• Title/Summary/Keyword: test pattern generator

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Analysis of Dynamic Response of 1.5MW DFIG Wind Power Simulator with Real-grid Connection (실 계통 연계 1.5MW급 DFIG 풍력발전 시뮬레이터의 응동특성 분석)

  • Choy, Young-Do;Jeon, Young-Soo;Jeon, Dong-Hoon;Shin, Jeong-Hoon;Kim, Tae-Kyun;Jeong, Byung-Chang
    • New & Renewable Energy
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    • v.5 no.3
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    • pp.4-12
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    • 2009
  • The effect of change in DFIG (doubly-fed wind power generator) rotating speed and active power on the grid was analyzed to understand the characteristics of wind power using the wind power simulator connected to the grid at Gochang Power Quality Test Center. Electric power quality improvement devices (DVR, STATCOM, SSTS) and electric power quality disturbance application devices for 22.9 kV grid are equipped at Gochang Power Quality Test Center. Induction motor and VVVF inverter were used to emulate the blade of a wind power generator, and a simulator for Cage wound induction generator and DFIG was developed. The trial line were assumed to be 20 km and 40 km in length, and variable wind speed pattern was set using wind speed data from Ducjeokdo to verify the power characteristics of the wind power generator according to rotating speed.

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A Study on Design of BIST for Circuits with Pipeline Architecture (파이프라인 구조를 갖는 회로를 위한 내장된 자체 검사 설계에 관한 연구)

  • Yang, Sun-Woong;Han, Jae-Cheon;Jin, Myung-Koo;Chang, Hoon
    • Proceedings of the KIEE Conference
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    • 1998.11b
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    • pp.600-602
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    • 1998
  • In this paper, we implement BIST to efficiently test circuits with pipeline architecture and JTAG to control implemented BIST and support board level test. Since implemented BIST is designed to be initialized using new seed, hard-to-detect faults are easily detected. Besides, to optimize area overhead, it uses JTAG instead of BIST controller and modified pipeline register instead of added test pattern generator and signature generator. And, to optimize pin overhead, it uses pins of JTAG. Function and efficiency of implemented BIST is verified by simulation.

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A Study on the Extraction of Feature Variables for the Pattern Recognition of Welding Flaws (용접결함의 형상인식을 위한 특징변수 추출에 관한 연구)

  • Kim, Jae-Yeol;Roh, Byung-Ok;You, Sin;Kim, Chang-Hyun;Ko, Myung-Soo
    • Journal of the Korean Society for Precision Engineering
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    • v.19 no.11
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    • pp.103-111
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    • 2002
  • In this study, the natural flaws in welding parts are classified using the signal pattern classification method. The storage digital oscilloscope including FFT function and enveloped waveform generator is used and the signal pattern recognition procedure is made up the digital signal processing, feature extraction, feature selection and classifier design. It is composed with and discussed using the distance classifier that is based on euclidean distance the empirical Bayesian classifier. feature extraction is performed using the class-mean scatter criteria. The signal pattern classification method is applied to the signal pattern recognition of natural flaws.

Voltage Disturbance Generator for the Test of Custom Power Devices with Nonlinear Load Characteristics (비선형 부하특성을 갖는 전력품질 개선장치의 성능시험을 위한 전압변동발생기)

  • Park, S.D.;Lee, B.C.;Nho, E.C.;Kim, I.D.;Chun, T.W.;Kim, H.G.
    • Proceedings of the KIEE Conference
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    • 2006.07b
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    • pp.935-936
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    • 2006
  • This paper deals with a 3-phase voltage disturbance generator. The proposed generator can be used for the performance teat of custom power devices with nonlinear load characteristics as well as linear load. The principle of the voltage sag, swell, outage, and unbalance generation is described. The switching pattern for the SCR thyristors in each mode is analysed to guarantee the system reliability. The validity of the proposed scheme is verified through simulation result.

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An Efficient Test Pattern Generator for Low Power BIST (내장된 자체 테스트를 위한 저전력 테스트 패턴 생성기 구조)

  • Kim, Ki-Cheol;Kang, Sung-Ho
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.47 no.8
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    • pp.29-35
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    • 2010
  • In this paper we propose a new pattern generator for a BIST architecture that can reduce the power consumption during test application. The principle of the proposed method is to reconstruct an LFSR circuit to reduce WSAs of the heavy nodes by suppressing the heavy inputs. We propose algorithms for finding heavy nodes and heavy inputs. Using the Modified LFSR which consists of some AND/OR gates trees and an original LFSR, BIST applies modified test patterns to the circuit under test. The proposed BIST architecture with small hardware overhead effectively reduces the average power consumption during test application while achieving high fault coverage. Experimental results on the ISCAS benchmark circuits show that average power reduction can be achieved up to 30.5%.

