• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 1997.11a
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• pp.339-342
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• 1997

The optical properties of WO$_3$thin films deposited by RF magnetron reactive sputtering were studied. The substrate was an ITO(indium-tin-oxide) glass(100$\Omega$/ ). The optical properties are examined by different deposition conditions. RF power, substrate temperature, $O_2$concentraction. Ar flow rate, working pressure and thickness are 40~60W, 25~30$0^{\circ}C$, 10%, 54~72sccm, 5~20m7orr and 1200~2400$\AA$, respectively. All these films were colorless, light yellow and found to be amorphous in structure by X-ray diffraction analysis. When RF power, substrate temperature, $O_2$concentraction, Ar flow rate, working pressure and thickness are 40W, $25^{\circ}C$, 10%, 72sccm, 20mTorr and 2400$\AA$, respectively the values of transmittance of the WO$_3$thin films in visible region are about 80%.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2008.11a
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• pp.53-53
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• 2008

기존의 Al 합금 소재의 단점을 보완한 Al-Mg 합금 소재를 이용해 다이캐스팅으로 만들어진 핸드폰 케이스에 적용하고자 titanium 타겟을 사용한 반응성 스퍼터링 공정을 연구하였다. 코팅특성은 스펙트로포토 미터를 이용하여 색상분석을 하였고, 미세표면이미지는 FE-SEM을 이용하였다. DC 마그네트론 스퍼터링에 의한 착색코팅은 산소유량이 많은 경우 밝기 L*값이 더 커졌다. 색상의 편차와 재현성을 나타내주는 ${\Delta}E^*ab$ 값을 비교해보면, 모든 경우 ${\Delta}E^*ab^*$<1로 매우 우수한 색상균일성을 보여준다. FE-SEM에 의한 표면이미지는 전반적으로 산소유량이 많은 0.8SCCM에서 코팅한 경우보다 산소유량이 적은 0.375SCCM에서 코팅한 경우가 결정립계의 구별이 확실하고 결정립 모양이 선명하고 결정립크기도 증가함을 확인할 수 있다.

• Proceedings of the Korean Vacuum Society Conference
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• 2010.02a
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• pp.182-182
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• 2010

본 연구에서는 Pt 배면전극에 다양한 조건에서의 ZnO를 성장하여 Schottky 구조를 제작, 접합 특성 및 자외선 검출 특성을 연구하였다. $Al_2O_3$ 기판에 Mirror-like하며 고결정성을 갖는 Pt(111) 배면전극을 형성 후, ZnO 박막의 성장 조건에 따른 접합 특성을 확인하기 위하여 기판온도와 산소분압을 각각 $400{\sim}600^{\circ}C$ ($50^{\circ}C$ 단계), 0~60 sccm (15 sccm 단계)로 성장하였다. 이에 따른 구조적 특성변화를 확인하기 위하여 주사전자현미경 및 X선 회절 특성을 분석하였으며, 전류-전압 특성 곡선을 분석을 통하여 최적의 Schottky contact 형성을 위한 ZnO 성장조건을 규명하고자 하였다. $H_2O_2$를 이용한 표면처리와 Rapid Thermal Annealing (RTA)를 이용한 열처리 과정을 통하여 표면 처리 전 후의 전기적 특성과 광학적 특성의 변화를 비교 분석하였다. 또한 Ohmic 접촉으로 상부전극을 형성, ZnO Schottky photodiode 구조를 제작하여 UV-A, B, C 영역에 따른 UV반응 특성을 분석하였다.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2004.11a
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• pp.547-550
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• 2004

Indium tin oxide(ITO) films were prepared as a function of varying the proportion of oxygen$[0{\sim}1.0sccm]$ at fixed he gas[20sccm] by facing targets sputtering(FTS) system. Then electrical and optical properties of ITO thin films were estimated by Hall effect measurement system and UV/VIS-spectrometer. In the result, at very little oxygen rate, we can prepare a low resistivity ITO thin film of $3.40{\times}10^{-4}[\Omega{\cdot}cm]$ and transmittance of over 80%. So we noticed that the ITO thin film with low resistivity and high transmittance was prepared by FTS at room temperature.

