• 한국결정성장학회지
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• 제8권3호
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• pp.396-400
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• 1998

KLN은 성장 결정 내의 $Nb_2O_5$함유량에 따라 물성이 크게 변화하므로 단결정의 조성제어가 매우 중요하다. 본 실험에서는 초기 KLN용액의 $Nb_2O_5$함량을 증가시켜 $Nb_2O_5$함유량이 높은 KLN단결정을 온도요동법과 TSSG법에 의해 성장시키고 성장된 KLN단결정인 $Nb_2O_5$증가량에 따른 격자결함의 유무를 관찰하고자 유전 및 광학 특성을 관찰하다. KLN 단결정 내에 격자결함의 증가에 의해 낮은 에너지로의 단락 frequency 이동과 DPT 특성을 보이는 넓은 Curie 범위가 관찰되었다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2007년도 하계학술대회 논문집 Vol.8
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• pp.121-122
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• 2007

Single crystal $CuAlSe_2$ layers were grown on thoroughly etched sem-insulating GaAs(l00) substrate at $410^{\circ}C$ with hot wall epitaxy (HWE) system by evaporating $CuAlSe_2$ source at $680^{\circ}C$. The crystalline structure of the single crystal thin films was investigated by the photoluminescence and double crystal X-ray diffraction (DCXD). The carrier density and mobility of single crystal $CuAlSe_2$ thin films measured with Hall effect by van der Pauw method are $9.24{\times}l0^{16}\;cm^{-3}$ and $295\;cm^2/V{\cdot}s$ at 293K, respectively. The temperature dependence of the energy band gap of the $CuAlSe_2$ obtained from the absorption spectra was well described by the Varshni's relation, $E_g(T)\;=\;2.8382\;eV\;-\;(8.68\;{\times}\;10^{-4}\;eV/K)T^2/(T\;+\;155\;K)$.

• 센서학회지
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• 제23권1호
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• pp.51-57
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• 2014

The evaporating materials for $MgGa_2Se_4$ single crystal thin films was prepared from horizontal electric furnace. To obtain the single crystal thin films, $MgGa_2Se_4$ compounded polycrystal powder was deposited on thoroughly etched semi-insulated GaAs(100) substrate by the hot wall epitaxy (HWE) method system. The source and substrate temperatures of optimized growth conditions, were $610^{\circ}C$ and $400^{\circ}C$, respectively.The source and substrate temperatures were $610^{\circ}C$ and $400^{\circ}C$, respectively. The crystalline structure of the single crystal thin films was investigated by double crystal X-ray diffraction (DCXD). The temperature dependence of the energy band gap of the $MgGa_2Se_4$ obtained from the absorption spectra was well described by the Varshni's relation, $E_g(T)=2.34\;eV-(8.81{\times}10^{-4}\;eV/K)T^2/(T+251\;K)$. After the as-grown $MgGa_2Se_4$ single crystal thin films was annealed in Mg-, Se-, and Ga-atmospheres, the origin of point defects of $MgGa_2Se_4$ single crystal thin films has been investigated by the photoluminescence (PL) at 10 K. The native defects of $V_{Mg}$, $V_{Se}$ obtained by PL measurements were classified as a donors or acceptors type. And we concluded that the heat-treatment in the Se-atmosphere converted $MgGa_2Se_4$ single crystal thin films to an optical n-type. Also, we confirmed that Ga in $MgGa_2Se_4$/GaAs did not form the native defects because Ga in $MgGa_2Se_4$ single crystal thin films existed in the form of stable bonds.

• 한국결정성장학회지
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• 제34권4호
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• pp.139-142
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• 2024

SiC와 GaN 등의 광에너지갭 소재들의 전력반도체에 대한 활용과 소자의 개발 추세와 함께 더 높은 에너지갭을 갖는 AlN 단결정에 대한 연구도 2인치 단결정 웨이퍼의 개발 성공 등 많은 연구 결과가 보고되고 있다. 그러나, 화학기상증착공법을 적용하여 성장된 AlN 단결정은 수 마이크로미터의 두께 이하의 박막은 개발되었으나, 그 이상의 두께를 갖은 결과는 거의 없다. 따라서, 본 연구에서는 화학기상증착공법중 하나인 HVPE(Hydride vapor phase epitaxy) 법을 적용하여 성장하고자 하였다. 성장된 AlN 단결정은 자체 제작된 설비를 이용하여 제작하였으며, 사파이어 기판을 사용하여, AlN 단 결정을 제조하기 위한 조건을 확립하고자 하였고, 그 결과를 광학현미경 관찰을 통하여 성장거동을 고찰하고자 하였다.

• 한국결정성장학회지
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• 제5권3호
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• pp.240-249
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• 1995

무색투명하고 순수한 단결정을 얻기 위하여 $TiO_{2}$(rutile) 단결정을 floating zone법으로 성장하였다. 성장된 결정을 c축에 수직 및 수평하게 절단하여 500~1000 nm 범위의 파장에서 선형 굴절율을 측정하였으며 흡수스펙트롬으로부터 optical energy band gap이 2.99 eV임을 알 수 있었다. $TiO_{2}$(rutile) 단결정의 $\chi^{(3)}$ 값을 반경험적인 모델을 기반으로 하여 $SiO_{2}$ quartz 단결정의 $\chi^{(3)}$ 값과 비교하여 분석하였다. 또한 제 3 비선형광학 특성에 있어서의 Ti$\^{4+}$의 영향을 해석하기 위해 second hyperpolarizability, ${\gamma}$(Ti$\^{4+}$)를 계산하였다.

