• Title/Summary/Keyword: sequential pattern

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Design and Implementation of Sequential Pattern Miner to Analyze Alert Data Pattern (경보데이터 패턴 분석을 위한 순차 패턴 마이너 설계 및 구현)

  • Shin, Moon-Sun;Paik, Woo-Jin
    • Journal of Internet Computing and Services
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    • v.10 no.2
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    • pp.1-13
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    • 2009
  • Intrusion detection is a process that identifies the attacks and responds to the malicious intrusion actions for the protection of the computer and the network resources. Due to the fast development of the Internet, the types of intrusions become more complex recently and need immediate and correct responses because the frequent occurrences of a new intrusion type rise rapidly. Therefore, to solve these problems of the intrusion detection systems, we propose a sequential pattern miner for analysis of the alert data in order to support intelligent and automatic detection of the intrusion. Sequential pattern mining is one of the methods to find the patterns among the extracted items that are frequent in the fixed sequences. We apply the prefixSpan algorithm to find out the alert sequences. This method can be used to predict the actions of the sequential patterns and to create the rules of the intrusions. In this paper, we propose an extended prefixSpan algorithm which is designed to consider the specific characteristics of the alert data. The extended sequential pattern miner will be used as a part of alert data analyzer of intrusion detection systems. By using the created rules from the sequential pattern miner, the HA(high-level alert analyzer) of PEP(policy enforcement point), usually called IDS, performs the prediction of the sequence behaviors and changing patterns that were not visibly checked.

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Mining Frequent Closed Sequences using a Bitmap Representation (비트맵을 사용한 닫힌 빈발 시퀀스 마이닝)

  • Kim Hyung-Geun;Whang Whan-Kyu
    • The KIPS Transactions:PartD
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    • v.12D no.6 s.102
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    • pp.807-816
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    • 2005
  • Sequential pattern mining finds all of the frequent sequences satisfying a minimum support threshold in a large database. However, when mining long frequent sequences, or when using very low support thresholds, the performance of currently reported algorithms often degrades dramatically. In this paper, we propose a novel sequential pattern algorithm using only closed frequent sequences which are small subset of very large frequent sequences. Our algorithm generates the candidate sequences by depth-first search strategy in order to effectively prune. using bitmap representation of underlying databases, we can effectively calculate supports in terms of bit operations and prune sequences in much less time. Performance study shows that our algorithm outperforms the previous algorithms.

A Personalized Automatic TV Program Scheduler using Sequential Pattern Mining (순차 패턴 마이닝 기법을 이용한 개인 맞춤형 TV 프로그램 스케줄러)

  • Pyo, Shin-Jee;Kim, Eun-Hui;Kim, Mun-Churl
    • Journal of Broadcast Engineering
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    • v.14 no.5
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    • pp.625-637
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    • 2009
  • With advent of TV environment and increasing of variety of program contents, users are able to experience more various and complex environment for watching TV contents. According to the change of content watching environment, users have to make more efforts to choose his/her interested TV program contents or TV channels than before. Also, the users usually watch the TV program contents with their own regular way. So, in this paper, we suggests personalized TV program schedule recommendation system based on the analyzing users' TV watching history data. And we extract the users' watched program patterns using the sequential pattern mining method. Also, we proposed a new sequential pattern mining which is suitable for TV watching environment and verify our proposed method have better performance than existing sequential pattern mining method in our application area. In the future, we will consider a VoD characteristic for extending to IPTV program schedule recommendation system.

Mining Approximate Sequential Patterns in a Large Sequence Database (대용량 순차 데이터베이스에서 근사 순차패턴 탐색)

  • Kum Hye-Chung;Chang Joong-Hyuk
    • The KIPS Transactions:PartD
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    • v.13D no.2 s.105
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    • pp.199-206
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    • 2006
  • Sequential pattern mining is an important data mining task with broad applications. However, conventional methods may meet inherent difficulties in mining databases with long sequences and noise. They may generate a huge number of short and trivial patterns but fail to find interesting patterns shared by many sequences. In this paper, to overcome these problems, we propose the theme of approximate sequential pattern mining roughly defined as identifying patterns approximately shared by many sequences. The proposed method works in two steps: one is to cluster target sequences by their similarities and the other is to find consensus patterns that ire similar to the sequences in each cluster directly through multiple alignment. For this purpose, a novel structure called weighted sequence is presented to compress the alignment result, and the longest consensus pattern that represents each cluster is generated from its weighted sequence. Finally, the effectiveness of the proposed method is verified by a set of experiments.

New Test Generation for Sequential Circuits Based on State Information Learning (상태 정보 학습을 이용한 새로운 순차회로 ATPG 기법)

  • 이재훈;송오영
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.25 no.4A
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    • pp.558-565
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    • 2000
  • While research of ATPG(automatic test pattern generation) for combinational circuits almost reaches a satisfiable level, one for sequential circuits still requires more research. In this paper, we propose new algorithm for sequential ATPG based on state information learning. By efficiently storing the information of the state searched during the process of test pattern generation and using the state information that has been already stored, test pattern generation becomes more efficient in time, fault coverage, and the number of test patterns. Through some experiments with ISCAS '89 benchmark circuits, the efficiency of the proposed method is shown.

