• Title/Summary/Keyword: short-circuit

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A Study on the Cause and Countermeasures of the Short-Circuit Test Failures of the Distribution Transformer (배전용 변압기의 단락시험 불량원인 및 그 대책에 관한 연구)

  • Park, Byung-Rak;Park, Hoon-Yang;Shin, Hee-Sang;Kim, Jae-Chul
    • Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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    • v.25 no.6
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    • pp.75-81
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    • 2011
  • This study aims to research and analyze the cause and countermeasures of the short-circuit test failures of the distribution transformer, which captures failure share at the highest level when carrying out its performance test. For this purpose, the research was done on the basis of 77 failure cases out of 998 tests in total performed by the Korea Electrotechnology Research Institute(KERI) from 2004 to 2010. Based on the research, the paper also includes analysis of the causes of the short-circuit test failures in its early stage of transformer development and proposes its countermeasures accordingly.

Autonomous Adaptive Digital Over Current Relay (계통변화를 고려한 자율 적응형 과전류 계전기)

  • 윤준석;최면송;이승재;현승호
    • The Transactions of the Korean Institute of Electrical Engineers A
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    • v.52 no.8
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    • pp.444-449
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    • 2003
  • In this paper present Autonomous Adaptive Digital Over Current Relay for distribution networks which acts autonomous setting using the short circuit impedance measured by relay of power systems. Automation of relay setting is one of the basic requirements for distribution automation, although manual relay setting is used at present. The short circuit impedance from a power source in distribution networks essential for the Autonomous Relay Setting changes frequently in distribution networks. In this paper the short circuit impedance is calculated with voltage and current measured in real time operation of digital relay using the Recursive Least Squares. A new method of digital relay setting is introduced using the the short circuit impedance and load current.

A Study on the Optimal Power Flow with Suppressing the Short Circuit Capacity in Power Systems (전력계통의 고장용량 억제를 위한 최적조류계산 연구)

  • Lee, Gwang-Ho
    • The Transactions of the Korean Institute of Electrical Engineers A
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    • v.49 no.12
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    • pp.575-580
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    • 2000
  • Switching of the transmission lines(T/L) is one of the ways for suppressing the short circuit capacity. This paper presents the extended optimal power flow(OPF) to the problem of selecting the T/Ls to be open. The constraints of the short circuit currents within limits are added to the inequalities of OPF. Also, the overload on the other lines due to switching of T/Ls is avoided by the linearized inequalities. The number of the open lines can be minimized by incorporating into the objective function of OPF in order to maintain reliability. The method of an effective calculation of the extended OPF is also proposed in this paper, which makes the two parts decoupled. The one concerning the generation dispatch is solved in the first place by the conventional method. Secondly, the other concerning the line-switching is optimized by the proposed formulation.

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A Study on Failure Analysis of Low Voltage Breakers with Aging (경년열화에 따른 배선용 차단기류의 고장점 분석 연구)

  • Cho, Han-Goo;Lee, Un-Yong;Lee, You-Jung;Lee, Hae-Ki;Kang, Seong-Hwa
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2006.06a
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    • pp.501-502
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    • 2006
  • In this paper, new and aging sample of MCCB and ELCB are investigated the main performance test such as short circuit test, mechanical and electrical endurance test, dielectric test and surge current test. The surface conditions of new and aging sample are analyzed by SEM, TGA and DSC. The ELCB occurred badness mainly in short circuit test and surge current test. The badness cause of short circuit test was confirmed due to imperfect contact of contact part.

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CD 스터드 용접의 해석 및 결함 분석 Part 2 : 기공 제어

  • Oh Hyun-Seok;Yoo Choong-D.
    • Journal of Welding and Joining
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    • v.24 no.3
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    • pp.42-48
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    • 2006
  • Since the voids occur at the CD stud welds, the mechanism of void formation and void reduction method are investigated in this work. It is speculated that the voids are formed because of high short-circuit current above 1000A. When the simple flow model is used to estimate the void trapping condition, the most voids are trapped at the weld mainly due to fast cooling rate of the CD stud weld. Since it is almost impossible to remove the voids completely, a method is proposed to reduce the void by decreasing the short-circuit current at the end of the arcing time. The experimental results show that the void is reduced by decreasing the short-circuit current to 1000A.

