• Title/Summary/Keyword: sub-threshold CMOS circuit

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Design of Variable Gain Amplifier without Passive Devices (수동 소자를 사용하지 않는 가변 이득 증폭기 설계)

  • Cho, Jong Min;Lim, Shin Il
    • Journal of Korea Society of Industrial Information Systems
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    • v.18 no.5
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    • pp.1-8
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    • 2013
  • This paper presents a variable gain amplifier(VGA) without passive devices. This VGA employes the architecture of current feedback amplifier and variable gain can be achieved by using the GM ratios of two trans-conductance(gm) circuits. To obtain linearity and high gain, it uses current division technique and source degeneration in feedback GM circuits. Input trans-conductance(GM) circuit was biased by using a tunable voltage controller to obtain variable gain. The prototype of the VGA is designed in $0.35{\mu}m$ CMOS technology and it is operating in sub-threshold region for low power consumption. The the gain of proposed VGA is varied from 23dB to 43dB, and current consumption is $2.82{\mu}A{\sim}3{\mu}A$ at 3.3V. The area of VGA is 1$120{\mu}m{\times}100{\mu}m$.

A Tunable Band-Pass Filter for Multi Bio-Signal Detection (대역폭 조정 가능한 다중 생체 신호 처리용 대역 통과 필터 설계)

  • Jeong, Byeong-Ho;Lim, Shin-Il;Woo, Deok-Ha
    • Journal of IKEEE
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    • v.15 no.1
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    • pp.57-63
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    • 2011
  • This paper presents a tunable band pass filter (BPF) for multi bio-signal detection. The bandwidth can be controlled by the bias current of transconductance (gm), while conventional BPF exploited switchable capacitor array for band selection. With this design technique, the die area of proposed BPF reduced to at least one tenth the area of conventional design. The simulation results show the high cut-off frequency tuning range of from 100Hz to 1Khz. The circuit was implemented with a 0.18um CMOS standard technology. Total current consumption is 1uA at the supply voltage of 1V with sub-threshold design technique.

Analog Performance Analysis of Self-cascode Structure with Native-Vth MOSFETs (Native-Vth MOSFET을 이용한 셀프-캐스코드 구조의 아날로그 성능 분석)

  • Lee, Dae-Hwan;Baek, Ki-Ju;Ha, Ji-Hoon;Na, Kee-Yeol;Kim, Yeong-Seuk
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.26 no.8
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    • pp.575-581
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    • 2013
  • The self-cascode (SC) structure has low output voltage swing and high output resistance. In order to implement a simple and better SC structure, the native-$V_{th}$ MOSFETs which has low threshold voltage($V_{th}$) is applied. The proposed SC structure is designed using a qualified industry standard $0.18-{\mu}m$ CMOS technology. Measurement results show that the proposed SC structure has higher transconductance as well as output resistance than single MOSFET. In addition, analog building blocks (e.g. current mirror, basic amplifier circuits) with the proposed SC structure are investigated using by Cadence Spectre simulator. Simulation results show improved electrical performances.

Switching and Leakage-Power Suppressed SRAM for Leakage-Dominant Deep-Submicron CMOS Technologies (초미세 CMOS 공정에서의 스위칭 및 누설전력 억제 SRAM 설계)

  • Choi Hoon-Dae;Min Kyeong-Sik
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.43 no.3 s.345
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    • pp.21-32
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    • 2006
  • A new SRAM circuit with row-by-row activation and low-swing write schemes is proposed to reduce switching power of active cells as well as leakage one of sleep cells in this paper. By driving source line of sleep cells by $V_{SSH}$ which is higher than $V_{SS}$, the leakage current can be reduced to 1/100 due to the cooperation of the reverse body-bias. Drain Induced Barrier Lowering (DIBL), and negative $V_{GS}$ effects. Moreover, the bit line leakage which may introduce a fault during the read operation can be eliminated in this new SRAM. Swing voltage on highly capacitive bit lines is reduced to $V_{DD}-to-V_{SSH}$ from the conventional $V_{DD}-to-V_{SS}$ during the write operation, greatly saving the bit line switching power. Combining the row-by-row activation scheme with the low-swing write does not require the additional area penalty. By the SPICE simulation with the Berkeley Predictive Technology Modes, 93% of leakage power and 43% of switching one are estimated to be saved in future leakage-dominant 70-un process. A test chip has been fabricated using $0.35-{\mu}m$ CMOS process to verify the effectiveness and feasibility of the new SRAM, where the switching power is measured to be 30% less than the conventional SRAM when the I/O bit width is only 8. The stored data is confirmed to be retained without loss until the retention voltage is reduced to 1.1V which is mainly due to the metal shield. The switching power will be expected to be more significant with increasing the I/O bit width.