programming. From these static characteristic curves, the triggering behavior of TC pair multi-vibrators was described graphically. Two stable characteristics were analyzed by piecewise linear Method. Theoritical switching Theoritical switching times of a TD pair flip-flop(F-F) circuits were compared with experimental results.

• Proceedings of the Korean Magnestics Society Conference
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• 2005.12a
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• pp.158-159
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• 2005

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.8
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• pp.1-10
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• 2008

In this paper, we describe a design of a 128bit MRAM based on a new switching architecture which is Local Field Switching(LFS). LFS uses a local magnetic field generated by the current flowing through an MTJ. This mode reduces the writing current since small current can induce large magnetic field because of close distance between MTJ and the current. It also improves the cell selectivity over using conventional MTJ architecture because it doesn't need a digit line for writing. The MRAM has 1-Transistor 1-Magnetic Tunnel Junction (IT-1MTJ) memory cell structure and uses a bidirectional write driver, a mid-point reference cell block and a current mode sense amplifier. CMOS emulation cell is adopted as an LFS-MTJ cell to verify the operation of the circuit without the MTJ process. The memory circuit is fabricated using a $0.18{\mu}m$ CMOS technology with six layers o) metal and tested on custom board.

• Journal of the Korean Magnetics Society
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• v.16 no.6
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• pp.279-282
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• 2006

Magnetic tunnel junctions (MTJs), which consisted of amorphous ferromagnetic NiFeSiB free layers, were investigated. The NiFeSiB layers were used to substitute for the traditionally used CoFe and/or NiFe layers with the emphasis being given to obtaining an understanding of the effect of the amorphous free layer on the switching characteristics of the MTJs. $Ni_{16}Fe_{62}Si_{8}B_{14}$ has a lower saturation magnetization ($M_{s}:\;800\;emu/cm^{3}$) than $Co_{90}Fe_{10}$ and a higher anisotropy constant ($K_{u}:\;2700\;erg/cm^{3}$) than $Ni_{80}Fe_{20}$. The $Si/SiO_{2}/Ta$ 45/Ru 9.5/IrMn 10/CoFe $7/AlO_{x}/CoFeSiB\;(t)/Ru\;60\;(in\;nanometers)$structure was found to be beneficial for the switching characteristics of the MTJ, leading to a reduction in the coercivity ($H_{c}$) and an increase in the sensitivity resulted from its lower saturation magnetization and higher uniaxial anisotropy. Furthermore, by inserting a very thin CoFe layer at the tunnel barrier/NiFeSiB interface, the TMR ratio and switching squareness were improved more with the increase of NiFeSiB layer thickness up to 11 nm.

• Electrical & Electronic Materials
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• v.8 no.2
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• pp.176-183
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• 1995

The present work is concerned with the switching conduction characteristics of PI LB films in metal insulator metal sandwiches. By applying various DC voltage bias to MIM junctions, conduction characteristics of junctions can be changed between the high-voltage low-current(off) condition, the low-voltage high-current (on) condition and the medium(mid) condition. Switching conduction characteristics can be also observed in MIM junctions employing some aromatic compounds as insulators. Switching conduction characteristics is assumed to be owing to the existence of aromatic rings, space charge in films, impurities on metal-insulator interface, and difference in work functions of base and top electrodes metal. To study the conduction process of on, off, and mid conductions, we measured I-V, d$^{2}$V/d I$^{2}$-V characteristics of junctions with several different top electrodes under various temperatures. Small conductance changes of junctions can be measured by observing the second derivative, d$^{2}$V/dI$^{2}$, of I-V curve. A dynamical technique is used to get the second derivatives. That is, a finite modulation of the current is applied to the junctions and the second harmonic of the voltage is detected.