• 한국주조공학회지
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• 제10권4호
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• pp.324-331
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• 1990

The single crystal of CdTe was grown by modified 6 zone Bridgman method under the conditions of excess Te and excess Cd. To prevent the constitutional supercooling, the crystal growth was done under the temperature gradient of $17^{\circ}C/cm$ in front of the solid /liquid interface and the growth rate was 3mm/hr. The grain morphologies and the growth mechanism were investigated in excess Te and excess Cd conditions. The grain size of excess Te crystal was increased with an increase of the distance from the tip but, in the case of excess Cd crystal, single crystal was not obtained because of the cavities due to the excess Cd vapors so that the grain size was not increased with an increase of the distance from the tip. In addition, the growth of single crystal of CdTe was done with repeated necking ampoule. It was found that the necking had no effects on the grain selection because the cavities trapped in the necking portion acted as heterogeneous nucleation sites.

• 한국광학회지
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• 제9권3호
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• pp.175-180
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• 1998

고체 레이저매질로 가장 널리 쓰이는 Nd:YAG 단결정을 Czochralski 방법으로 육성하였다. 자체 제작한 Czochralski 결정 육성로 및 자동 결정 적경제어 장치를 써서 유효 직경 50mm, 길이 100mm의 Nd3+ 이온농도가 0.9at%이고 <111>방향의 단결정을 육성하였다. 단결정 육성시 융액의 수직방향에 대한 온도구배가 중용한 변수인 것이 확인되었으며, 결정 직경은 자동 제어가 가능하도록 컴퓨터 프로그램을 제작하였다. 육성된 단결정을 절단, 가공, 연마, 코팅 과정을 거쳐서 레이저 발진용 Nd:YAG막대를 제작하고 흡수 스펙트럼, 형과 스펙트럼 분석을 통하여 정확한 Nd:YAG의 레이저 발진특성을 확인하였다. 자체 가공된 레이저 막대로부터 발진된 CW 레이저의 최대 출력은 70W이었고, 발진문턱값과 효율은 각각 1.3kW, 1.64%이었다.

• 한국결정성장학회지
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• 제13권6호
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• pp.279-283
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• 2003

본 연구에서는 ZnTe에 S 원자를 소량 첨가한 ZnTe : S 단결정 박막이 열적적층법에 의하여 GaAs(100) 기판 위에 성장되었다. S 원자에 의한 효과를 알기 위하여 ZnTe : S 단결정 박막의 광발광 특성을 조사하였다. 저온 광발광 스펙트럼에서 등전자적 중심(isoelectronic center)으로 보이는 2.339 eV의 피크가 관측되었고, ZnTe 단결정 박막의 광발광 스펙트럼에서 근원을 알 수 없었던 발광 스펙트럼은 관측되지 않았다. 온도에 따른 가벼운 양공 자유 엑시톤의 세기 변화는 외부자기포획(extrinsic self-trapping)으로 설명하였다. 그리고 상온에서 에너지 띠간격 흡수단 근처의 발광선이 관측되었다.

• 한국재료학회지
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• 제27권12호
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• pp.679-687
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• 2017

A strain-gradient crystal plasticity finite element method(SGCP-FEM) was utilized to simulate the compressive deformation behaviors of single-slip, (111)[$10{\bar{1}}$], oriented FCC single-crystal micro-pillars with two different slip-plane inclination angles, $36.3^{\circ}$ and $48.7^{\circ}$, and the simulation results were compared with those from conventional crystal plasticity finite element method(CP-FEM) simulations. For the low slip-plane inclination angle, a macroscopic diagonal shear band formed along the primary slip direction in both the CP- and SGCP-FEM simulations. However, this shear deformation was limited in the SGCP-FEM, mainly due to the increased slip resistance caused by local strain gradients, which also resulted in strain hardening in the simulated flow curves. The development of a secondly active slip system was altered in the SGCP-FEM, compared to the CP-FEM, for the low slip-plane inclination angle. The shear deformation controlled by the SGCP-FEM reduced the overall crystal rotation of the micro-pillar and limited the evolution of the primary slip system, even at 10 % compression.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2004년도 추계학술대회 논문집 Vol.17
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• pp.175-178
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• 2004

The stochiometric mixture of evaporating materials for the $ZnIn_2S_4$ single crystal thin film was prepared from horizontal furnace. To obtain the $ZnIn_2S_4$ single crystal thin film, $ZnIn_2S_4$ mixed crystal was deposited on throughly etched semi-insulating GaAs(100) in the Hot Wall Epitaxy(HWE) system. The source and substrate temperature were $610^{\circ}C$ and $450^{\circ}C$, respectively and the growth rate of the $ZnIn_2S_4$ sing1e crystal thin film was about $0.5\;{\mu}m/hr$. The crystalline structure of $ZnIn_2S_4$ single crystal thin film was investigated by photoluminescence and double crystal X-ray diffraction(DCXD) measurement. The carrier density and mobility of $ZnIn_2S_4$ single crystal thin film measured from Hall effect by van der Pauw method are $8.51{\times}10^{17}\;cm^{-3}$, $291\;cm^2/V{\cdot}s$ at $293_{\circ}\;K$, respectively. From the photocurrent spectrum by illumination of perpendicular light on the c - axis of the $ZnIn_2S_4$ single crystal thin film, we have found that the values of spin orbit splitting ${\Delta}S_O$ and the crystal field splitting ${\Delta}Cr$ were 0.0148 eV and 0.1678 eV at $10_{\circ}\; K$, respectively. From the photoluminescence measurement of $ZnIn_2S_4$ single crystal thin film, we observed free excition $(E_X)$ typically observed only in high quality crystal and neutral donor bound exciton $(D^{o},X)$ having very strong peak intensity The full width at half maximum and binding energy of neutral donor bound excition were 9 meV and 26 meV, respectively, The activation energy of impurity measured by Haynes rule was 130 meV.