• Title/Summary/Keyword: thin beam

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Dynamic analysis of thin-walled open section beam under moving vehicle by transfer matrix method

  • Xiang, Tianyu;Xu, Tengfei;Yuan, Xinpeng;Zhao, Renda;Tong, Yuqiang
    • Structural Engineering and Mechanics
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    • v.30 no.5
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    • pp.603-617
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    • 2008
  • Three dimensional coupled bending-torsion dynamic vibrations of thin-walled open section beam subjected to moving vehicle are investigated by transfer matrix method. Through adopting the idea of Newmark-${\beta}$ method, the partial differential equations of structural vibration can be transformed to the differential equations. Then, those differential equations are solved by transfer matrix method. An iterative scheme is proposed to deal with the coupled bending-torsion terms in the governing vibration equations. The accuracy of the presented method is verified through two numerical examples. Finally, with different eccentricities of vehicle, the torsional vibration of thin-walled open section beam and vertical and rolling vibration of truck body are investigated. It can be concluded from the numerical results that the torsional vibration of beam and rolling vibration of vehicle increase with the eccentricity of vehicle. Moreover, it can be observed that the torsional vibration of thin-walled open section beam may have a significant nonlinear influence on vertical vibration of truck body.

Dynamic Mode Analysis of Thin Walled Closed Section Beams under Warping Conditions (Warping 조건하에서 박판 폐단면 보의 동적 모드 해석)

  • Yu, Hwan-Shin;Chun, Dong-Joon
    • Journal of Advanced Navigation Technology
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    • v.16 no.2
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    • pp.367-374
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    • 2012
  • A dynamic simulation and test of frame with thin walled closed section beams considering warping conditions have been performed. When a beam is subjected under torsional moment, the cross section will deform an warping as well as twist. For some thin-walled sections warping will be large, and accompanying warping restraint will induce axial and shear stresses and reduce the twist of beam which stiffens the beam in torsion. This paper presents that an warping restraint factor in finite element model effects the behavior of beam deformation and dynamic mode shape. The computer modelling of frame is discussed in linear beam element model and linear thin shell element model, also presents a correlation between computer predicted and actual experimental results for static deflection, natural frequencies and mode shapes of frame.

Free vibration and elastic analysis of shear-deformable non-symmetric thin-walled curved beams: A centroid-shear center formulation

  • Kim, Nam-Il;Kim, Moon-Young
    • Structural Engineering and Mechanics
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    • v.21 no.1
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    • pp.19-33
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    • 2005
  • An improved shear deformable thin-walled curved beam theory to overcome the drawback of currently available beam theories is newly proposed for the spatially coupled free vibration and elastic analysis. For this, the displacement field considering the shear deformation effects is presented by introducing displacement parameters defined at the centroid and shear center axes. Next the elastic strain and kinetic energies considering the shear effects due to the shear forces and the restrained warping torsion are rigorously derived. Then the equilibrium equations are consistently derived for curved beams with non-symmetric thin-walled sections. It should be noticed that this formulation can be easily reduced to the warping-free beam theory by simply putting the sectional properties associated with warping to zero for curved beams with L- or T-shaped sections. Finally in order to illustrate the validity and the accuracy of this study, finite element solutions using the isoparametric curved beam elements are presented and compared with those in available references and ABAQUS's shell elements.

Homeotropic Alignment Effect for Nematic Liquid Crystal on the $SiO_x$ Thin Film Layer by New Ion beam Exposure (새로운 이온빔을 이용한 $SiO_x$ 박막 표면의 액정 배향 효과)

  • Choi, Sung-Ho;Kim, Byoung-Yong;Han, Jin-Woo;Oh, Yong-Cheul;Seo, Dae-Shik
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2006.11a
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    • pp.311-312
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    • 2006
  • We studied homeotropic alignment effect for a nematic liquid crystal (NLC) on the $SiO_x$, thin film irradiated by the new ion beam method $SiO_x$ thin films were deposited by plasma enhanced chemical vapor deposition (PECVD) and were treated by the DuoPIGatron ion source. A uniform liquid crystal alignment effect was achieved over 2100 eV ion beam energy. Tilt angle were about $90^{\circ}$ and were not affected by various ion beam energy.

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Electro-Optical Characteristics of the Ion-Beam-Aligned FFS-LCD on a Diamond-like-Carbon Thin Film

  • Hwang, J.Y.;Park, C.J.;Seo, D.S.;Jeong, Y.H.;Kim, K.C.;Ahn, H.J.;Baik, H.K.
    • 한국정보디스플레이학회:학술대회논문집
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    • 2004.08a
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    • pp.1132-1136
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    • 2004
  • In this paper, we intend to make FFS mode cell with LC alignment used non-rubbing method, ion beam alignment method on the a-C:H thin film, to analyze electro-optical characteristics in this cell. We studied on the suitable inorganic thin film for FFS-LCD and the aligning capabilities of nematic liquid crystal (NLC) using the new alignment material of a-C:H thin film as working gas at rf bias condition. A high pretilt angle of about 5$^{\circ}$ by ion beam(IB) exposure on the a-C:H thin film surface was measured. An excellent voltage-transmittance (V-T) and response time curve of the ion-beam-aligned FFS-LCD was observed with oblique ion beam exposure on the DLC thin films.

