• Proceedings of the Materials Research Society of Korea Conference
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• 1998.08a
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• pp.137.3-137
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• 1998

• Journal of The Korean Astronomical Society
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• v.44 no.2
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• pp.49-58
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• 2011

We calculate the energy spectra of cosmic ray (CR) protons and electrons at a plane shock with quasi-parallel magnetic fields, using time-dependent, diffusive shock acceleration (DSA) simulations, including energy losses via synchrotron emission and Inverse Compton (IC) scattering. A thermal leakage injection model and a Bohm type diffusion coefficient are adopted. The electron spectrum at the shock becomes steady after the DSA energy gains balance the synchrotron/IC losses, and it cuts off at the equilibrium momentum $p_{eq}$. In the postshock region the cutoff momentum of the electron spectrum decreases with the distance from the shock due to the energy losses and the thickness of the spatial distribution of electrons scales as $p^{-1}$. Thus the slope of the downstream integrated spectrum steepens by one power of p for $p_{br}$ < p < $p_{eq}$, where the break momentum decreases with the shock age as $p_{br}\;{\infty}\;t^{-1}$. In a CR modified shock, both the proton and electron spectrum exhibit a concave curvature and deviate from the canonical test-particle power-law, and the upstream integrated electron spectrum could dominate over the downstream integrated spectrum near the cutoff momentum. Thus the spectral shape near the cutoff of X-ray synchrotron emission could reveal a signature of nonlinear DSA.

• Bulletin of the Korean Chemical Society
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• v.23 no.4
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• pp.580-586
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• 2002

We investigated the effect of ionic component on crystalline morphology development during isothermal annealing in a sodium neutralized sulfonated poly(ethylene terephthalate) ionomer (Ion-PET) by time-resolved small-angle x-ray scattering (TR-SAX S) using synchrotron radiation. At early stage in Ion-PET, SAXS intensity at a low annealing temperature (Ta = 120 $^{\circ}C)$ decreased monotonously with scattering angle for a while. Then SAXS profile showed a peak and the peak position progressively moved to wider angles with isothermal annealing time. Finally, the peak intensity decreased, shifting the peak angle to wider angle. It is revealed that ionic aggregates (multiplets structure) of several nm, calculated by Debye-Bueche plot, are formed at early stage. They seem to accelerate the crystallization rate and make fine crystallites without spherulite formation (supported by optical microscopy observation). From decrease of peak intensity in SAXS,it is suggested that new lamellae are inserted between the preformed lamellae so that the concentration of ionic multiplets in amorphous region decreases to lower the electron density difference between lamellar crystal and amorphous region. In addition, analysis on the annealing at a high temperature (Ta = 210 $^{\circ}C)$ by optical microscopy, light scattering and transmission electron microscopy shows a formation of spherulite, no ionic aggregates, the retarded crystallization rate and a high level of lamellar orientation.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2001.05b
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• pp.79-83
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• 2001

In order to compare the barrier properties of Ta-N/Si(001) with those of Ta-N/Ta/Si(001), we studied structural properties of films grown by RF magnetron sputtering with various $Ar/N_2$ ratios. To evaluate the barrier properties, the samples were annealed in a vacuum chamber. Ex-situ x-ray scattering measurements were done using an in-house x-ray system. With increasing nitrogen ratio in Ta-N/Si(001), the barrier property of Ta-N/Si(001) was enhanced, finally failed at $750^{\circ}C$ due to the crystallization and silicide formation. Compared with Ta-N/Si(001), Ta-N/Ta/Si(001) forms silicides at $650^{\circ}C$. However it does not crystallize even at $750^{\circ}C$. With increasing nitrogen composition in Ta-N/Ta/Si(001), the formation of tantalum silicide was reduced and the surface roughness was improved. To observe the surface morphology of Ta-N/Ta/Si(001) during annealing, we performed an in-situ x-ray scattering experiment using synchrotron radiation of the 5C2 at Pohang Light Source(PLS). Addition of Ta layer between Ta-N and Si(001) improved the surface morphology and reduced the surface degradation at high temperatures. In addition, increasing $N_2/Ar$ flow ratio reduced the formation of tantalum silicide and enhanced the barrier properties.

• Journal of the Korean Vacuum Society
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• v.15 no.2
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• pp.168-172
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• 2006

GaN nucleation layers were grown by hydride vapor phase epitaxy (HVPE) and the effect of growth temperature on the structural properties of GaN nucleation layers for nanorods was investigated by synchrotron x-ray scattering and Atomic Force Microscopy (AFM). For the samples grown at different temperatures, two-component rocking profiles of (002) GaN Bragg peaks for the GaN nucleation layers were observed with one very sharp and the other broad. It was shown that the two-component rocking profile could be qualitatively explained by surface morphology, which was in good agreement with AFM result, from which we could conclude that relatively low temperature is favorable for GaN nanorods formation.

• Macromolecular Research
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• v.16 no.7
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• pp.575-585
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• 2008

There are two beamlines (BLs), 4C1 and 4C2, at the Pohang Accelerator Laboratory that are dedicated to small angle X-ray scattering (SAXS). The 4C1 BL was constructed in early 2000 and is open to public users, including both domestic and foreign researchers. In 2003, construction of the second SAXS BL, 4C2, was complete and commissioning and user support were started. The 4C2 BL uses the same bending magnet as its light source as the 4C1 BL. The 4C1 BL uses a synthetic double multilayer monochromator, whereas the 4C2 BL uses a Si(111) double crystal monochromator for both small angle and wide angle X-ray scattering. In the 4C2 BL, the collimating mirror is positioned behind the monochromator in order to enhance the beam flux and energy resolution. A toroidal focusing mirror is positioned in front of the monochromator to increase the beam flux and eliminate higher harmonics. The 4C2 BL also contains a digital cooled charge coupled detector, which has a wide dynamic range and good sensitivity to weak scattering, thereby making it suitable for a range of SAXS and wide angle X-ray scattering experiments. The general performance of the 4C2 BL was initially tested using standard samples and further confirmed by the experience of users during three years of operation. In addition, several grazing incidence X-ray scattering measurements were carried out at the 4C2 BL.

• Textile Coloration and Finishing
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• v.28 no.1
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• pp.33-39
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• 2016

The crystal structure of nylon 56 fibers post extended by drawing process was investigated by synchrotron x-ray scattering measurement. In as-cast fiber, distinct (004) and (020) diffraction peaks were observed and they were related to initial metastable alignment of nylon molecules. With increase in the drawing ratio, (110) peak intensity was increased in vertical direction with decreasing (020) peak. At the same time, (004)' peak evolved position tilted to 29 degrees from the (004) peak. This evolution is directly related to stable crystalline phase of nylon 56 originated from additional formation of hydrogen bondings between N-H and C=O by post drawing process. We also compared density variation, stress-strain curves of the fiber as a function of drawing ratio and strain. The variations of density and tanacity also supported the increase of stable structure of nylon 56.

• Proceedings of the Korean Vacuum Society Conference
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• 1998.06a
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• pp.94-94
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• 1998

• Proceedings of the Korean Vacuum Society Conference
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• 2001.02a
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• pp.101-101
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• 2001

• Proceedings of the Materials Research Society of Korea Conference
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• 1998.08a
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• pp.142.4-142
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• 1998