• Title/Summary/Keyword: solders

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Cu Corrosion Test Method for Lead-Free Solders (무연솔더 동판부식 시험법 연구)

  • Kim, Mi-Song;Hong, Won Sik;Oh, Chul Min;Kim, Keun-Soo
    • Journal of Welding and Joining
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    • v.35 no.3
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    • pp.21-27
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    • 2017
  • A soldering temperature of ($235{\pm}3$) $^{\circ}C$ is described in ISO 9455-15 for the copper corrosion test. However, this temperature is not suitable for performing lead-free solder pastes. We evaluated the compatibility of a lead-free solder paste in the experimental conditions of (Liquidus temperature + ($35{\pm}3$)) $^{\circ}C$. Based on the results after a Cu corrosion test, a proper temperature for Pb-free soldering was (melting point+($35{\pm}3$)) $^{\circ}C$. Criteria used to evaluate corrosion due to discoloration of flux residue is described in ISO 9455-15, but a more quantitative evaluation standard is needed. In this study, experimental error level was estimated by analyzing flux residue after a corrosion test for 72, 500 hours of specimens using EDS analysis with acceleration voltage. It was determined that the copper area at the flux residue boundary is suitable for the EDS analysis area.

Characteristics of joint resistance with different kinds of HTS tapes for heater trigger switch

  • Lee, Jeyull;Park, Young Gun;Lee, Woo Seung;Jo, Hyun Chul;Yoon, Yong Soo;Ko, Tae Kuk
    • Progress in Superconductivity and Cryogenics
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    • v.16 no.1
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    • pp.32-35
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    • 2014
  • Recently, many researches on the system of superconducting power supply and superconducting magnetic energy storage (SMES) using high temperature superconducting (HTS) tapes has been progressed. Those kinds of superconducting devices use the heater trigger switches that have a control delay problem at moments of heating up and cooling down. One way to reduce the time delay is using a different HTS tape at trigger part. For example, HTS tape having lower critical temperature can reduce time delay of heating up and heating down stage for heater trigger operation. This paper deals with resistances joint with different kinds of HTS tapes which have different properties to verify usefulness of the suggested method. Three kinds of commercial HTS tapes with different specifications are selected as samples and two kinds of solders are used for comparison. Joint is performed with temperature and pressure controllable joint machine and the joint characteristics are analyzed under the repeatable conditions.

Workers' Possible Exposure Hazards in Solar Energy Industries (결정질 실리콘 기반 태양광산업에서의 근로자노출 가능 유해인자)

  • Jang, Jae-Kil;Park, Hyunhee
    • Journal of the Korean Solar Energy Society
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    • v.33 no.5
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    • pp.24-33
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    • 2013
  • Renewable energy industries, including sola cell plants, has been ever increasing ones for reducing fossil fuel consumption and strengthening national energy policy. In this paper we tried to identify occupational health hazards in solar cell-related industries operated in Korea. Poly silicon, silicon ingot and wafer, solar cell and module are major processes for producing solar cells. Poly silicon operations may cause hazards to workers from metal silicon, silanes, silicon, hydro fluoric acid and nitric acid. Solar cells could not be constructed without using metals such as aluminum and silver, acids such as hydrofluoric acid and nitric acid, bases such as sodium hydroxide and potassium hydroxide, and solvent and phosphorus chloride oxide. Workers in module assembly process may exposed to isopropanol, flux, solders that contain lead, tin and/or copper. To prevent occupational exposure to these hazards, it is essential to identify the hazards in each process and educate workers in industries with proper engineering and administrative control measures.