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Investigation of the Alignment Phenomena on the a-C:H Thin Films by PECVD System using Ion-beam Alignment Method

  • Park, Chang-Joon;Hwang, Jeoung-Yeon;Seo, Dae-Shik;Ahn, Han-Jin;Kim, Kyung-Chan;Baik, Hong-Koo
    • Transactions on Electrical and Electronic Materials
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    • v.5 no.1
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    • pp.15-18
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    • 2004
  • We studied the nematic liquid crystal (NLC) aligning capabilities using the new alignment material of a-C:H thin film by plasma enhanced chemical vapor deposition (PECVD) system for 30 sec under 30W rf power at a gas pressure of 1.4*10$\^$-1/ torr. A high pretilt angle of about 5 by ion beam exposure on the a-C:H thin film surface was measured. A good LC alignment by the ion beam alignment method on the a-C:H thin film surface was observed at annealing temperature of 250$^{\circ}C$, and the alignment defect of NLC was observed above annealing temperature of 300$^{\circ}C$. Consequently, the high LC pretilt angle and the good thermal stability of LC alignment by the ion beam alignment method on the a-C:H thin film by PECVD method as working gas at 30W rf bias condition can be achieved.

Shape Optimization Technique for Thin Walled Beam of Automotive Structures Considering Vibration

  • Lee, Sang-Beom;Yim, Hong-Jae;Pyun, Sung-Don
    • The Journal of the Acoustical Society of Korea
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    • v.21 no.2E
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    • pp.63-70
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    • 2002
  • In this paper, an optimization technique for thin walled beams of vehicle body structure is proposed. Stiffness of thin walled beam structure is characterized by the thickness and typical section shape of the beam structure. Approximate functions for the section properties such as area, area moment of inertia, and torsional constant are derived by using the response surface method. The approximate functions can be used for the optimal design of the vehicle body that consists of complicated thin walled beams. A passenger car body structure is optimized to demonstrate the proposed technique.

Vertical Alignment of Nematic Liquid Crystal on the SiC Thin Film Layer with Ion-beam Irradiation

  • Oh, Yong-Cheul;Lee, Dong-Gyu
    • Transactions on Electrical and Electronic Materials
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    • v.7 no.6
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    • pp.301-304
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    • 2006
  • We studied the nematic liquid crystal (NLC) aligning capabilities using the new alignment material of the SiC (Silicon Carbide) thin film. The SiC thin film exhibits good chemical and thermal stability. The good thermal and chemical stability make SiC an attractive candidate for electronic applications. A vertical alignment of nematic liquid crystal by atomic beam exposure on the SiC thin film surface was achieved. The about $87^{\circ}$ of stable pretilt angle was achieved at the range from $30^{\circ}\;to\;45^{\circ}$ of incident angle. Consequently, the vertical alignment effect of liquid crystal electro-optical characteristic by the atomic beam alignment method on the SiC thin film layer can be achieved.

Exact Elastic Element Stiffness Matrix of Thin-Walled Curved Beam (박벽 곡선보의 엄밀한 탄성요소강도행렬)

  • 김남일;윤희택;이병주;김문영
    • Proceedings of the Computational Structural Engineering Institute Conference
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    • 2002.04a
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    • pp.385-392
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    • 2002
  • Derivation procedures of exact elastic element stiffness matrix of thin-walled curved beams are rigorously presented for the static analysis. An exact elastic element stiffness matrix is established from governing equations for a uniform curved beam element with nonsymmetric thin-walled cross section. First this numerical technique is accomplished via a generalized linear eigenvalue problem by introducing 14 displacement parameters and a system of linear algebraic equations with complex matrices. Thus, the displacement functions of displacement parameters are exactly derived and finally exact stiffness matrices are determined using member force-displacement relationships. The displacement and normal stress of the section are evaluated and compared with thin-walled straight and curved beam element or results of the analysis using shell elements for the thin-walled curved beam structure in order to demonstrate the validity of this study.

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Applications of Ar Gas Cluster Ion Beam Sputtering to Ta2O5 thin films on SiO2/Si (100)

  • Park, Chanae;Chae, HongChol;Kang, Hee Jae
    • Proceedings of the Korean Vacuum Society Conference
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    • 2015.08a
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    • pp.119-119
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    • 2015
  • Ion beam sputtering has been widely used in Secondary Ion Mass Spectrometry (SIMS), X-ray Photoelectron Spectroscopy (XPS), and Auger Electron Spectroscopy (AES) for depth profile or surface cleaning. However, mainly due to severe matrix effects such as surface composition change from its original composition and damage of the surface generated by ion beam bombardment, conventional sputtering skills using mono-atomic primary ions with energy ranging from a few hundred to a thousand volts are not sufficient for the practical surface analysis of next-generation organic/inorganic device materials characterization. Therefore, minimization of the surface matrix effects caused by the ion beam sputtering is one of the key factors in surface analysis. In this work, the electronic structure of a $Ta_2O_5$ thin film on $SiO_2/Si$ (100) after Ar Gas Cluster Ion Beam (GCIB) sputtering was investigated using X-ray photoemission spectroscopy and compared with those obtained via mono-atomic Ar ion beam sputtering. The Ar ion sputtering had a great deal of influence on the electronic structure of the oxide thin film. Ar GCIB sputtering without sample rotation also affected the electronic structure of the oxide thin film. However, Ar GCIB sputtering during sample rotation did not exhibit any significant transition of the electronic structure of the $Ta_2O_5$ thin films. Our results showed that Ar GCIB can be useful for potential applications of oxide materials with sample rotation.

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