• Proceedings of the Korean Society of Broadcast Engineers Conference
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• 2017.06a
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• pp.149-150
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• 2017

본 논문에서는 RGB-stripe 부화소 구조를 갖는 디스플레이에서 인지 화질을 향상시키면서, 색 왜곡을 저감할 수 있는 부화소 렌더링을 수행한다. 우선 인지 화질을 향상 시키는 주 필터와, 색 왜곡을 억제하는 비음수 필터를 디자인한다. 색 왜곡 가능성의 계산에 따라, 두 필터를 조합하고 영상을 렌더링 한다. 실험 결과, 본 논문의 부화소 렌더링 방법이 비교 방법에 비해 좋은 인지 화질을 얻으면서도 색 왜곡을 억제함을 보여준다.

• Proceedings of the Korean Society of Broadcast Engineers Conference
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• 2014.06a
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• pp.107-108
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• 2014

부화소 기반 영상 축소기법은 각각의 부화소를 조절함으로써 픽셀 기반 영상 축소기법보다 해상도를 향상시킬 수 있는 방법이다. 그러나 부화소에 의한 해상도의 증가는 종종 색상정보의 왜곡을 발생시킨다. 부화소 랜더링의 주요과제는 선명도를 유지함과 동시에 색조왜곡현상을 억제하는 것이다. 선행연구들은 부화소랜더링을 위해 1 차원 혹은 2 차원 필터를 최적화 하였지만, 지역적인 특성을 고려하지 않았기 때문에 출력영상의 화질이 저하되는 현상이 발생한다. 본 논문은 위와 같은 문제를 해결하기 위해 내용적응형 2D FIR 필터를 제작방법을 제안한다. 제안필터는 충분한 수의 저해상도 패치와 고해상도 패치 쌍을 이용하여 임의의 고해상도 패치로부터 고화질의 저해상도 패치를 만들기 위한 최적의 내용적응형 2D FIR 필터를 학습한다. 학습된 필터에 의한 실험결과 제안하는 필터가 종례기법들 보다 색조왜곡현상이 현저히 줄어들고, 출력영상의 선명도를 유지함을 보여준다.

• Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
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• 2005.05a
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• pp.437-442
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• 2005

In this paper, we proposed the 2-dimensional inspection algorithm for micro-BGA(Ball Grid Array) device using a vision system. The proposed method uses the subpixel algorithm for high precision. The proposed algorithm preferentially extracts the package area of device in the input image. After the extraction of package area, each ball areas are extracted by ball search window method. The parameters for inspection are calculated for the extracted ball area. In the simulation results, we have the average error within $17{\mu}m$.

• Journal of the Korean Operations Research and Management Science Society
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• v.16 no.2
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• pp.79-79
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• 1991

This paper presents an automated visual inspection/measuring system for the door inner panel manufacturing process. The main objective of this research is to develop inspection applications with a machine vision system related to the determination or quantification of parameters such as dimension, shape, quality of surfaces, number of holes in a panel, and presence or absence of specific features. For quality measurements, we showed a subpixel image processing technology that will improve the consistency of results and level of precision. Also presented is a data analysis method th detect process shifts so that corrective action can be undertaken before more defective units are manufactured.

• Proceedings of the KSRS Conference
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• 2004.10a
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• pp.136-139
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• 2004

The extraction of 'end-pixels' (i.e. end-members) aims to quantify the abundance of different materials in a single pixel, which becomes popular in the subpixel analysis for hyperspectral dataset. In this paper, we present a new concept called 'End-Pixel of Features (EPF)' to extends the concept of end-pixels for multispectral data and even panchromatic data. The algorithm combines the advantages of previous simplex and clustering methods to search the EPFs in the feature space and reduce the effects of noise. Some experimental results show that, the proposed methodology can be successfully used to hyperspectral data and other remote sensing data.

• 한국정보디스플레이학회:학술대회논문집
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• 2008.10a
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• pp.1525-1528
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• 2008

High-luminance CNT-FED character-displays using simple line-rib-structure was performed. One display-panel had $48{\times}480$-dots and the sub-pixel pitch was 1mm. Another panel had $32{\times}256$-color-pixels, and the subpixel size was $0.6mm{\times}1.8mm$. The power consumption was less than 10W at character-displaying module. It should be useful for public display even under emergent no-power condition.

• 한국정보디스플레이학회:학술대회논문집
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• 2003.07a
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• pp.347-350
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• 2003

Optimization of the luminance, luminous efficiency, and address voltage margin characteristics has been made on the delta color array PDP with various hexagonal shape subpixels. The optimal subpixel and electrode designs are obtained for the 42-inch high-definition PDP ($1,366{\times}768$) with the fine pixel pitch less than 0.7 mm. The hexagonal delta array structure shows more improved characteristics than that of the normal delta array structure with rectangular shape subpixels.

• Journal of Korean Society for Quality Management
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• v.23 no.3
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• pp.33-44
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• 1995

This paper presents an automated visual inspection system for the electronic parts manufacturing process. In this system, a statistical process control (SPC) method is integrated into the automated inspection method on a real time base. It shows how the collected data can be analyzed with the SPC to provide process information. Also presented are studies of subpixel image processing technology to improve the accuracy of parts measurements, and the cumulative-sum (CUSUM) control chart for fraction defectives. An application of the developed system to connector manufacturing process as a part of computer integrated manufacturing (CIM) is presented.

• Proceedings of the KIEE Conference
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• 2002.11c
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• pp.342-348
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• 2002

This paper presents a computer image processing system, which measures the thickness of the ALC block and inspects the defect on a real-time basis. The Image processing system was established with a CCD camera, an image grabber, and a personal computer without using assembled measurement equipment. The image obtained by the system was analyzed by a devised algorithm, specially designed for the enhanced measurement accuracy. For the realization of proposed algorithm, the pre-processing method that can be applied to overcome uneven lighting environment, and threshold decision method, and subpixel method are developed. from the experimental results, we could find that the required measurement accuracy specification is sufficiently satisfied using our proposed method.

• Korean Management Science Review
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• v.16 no.2
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• pp.79-92
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• 1999

This paper presents an automated visual inspection/measuring system for the door inner panel manufacturing process. The main objective of this research is to develop inspection applications with a machine vision system related to the determination or quantification of parameters such as dimension, shape, quality of surfaces, number of holes in a panel, and presence or absence of specific features. For quality measurements, we showed a subpixel image processing technology that will improve the consistency of results and level of precision. Also presented is a data analysis method th detect process shifts so that corrective action can be undertaken before more defective units are manufactured.