Partial Enhanced Scan Method for Path Delay Fault Testing (경로 지연 고장 테스팅을 위한 부분 확장 주사방법)

  • Kim, Won-Gi;Kim, Myung-Gyun;Kang, Sung-Ho;Han, Gun-Hee
    • The Transactions of the Korea Information Processing Society
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    • v.7 no.10
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    • pp.3226-3235
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    • 2000
  • The more complex and larger semiconductor integraed circuits become, the core important delay test becomes which guarantees that semiconductor integrated circuits operate in time. In this paper, we propose a new partial enhanced scan method that can generate test patterns for path delay faults offectively. We implemented a new partial enhanced scan method based on an automatic test pattern generator(ATPG) which uses implication and justification . First. we generate test patterns in the standard scan environment. And if test patterns are not generated regularly in the scan chain, we determine flip-flops which applied enhanced scan flip-flops using the information derived for running an automatic test pattern generator inthe circuti. Determming enhanced scan flip-flops are based on a fault coverage or a hardware overhead. through the expenment for JSCAS 89 benchmark sequential circuits, we compared the fault coverage in the standard scan enviroment and enhance scan environment, partial enhanced scan environment. And we proved the effectiveness of the new partial enhanced scan method by identifying a high fault coverage.

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Static Wind Tunnel Test of Smart Un-manned Aerial Vehicle(SUAV) for TR-S2 Configuration (스마트 무인기 TR-S2 형상의 정적 풍동시험)

  • Choi Sungwook;Cho Taehwan;Chung Jindeog
    • Transactions of the Korean Society of Mechanical Engineers B
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    • v.29 no.6 s.237
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    • pp.755-762
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    • 2005
  • To evaluate the aerodynamic efficiency of TR-S2 configuration designed by SUDC, wind tunnel tests of $40\%$ scaled model were done in KARI LSWT. The aerodynamic characteristics of plain and Semi-Slotted Flaperon were compared, and vortex generators were installed to improve flow pattern along the wing surface. Effects of the control surface such as elevator, rudder, aileron, and incidence angle of horizontal tail are measured for various testing conditions. Test results showed that Semi-Slotted Flaperon produced more favorable lift, lift/drag, and stall margins and application of vortex generator would be best choice to enhance wing performance. Longitudinal, lateral and directional characteristics of TR-S2 were found to be stable for the pitch and yaw motions.

On-Line Diagnosis Method for Generator Rotor Windings (발전기 운전중 회전자 진단에 관한 연구)

  • Lee, Young-Jun;Kong, Tae-Sik;Kim, Hee-Dong;Ju, Young-Ho
    • Proceedings of the KIEE Conference
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    • 2002.07c
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    • pp.1846-1849
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    • 2002
  • A shorted-turn test was performed at the Sininchon combined cycle power plant on gas turbine generators. The test was conducted using a permanent flux probe and on-line diagnosis system. The flux probe installed in the generator air gap senses the field winding slot leakage flux and produces a voltage proportional to the rate of change of the flux. This pattern of flux variation is a signature unique to each field winding. We have also applied a voltage waveform analysis technique that can identify the pole location, slot number and number of shorted-turn with each slot.

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Wind Turbine Simulators for Control Performance Test of DFIG

  • Abo-Khalil, Ahmed;Lee, Dong-Choon
    • Proceedings of the KIEE Conference
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    • 2007.07a
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    • pp.192-194
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    • 2007
  • This paper proposes a new wind turbine simulator using a squirrel cage induction for control performance test of DFIG (doubly-fed induction generator). The turbine static characteristics are modeled using the relation between the turbine torque versus the wind speed and the blade pitch angle. The turbine performance is subjected to a real wind speed pattern by modeling the wind speed as a sum of harmonics with a wide range of frequency. The turbine model includes the effect of the tower shadow and wind shear. A pitch angle controller is designed and used to protect the coupled generator by limiting the turbine speed to the maximum value. Experimental results are provided for a 3[kW] wind turbine simulator at laboratory.

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Delay Fault Test Pattern Generator Using Indirect Implication Algorithms in Scan Environment (스캔 환경에서 간접 유추 알고리즘을 이용한 경로 지연 고장 검사 입력 생성기)

  • Kim, Won-Gi;Kim, Myeong-Gyun;Gang, Seong-Ho
    • The Transactions of the Korea Information Processing Society
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    • v.6 no.6
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    • pp.1656-1666
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    • 1999
  • The more complex and large digital circuits become, the more important delay test becomes which guarantees that circuits operate in time. In this paper, the proposed algorithm is developed, which enable the fast indirect implication for efficient test pattern generation in sequential circuits of standard scan environment. Static learning algorithm enables application of a new implication value using contrapositive proposition. The static learning procedure found structurally, analyzes the gate structure in the preprocessing phase and store the information of learning occurrence so that it can be used in the test pattern generation procedure if it satisfies the implication condition. If there exists a signal line which include all paths from some particular primary inputs, it is a partitioning point. If paths passing that point have the same partial path from primary input to the signal or from the signal to primary output, they will need the same primary input values which separated by the partitioning point. In this paper test pattern generation can be more effective by using this partitioning technique. Finally, an efficient delay fault test pattern generator using indirect implication is developed and the effectiveness of these algorithms is demonstrated by experiments.

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