The Growth of Fatigue Cracks in Eutectic Solders

  • Lee, Seong-Min
    • Korean Journal of Materials Research
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    • v.6 no.6
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    • pp.561-567
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    • 1996
  • The grain size effect on grain boyndary cracking in Pb-Sn eutectic during isothermal fatigue was investigated. Fatigue experiments were confined to two conditions : (1) 0.4% total strain range(approximetely 0.2% plastic strain range), 1.67$\times$10$^{-3}$/s frequency; and (2) 1.5% total strain rante(approximately 1.2% plastic strain range), 8.33$\times$10$^{-4}$/s frequency. Fatigue specimens were cross-sectioned to monitor the depth of crack growth continuosly and then, the maximum crack depths in units of the number of boundaries were plotted as functions of number of cycles for these two different strain ranges. The results revealed that the rate of crack growth(per cycle at fixed rate of crosshead motion) can be expressed as dc/dN=($\Delta$$\varepsilon$$_p$)$^n$c where n is typically 2, c is the crack length, $\Delta$$\varepsilon$$_p$ is the plastic strain range, and A is a "constant" that depends on whether the crack is deeper or shallower than its first triple point of the grain boundary, A decrdases by about a factor of three after the crack hits the first triple point, indecating that the fatigue crack is trapped at the triple point of the grain boundaries.

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Study on Wettability of Sn-Xwt%Cu Solder (Sn-Xwt%Cu계 솔더의 젖음성에 관한 연구)

  • Noh, Bo-In;Yoon, Jeong-Won;Vu, Bui Quoc;Jung, Seung-Boo
    • Journal of Welding and Joining
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    • v.25 no.6
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    • pp.78-83
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    • 2007
  • The wettability of Sn-Xwt%Cu(X=$0{\sim}3wt%$) solder was evaluated with wetting balance tester. And, the intermetallic compounds(IMCs) which were formed at the interface between solders and pads were investigated by using scanning electron microscopy(SEM) and energy dispersive spectroscopy(EDS). The wetting force of Sn-0.7wt%Cu solder was higher than that of 100wt%Sn and Sn-3.0wt%Cu solder. The value of $\gamma_{fl}$ and ($\gamma_{fs}-\gamma_{ls}$) had a tendency to increase with increasing the wetting temperature. The activation energy with bare Cu pad and flux with 15% solid content was increased in the following order: Sn-0.7Cu (68.42 kJ/mol) ; Sn-3.0Cu(72.66 kJ/mol) ; Sn solder(94.53 kJ/mol). It was identified that the Cu6Sn5 phase was formed at the interface between Sn-Xwt%Cu solder and Cu pad.

Fabrication and fault test of 12 kVA class BSCCO SFCL element (12 kVA급 BSCCO 한류소자 제작 및 특성 실험)

  • Oh, S.Y.;Yim, S.W.;Kim, H.R.;Hyun, O.B.;Jang, G.E.
    • Progress in Superconductivity and Cryogenics
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    • v.10 no.1
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    • pp.24-27
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    • 2008
  • For the development of superconducting fault current limiters(SFCLs) having large current capacity, we fabricated an SFCL element that consists of Bi-2212 superconductor and Cu-Ni alloy tubes. First, Ag was plated on the surface of the Bi-2212 for the enhancement of soldering process. On the Ag-plated Bi-2212 tube, a Cu-Ni alloy tube was soldered using optimized solders and soldering conditions. The BSCCO/Cu-Ni composite was processed mechanically to have a helical shape for the improvement of the SFCL characteristics. The total current path of the SFCL element was 1330 mm long with 12 turns, and had critical current of 340 A at 77 K. Finally, we carried out the fault test using the fabricated SFCL element. It showed successful current limiting performance under the fault condition of 50 $V_{rms}$ and 5.5 kA. From the results, the rated voltage of the SFCL element was decided to be 0.4 V/cm, and the power capacity was 12 kVA at 77 K. The fabrication process of the SFCL and the fault test results will be presented.

Difference of Potential Range Formed at the Anode Between Water Drop Test and Temperature Humidity Bias Test to Evaluate Electrochemical Migration of Solders for Printed Circuit Board

  • Young Ran Yoo;Young Sik Kim
    • Corrosion Science and Technology
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    • v.22 no.3
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    • pp.153-163
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    • 2023
  • Two types of accelerated tests, Water Drop Test (WDT) and Temperature-Humidity-Bias Test (THBT), can be used to evaluate the susceptibility to electrochemical migration (ECM). In the WDT, liquid water is directly applied to a specimen, typically a patterned conductor like a printed circuit board. Time to failure in the WDT typically ranges from several seconds to several minutes. On the other hand, the THBT is conducted under elevated temperature and humidity conditions, allowing for assessment of design and life cycle factors on ECM. THBT is widely recognized as a more suitable method for reliability testing than WDT. In both test methods, localized corrosion can be observed on the anode. Composition of dendrites formed during the WDT is similar to that formed during THBT. However, there is a lack of correlation between the time to failure obtained from WDT and that obtained from THBT. In this study, we investigated the relationship between electrochemical parameters and time to failure obtained from both WDT and THBT. Differences in time to failure can be attributed to actual anode potential obtained in the two tests.

