1 |
K. Kim, D. Song, I. Kim and S. Kang, "A New Low Power Test Pattern Generator for BIST Architecture," IEICE Trans. on Electronics, vol. E88-C, No.10 pp. 2037-2038, Oct. 2005.
DOI
ScienceOn
|
2 |
A. Abu-Issa and S. Quigley, "LT-PRPG: Power Minimization Technique for Test-per-Scan BIST," in Proc. of IEEE International Conf. DTIS, pp. 1-5, Mar. 2008.
|
3 |
L. Jie, Y. Jun, L. Rui and W. Chao, "A New BIST Structure for Low Power Testing," in Proc. of ASIC International Conf., pp. 1183- 1185, 2003.
|
4 |
M. Nourani, M. Tehranipoor and N. Ahmed, "Low-Transition Test Pattern Generation for BIST-Based Applications," IEEE Trans. on Computers, vol. 57, no. 3, pp. 303-315, Mar. 2008.
DOI
|