• Journal of Integrative Natural Science
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• v.11 no.4
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• pp.209-211
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• 2018

A zinc oxide thin film doped with aluminum was deposited by RF sputtering. The deposition temperature of the sputter chamber was kept constant at $350^{\circ}C$, the power supplied to the chamber was 75 W, the oxygen flow rate was changed to 10 sccm and 20 sccm, and the thin film deposition time was changed to 120 and 180 minutes. The structures of the deposited zinc oxide thin films were analyzed by van der Waals method using an X-ray diffractometer. As a result of X-ray diffraction, the amount of oxygen supplied to the zinc oxide thin film increased, and the surface growth of the (002), (400), (110), and (103) planes showed a change with increasing deposition time. Moreover, as the amount of oxygen supplied to the zinc oxide thin film increased, their shape was observed to be coarse, and the thin film' s particles shape was correlated with the oxygen chemical defect introduced.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.23 no.8
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• pp.651-654
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• 2010

This paper describes the thermal and mechanical properties of doped thin film 3C-SiC and porous 3C-SiC. In this work, the in-situ doped thin film 3C-SiC was deposited by using atmospheric pressure chemical vapor deposition (APCVD) method at $120^{\circ}C$ using single-precursor hexamethyildisilane: $Si_2(CH_3)_6$ (HMDS) as Si and C precursors. 0~40 sccm $N_2$ gas was used as doping source. After growing of doped thin film 3C-SiC, porous structure was achieved by anodization process with 380 nm UV-LED. Anodization time and current density were fixed at 60 sec and 7.1 mA/$cm^2$, respectively. The thermal and mechanical properties of the $N_2$ doped porous 3C-SiC was measured by temperature coefficient of resistance (TCR) and nano-indentation, respectively. In the case of 0 sccm, the variations of TCR of thin film and porous 3C-SiC are similar, but TCR conversely changed with increase of $N_2$ flow rate. Maximum young's modulus and hardness of porous 3C-SiC films were measured to be 276 GPa and 32 Gpa at 0 sccm $N_2$, respectively.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2009.11a
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• pp.26-26
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• 2009

Vertically aligned arrays of mm-long multi-walled carbon nanotubes (MWCNTs) on Si substrates have been synthesized by water-assisted thermal chemical vapor deposition (CVD). The growth of CNTs was investigated by changing the experimental parameters such as growth temperature, growth time, gas composition, annealing time, catalyst thickness, and Al underlayer thickness. The 0.5-nm-thick Fe served as catalyst, underneath which Al was coated as a catalyst support as well as a diffusion barrier on the Si substrate. We grew CNTs by adding a little amount of water vapor to enhance the activity and the lifetime of the catalyst. Al was very good at producing the nm-size catalyst particles by preventing "Ostwald ripening". The Al underlayer was varied over the range of 15~40 nm in thickness. The optimum conditions for the synthesis parameters were as follows: pressure of 95 torr, growth temperature of $815^{\circ}C$, growth for 30 min, 60 sccm Ar + 60 sccm $H_2$ + 20 sccm $C_2H_2$. The water vapor also had a great effect on the growth of CNTs. CNTs grew 5.03 mm long for 30 min with the water vapor added while CNTs were 1.73 mm long without water vapor at the same condition. As-grown CNTs were characterized by using scanning electron microscopy (SEM), high resolution transmission electron microscopy (HRTEM), and Raman spectroscopy. High-resolution transmission electron microscopy showed that the as-grown CNTs were of ~3 graphitic walls and ~6.6 nm in diameter.

• Proceedings of the Korean Vacuum Society Conference
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• 2012.08a
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• pp.302-302
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• 2012