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A Conversational Analysis about Patient's Discomfort between a Patient with Cancer and a Nurse (불편감을 가진 암환자와의 간호대화 분석)

  • Lee, Hwa-Jin
    • Journal of Korean Academy of Nursing
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    • v.37 no.1
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    • pp.145-155
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    • 2007
  • Purpose: The purpose of this study was to describe and to analyze real communication about a patient's discomfort between a patient with cancer and a nurse. Method: A dialogue analysis method was utilized. Fifteen patients and 4 nurses who participated in this research gave permission to be videotaped. The data was collected from January, 3 to February 28, 2006. Results: The communication process consisted of 4 functional stages: 'introduction stage', 'assessment stage', 'intervention stage' and 'final stage'. After trying to analyze pattern reconstruction in the 'assessment stage' and 'intervention stage', sequential patterns were identified. In the assessment stage, if the nurse lead the communication, the sequential pattern was 'assessment question-answer' and if the patient lead the communication, it was 'complaint-response'. In the intervention stage, the sequential pattern was 'nursing intervention-acceptance'. Conclusion: This research suggests conversation patterns between patients with cancer and nurses. Therefore, this study will provide insight for nurses in cancer units by better understanding communication behaviors.

Test Generation of Sequential Circuits Using A Partial Scan Based on Conversion to Pseudo-Combinational Circuits (유사 조합 회로로의 변환에 기초한 부분 스캔 기법을 이용한 디지털 순차 회로의 테스트 기법 연구)

  • Min, Hyoung-Bok
    • The Transactions of the Korean Institute of Electrical Engineers
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    • v.43 no.3
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    • pp.504-514
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    • 1994
  • Combinational automatic test pattern generators (CATPG) have already been commercialized because their algorithms are well known and practical, while sequential automatic test pattern generators(SATPG) have been regarded as impractical because they are computationally complex. A technique to use CATPG instead of SATPG for test generation of sequential circuits is proposed. Redesign of seauential circuits such as Level Sensitive Scan Design (LSSD) is inevitable to use CATPG. Various partial scan techniques has been proposed to avoid full scan such as LSSD. It ha sbeen reported that SATPG is required to use partial scan techniques. We propose a technique to use CATPG for a new partial scan technique, and propose a new CATPG algorithm for the partially scanned circuits. The partial scan technique can be another choice of design for testability because it is computationally advantageous.

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Mining Frequent Sequential Patterns over Sequence Data Streams with a Gap-Constraint (순차 데이터 스트림에서 발생 간격 제한 조건을 활용한 빈발 순차 패턴 탐색)

  • Chang, Joong-Hyuk
    • Journal of the Korea Society of Computer and Information
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    • v.15 no.9
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    • pp.35-46
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    • 2010
  • Sequential pattern mining is one of the essential data mining tasks, and it is widely used to analyze data generated in various application fields such as web-based applications, E-commerce, bioinformatics, and USN environments. Recently data generated in the application fields has been taking the form of continuous data streams rather than finite stored data sets. Considering the changes in the form of data, many researches have been actively performed to efficiently find sequential patterns over data streams. However, conventional researches focus on reducing processing time and memory usage in mining sequential patterns over a target data stream, so that a research on mining more interesting and useful sequential patterns that efficiently reflect the characteristics of the data stream has been attracting no attention. This paper proposes a mining method of sequential patterns over data streams with a gap constraint, which can help to find more interesting sequential patterns over the data streams. First, meanings of the gap for a sequential pattern and gap-constrained sequential patterns are defined, and subsequently a mining method for finding gap-constrained sequential patterns over a data stream is proposed.

Efficiently Managing the B-tree using Write Pattern Conversion on NAND Flash Memory (낸드 플래시 메모리 상에서 쓰기 패턴 변환을 통한 효율적인 B-트리 관리)

  • Park, Bong-Joo;Choi, Hae-Gi
    • Journal of KIISE:Computer Systems and Theory
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    • v.36 no.6
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    • pp.521-531
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    • 2009
  • Flash memory has physical characteristics different from hard disk where two costs of a read and write operations differ each other and an overwrite on flash memory is impossible to be done. In order to solve these restrictions with software, storage systems equipped with flash memory deploy FTL(Flash Translation Layer) software. Several FTL algorithms have been suggested so far and most of them prefer sequential write pattern to random write pattern. In this paper, we provide a new technique to efficiently store and maintain the B-tree index on flash memory. The operations like inserts, deletes, updates of keys for the B-tree generate random writes rather than sequential writes on flash memory, leading to inefficiency to the B-tree maintenance. In our technique, we convert random writes generated by the B-tree into sequential writes and then store them to the write-buffer on flash memory. If the buffer is full later, some sequential writes in the buffer will be issued to FTL. Our diverse experimental results show that our technique outperforms the existing ones with respect to the I/O cost of flash memory.

Design of Test Pattern Generator and Signature Analyzer for Built-In Pseudoexhaustive Test of Sequential Circuits (순서회로의 Built-In Pseudoexhaustive Test을 위한 테스트 패턴 생성기 및 응답 분석기의 설계)

  • Kim, Yeon-Suk
    • The Transactions of the Korea Information Processing Society
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    • v.1 no.2
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    • pp.272-278
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    • 1994
  • The paper proposes a test pattern generator and a signature analyzer for pseudoexhaustive testing of the combinational circuit part within a sequential circuit when performing built-in self test of the circuit. The test pattern generator can scan in the seed test pattern and generate exhaustive test patterns. The signature analyzer can perform the analysis of the circuit response and scan out the result. Such test pattern generator and signature analyzer have been developed using SRL(shift register latch) and LFSR(linear feedback shift register).

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