Reliability of High Temperature and Vibration in Sn3.5Ag and Sn0.7Cu Lead-free Solders (Sn3.5Ag와 Sn0.7Cu 무연솔더에 대한 고온 진동 신뢰성 연구)

  • Ko, Yong-Ho;Kim, Taek-Soo;Lee, Young-Kyu;Yoo, Sehoo;Lee, Chang-Woo
    • Journal of the Microelectronics and Packaging Society
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    • v.19 no.3
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    • pp.31-36
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    • 2012
  • In this study, the complex vibration reliability of Sn-3.5Ag and Sn-0.7Cu having a high melting temperature was investigated. For manufacturing of BGA test samples, Sn-3.5Ag and Sn-0.7Cu balls were joined on BGA chips finished by ENIG and the chips were mounted on PCB finished OSP by using reflow process. For measuring of resistance change during complex vibration test, daisy chain was formed in the test board. From the results of resistance change and shear strength change, the reliability of two solder balls was compared and evaluated. During complex vibration for 120 hours, Sn-0.7Cu solder was more stable than Sn-3.5Ag solder in complex vibration test.

Evaluation on Reliability of High Temperature Lead-free Solder for Automotive Electronics (자동차 전장 보드용 고온 무연 솔더의 신뢰성 평가)

  • Ko, Yong-Ho;Yoo, Se-Hoon;Lee, Chang-Woo
    • Journal of the Microelectronics and Packaging Society
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    • v.17 no.4
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    • pp.35-40
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    • 2010
  • In this study, the reliability of thermal shock, thermal cycle, and complex vibration test at high temperature were examined for 3 types of lead-free solder alloys, Sn-3.5Ag, Sn-0.7Cu and Sn-5.0Sb. For the reliability test, daisychained BGA chips with ENIG-finished Cu pad was assembled with the three lead-free solders on OSP-finished PCBs. Among the 3 types solder alloys, Sn-3.5Ag solder alloy showed the highest degradation rate of electrical resistance and joint strength. On the other hand, Sn-0.7Cu solder alloy had high stability after the reliability tests.

Thermo-Mechanical Reliability of Lead-Free Surface Mount Assemblies for Auto-Mobile Application (무연 솔더가 적용된 자동차 전장부품 접합부의 열적.기계적 신뢰성 평가)

  • Ha, Sang-Su;Kim, Jong-Woong;Chae, Jong-Hyuck;Moon, Won-Chul;Hong, Tae-Hwan;Yoo, Choong-Sik;Moon, Jeong-Hoon;Jung, Seung-Boo
    • Journal of Welding and Joining
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    • v.24 no.6
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    • pp.21-27
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    • 2006
  • This study was focused on the evaluation of the thermo-mechanical board-level reliability of Pb-bearing and Pb-free surface mount assemblies. The composition of Pb-bearing solder was a typical Sn-37Pb and that of Pb-free solder used in this study was a representative Sn-3.0Ag-0.5Cu in mass %. Thermal shock test was chosen for the reliability evaluation of the solder joints. Typical $Cu_6Sn_5$ intermetallic compound (IMC) layer was formed between both solders and Cu lead frame at the as-reflowed state, while a layer of $Cu_3Sn$ was additionally formed between the $Cu_6Sn_5$ and Cu lead frame during the thermal shock testing. Thickness of the IMC layers increased with increasing thermal shock cycles, and this is very similar result with that of isothermal aging study of solder joints. Shear test of the multi layer ceramic capacitor(MLCC) joints was also performed to investigate the degradation of mechanical bonding strength of solder joints during the thermal shock testing. Failure mode of the joints after shear testing revealed that the degradation was mainly due to the excessive growth of the IMC layers during the thermal shock testing.