• Title/Summary/Keyword: scanning microscopy

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Teliospore mucilage of Puccinia miscanthi revealed through the axial imaging of secondary electrons

  • Ki Woo Kim
    • Applied Microscopy
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    • v.51
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    • pp.15.1-15.2
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    • 2021
  • Puccinia miscanthi teliospores were observed on the leaf surface of Miscanthus sinensis using a field emission scanning electron microscope. Details of teliospore mucilage could be visualized through the axial imaging of secondary electrons for a better understanding of pathogen behavior in rust diseases.

Ambient Variable Pressure Field Emission Scanning Electron Microscopy for Trichome Profiling of Plectranthus tomentosa by Secondary Electron Imaging

  • Kim, Ki Woo
    • Applied Microscopy
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    • v.43 no.1
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    • pp.34-39
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    • 2013
  • Glandular and nonglandular trichomes on the leaf surface of Plectranthus tomentosa were investigated by variable pressure field emission scanning electron microscopy (VP-FESEM). The segments of the plant's leaves were directly mounted without any specimen preparation, and examined at ambient temperature using a variable pressure secondary electron (SE) detector under ca. 15 Pa. Foliar trichomes maintained their shapes and structures without severe surface collapse or charging. The adaxial leaf surface was abundantly covered with different types of trichome. Nonglandular trichomes consisted of a basal cell and a long (up to ca. $300{\mu}m$) stalk. Meanwhile, capitate glandular trichomes had a secretory head and a short or long stalk. Peltate glandular trichomes with globose secretory heads were observed in close contact with the leaf epidermis. Spherical projections on the secretory head showed the secretion process of glandular trichomes. In addition to the trichomes, oval stomata were distributed on the abaxial leaf surface. These results suggest that ambient VP-FESEM can be used to classify the dehydration-sensitive foliar trichomes of succulent plants by SE imaging. At the FESEM resolution, this approach facilitates the rapid and detailed morphological analysis of a variety of trichomes in diverse plant taxa with reduced labor and preparation.

Property of molecular beam epitaxy-grown ZnSe/GaAs (분자선 에피성장법으로 성장된 ZnSe/GaAs의 특성)

  • Kim, Eun-Do;Son, Young-Ho;Cho, Seong-Jin;Hwang, Do-Weon
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.17 no.2
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    • pp.52-56
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    • 2007
  • We have installed an ultra high vacuum (UHV) molecular beam epitaxy (MBE) system and investigated into the characteristics of MBE-grown ZnSe/GaAs [001] using scanning electron microscopy (SEM), atomic force microscopy (AFM), we confirmed that layer's surface was dense and uniform of molecular layer. We used x-ray diffractometer (XRD) and confirmed two peaks correspond to GaAs [001] substrate and ZnSe epilayer, respectively. We observed photoluminescence (PL) peak approximately at 437 nm and measured PL mapping of 2 inch ZnSe epilayer.

The Electrical Characterization of Magnetic Tunneling Junction Cells Using Conductive Atomic Force Microscopy with an External Magnetic Field Generator

  • Heo, Jin-Hee
    • Transactions on Electrical and Electronic Materials
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    • v.11 no.6
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    • pp.271-274
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    • 2010
  • We examined the tunneling current behaviors of magnetic tunneling junction (MTJ) cells utilizing conductive atomic force microscopy (AFM) interfaced with an external magnetic field generator. By introducing current through coils, a magnetic field was generated and then controlled by a current feedback circuit. This enabled the characterization of the tunneling current under various magnetic fields. The current-voltage (I-V) property was measured using a contact mode AFM with a metal coated conducting cantilever at a specific magnetic field intensity. The obtained magnetoresistance (MR) ratios of the MTJ cells were about 21% with no variation seen from the different sized MTJ cells; the value of resistance $\times$ area (RA) were 8.5 K-12.5 K $({\Omega}{\mu}m^2)$. Since scanning probe microscopy (SPM) performs an I-V behavior analysis of ultra small size without an extra electrode, we believe that this novel characterization method utilizing an SPM will give a great benefit in characterizing MTJ cells. This novel method gives us the possibility to measure the electrical properties of ultra small MTJ cells, namely below $0.1\;{\mu}m\;{\times}\;0.1\;{\mu}m$.