An Evaluation Method for Short-Term Ratings of Double-Circuit Overhead Transmission Lines (2회선 가공송전선의 단시간정격에 관한 평가방법)

  • Kim, Sung-Duck;Sohn, Hong-Kwan;Jang, Tae-In
    • Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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    • v.21 no.7
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    • pp.20-28
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    • 2007
  • This paper describes an analytical method to determine the short-term ratings to reliably operate the overhead transmission lines with double-circuit lines when faulting one circuit of the two. As linearizing the thermal equilibrium equation that represents the temperature characteristic of conductors, we show that the linear equation can be easily represented the over-current and it's temperature property during overloading the one line. Generally, it is well hewn that the short-term line ratings should be determined by considering both conductor life and dip. However, most power companies have their own different guides for the short-term ratings. Using the suggested method in this paper, it can be re-accessed the short-term ratings given in Kepco's overhead transmission lines constructed during the past three different periods. As a result, it is verified that the short-term ratings could be increased mil efficiently. Furthermore, it would be directly applied the given method to determine the short-term dynamic line ratings when occurring faults in one of the double-circuit lines, without doing my other actions for the current lines.

Dynamic Motion Analysis of a Moving Contact by Electromagnetic Repulsion Force in MCCB (3D FEM해석을 통한 배선용 차단기의 가동자 거동해석)

  • Song, Jung-Chun;Kim, Yong-Gi;Ryu, Man-Jong;Seo, Jung-Min
    • Proceedings of the KIEE Conference
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    • 2002.07b
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    • pp.786-789
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    • 2002
  • The behaviour of contactors protected by arcs under short-circuit currents is analysed using a simple model to represent the electric circuit and the contactor. In most cases, the protection of contactors against short-circuit currents is entrusted to fuses. Fuses are suitable for preventing excessive damage to the contactor, or parts of the contactor, under short-circuit conditions. In particular, they are capable of limiting the thermal and electrodynamic stresses which can lead to arcing or welding together of the contacts of a contactor. This paper is the Dynamic Motion Analysis of a Moving Contact by Electromagnetic Repulsion Force in Molded Case Circuit Breaker(MCCB)

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Short-Circuit Current of Polymeric Materials with M1-P-M2 structure in High Temperature Region (고정영역에서 M1-P-M2형 고분자재료의 단락전류)

  • 이덕출;이능헌;임헌찬
    • The Transactions of the Korean Institute of Electrical Engineers
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    • v.36 no.5
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    • pp.339-345
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    • 1987
  • In the region of high temperature, a very appreciable short-circuit current Is was observed from M1(A1)-P(PET)-M2(Cu) system sandwitched with hetero metals without applying external field. The short-circuit current Is is greatly dependent on electrode material and it has been certified by measuring open-circuit voltage. From these experimental results, we can see that Is is due to electro-chemical action in M-P interface. In this electro-chemical reaction,the generation reaction and the solution reacftion of the oxidies from electrode are probably co-exist and the measured values of the open-circuit voltage was almost correspond to those calculated from Nernst equation.

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Limiting method of short-circuit making current by controlling the time constant of dc component (단락시험 회로의 시정수 조정에 의한 투입전류 제한법)

  • Park, Seung-Jae;Ryou, Hyeong-Kee;Kang, Young-Sik;Koh, Heui-Seog
    • Proceedings of the KIEE Conference
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    • 2002.07a
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    • pp.466-468
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    • 2002
  • In order to newly define and specify the performance and the testing method of the high-voltage circuit breaker, IEC 62271-100 was published in May, 2001 and took place of IEC 60056 which had been used since 1987. This new standard intensifies the requirement and the test method of the circuit breaker and also domestic manufacturer makes progress the new product development. And, KERI also goes on the build-up project of short-circuit testing facilities for fulfilling the testing method requirements in new IEC 62271-100. This paper introduce the limiting method of short-circuit making current by controlling the time constant of dc component.

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