본 연구에서는 아크 소스를 이용하여 TiAlN을 코팅하였으며 공정 변수 중 질소 유량에 다른 TiAlN 박막의 물성 변화를 관찰하였다. TiAlN은 고경도 난삭재의 고능률 절삭 분야에 사용되어 공구의 수명을 향상하기 위한 표면처리 소재로 각광을 받고 있다. TiAlN 박막은 아크 소스에 장착된 TiAlN 타겟(Ti-50 at %Al)을 사용하여 스테인리스 강판 위에 코팅 하였으며 이 때 기판과 타겟 간의 거리는 약 30 cm이었다. 기판을 진공용기에 장착하고 ${\sim}10^{-6}$ torr까지 진공배기를 실시한 후 아르곤 가스를 진공용기 내로 공급하여 공정 압력인 $7{\times}10^{-4}$ torr로 제어한다. 공정 압력에서 아크 소스에 약 70 A의 전류를 인가하여 아크를 발생시키고 기판 홀더에 약 -400 V의 직류전압을 인가하여 약 5분간 청정을 실시하였다. 기판의 청정이 끝나면 기판에 인가된 전압을 차단하고 질소 가스를 진공용기에 공급하여 TiAlN을 코팅하였다. 질소 유량이 30 sccm일 경우 TiAlN 박막의 경도가 약 2510 Hv로 가장 높았으며, 질소의 유량이 40 sccm 이상으로 증가할 경우 TiAlN 박막의 경도는 1500 Hv로 주목할 만한 변화는 없었다. 질소 유량이 증가하면 TiAlN 박막의 색상은 회색에서 어두운 보라색으로 변화하였고 주사전자현미경 분석을 통해서 거대 입자(macro particle)가 감소하는 경향을 확인할 수 있었으며 이는 질소 유량이 증가할수록 TiAlN 박막의 표면조도 또한 증가하는 분석결과와 일치하였다. X-선 회절 분석을 통해 질소 유량이 30 sccm 이상에서 박막의 질화가 일어나고 2500 Hv 이상의 경도를 가지는 최적 조건임을 확인하였으며, 이는 절삭 공구 등과 같이 고경도 유지를 위한 코팅 분야에 적용이 가능할 것으로 판단된다. 본 연구에서 얻어진 결과를 바탕으로 질소 유량 외에 다른 공정 조건을 변화시켜 TiAlN 코팅을 실시한다면 다양한 색상 구현, 고경도, 내마모성 등 TiAlN 박막의 기능성을 향상할 수 있을 것으로 예상된다.

• Transactions on Electrical and Electronic Materials
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• v.10 no.4
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• pp.131-134
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• 2009

The electrical properties and the microstructure of nitrogen-doped poly 3C-SiC films used for micro thermal sensors were studied according to different thicknesses. Poly 3C-SiC films were deposited by LPCVD (low pressure chemical vapor deposition) at $900^{\circ}C$ with a pressure of 4 torr using $SiH_2Cl_2$ (100%, 35 sccm) and $C_2H_2$ (5% in $H_2$, 180 sccm) as the Si and C precursors, and $NH_3$ (5% in $H_2$, 64 sccm) as the dopant source gas. The resistivity of the poly SiC films with a 1,530 ${\AA}$ thickness was 32.7 ${\Omega}-cm$ and decreased to 0.0129 ${\Omega}-cm$ at 16,963 ${\AA}$. The measurement of the resistance variations at different thicknesses were carried out within the $25^{\circ}C$ to $350^{\circ}C$ temperature range. While the size of the resistance variation decreased when the films thickness increased, the linearity of the resistance variation improved. Micro heaters and RTD sensors were fabricated on a $Si_3N_4$ membrane by using poly 3C-SiC with a 1um thickness using a surface MEMS process. The heating temperature of the SiC micro heater, fabricated on 250 ${\mu}m$${\times}$250 ${\mu}m$ $Si_3N_4$ membrane was $410^{\circ}C$ at an 80 mW input power. These 3C-SiC heaters and RTD sensors, fabricated by surface MEMS, have a low power consumption and deliver a good long term stability for the various thermal sensors requiring thermal stability.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2009.06a
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• pp.135-136
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• 2009

The etching characteristics of Zinc Oxide (ZnO) and etch selectivity of ZnO to $SiO_2$ in $BCl_3/Ar/Cl_2$ plasma were investigated. It was found that ZnO etch rate shows a non-monotonic behavior with increasing both Ar fraction in $BCl_3$ plasma, RF power, and gas pressure. The maximum ZnO etch rate of 53 nm/min was obtained for $BCl_3$(16 sccm)/Ar(4 sccm)/$Cl_2$(3 sccm) gas mixture. The chemical state of etched surfaces was investigated with X-ray photoelectron spectroscopy (XPS). From these data, the suggestions on the ZnO etch mechanism were made.