• Proceedings of the Korean Society of Precision Engineering Conference
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• 2006.10a
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• pp.507-508
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• 2006

• 한국초전도학회:학술대회논문집
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• v.14
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• pp.59-59
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• 2004

• Proceedings of the Optical Society of Korea Conference
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• 2001.02a
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• pp.122-123
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• 2001

본 연구에서는 주사 근접장 광학 현미경(Near-field Scanning Optical Microscope, 이하 NSOM이라 한다)을 이용하여 빛이 전파되고 있는 광 도파로 주변에 형성되는 evanescent field를 측정함으로써 광도파로 내부에서의 빛의 전파특성을 알아보았다. 광소자의 설계에 있어서 광도파로 내부에서의 빛이 어떻게 전파되어지는 가는 매우 중요한 인자가 된다. (중략)

• Journal of the Korean Chemical Society
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• v.55 no.6
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• pp.1074-1077
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• 2011

• Proceedings of the Materials Research Society of Korea Conference
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• 2004.05a
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• pp.51-51
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• 2004

• Applied Microscopy
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• v.51
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• pp.1.1-1.2
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• 2021

We demonstrate a fabrication of an atomically controlled single-crystal heart-shaped nanostructure using a convergent electron beam in a scanning transmission electron microscope. The delicately controlled e-beam enable epitaxial crystallization of perovskite oxide LaAlO₃ grown out of the relative conductive interface (i.e. 2 dimensional electron gas) between amorphous LaAlO₃/crystalline SrTiO₃.

• Journal of the Korean institute of surface engineering
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• v.29 no.5
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• pp.314-324
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• 1996

Scanning probe microscopes (SPMs) such as the scanning tunneling microscope (STM) and the atomic force microscope (AFM) were used for surface modification tools at the nanometer scale. Material surfaces, i. e., titanium, hydrogen-terminated silicon and trimethylsilyl organosilane monolayer on silicon, were locally oxidized with the best lateral spatial resolution of 20nm. The principle behind this proximal probe oxidation method is scanning probe anodization, that is, the SPM tip-sample junction connected through a water column acting as a minute electrochemical cell. An SPM-nanolithogrphy process was demonstrated using the organosilane monolayer as a resist. Area-selective chemical modifications, i. e., etching, electroless plating with gold, monolayer deposition and immobilization of latex nanoparticles; were achieved in nano-scale resolution. The area-selectivity was based on the differences in chemical properties between the SPM-modified and unmodified regions.

• Proceedings of the Korean Vacuum Society Conference
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• 2010.02a
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• pp.404-404
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• 2010

Despite much works have been done on the geometric structures of ripples, defects and edge atoms in a graphene device, there has been no report showing the direct correlation between the structures and the transport property. Unlike scanning tunneling microscopy or other electron microscopes, Scanning Gate Microscope (SGM) is a unique microscopic tool with which the local electronic structure and the transport property of a device can be measured simultaneously. We have performed a transport measurement in nanometer scale using a scanning gate microscope (SGM). We have found the nanoscopic pictures of electron and hole puddles and the role of graphene- device edges in the transport measurements. These experimental findings were successfully explained with a theoretical model.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.11 no.11
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• pp.4095-4099
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• 2010

Nano-measurement systems such as scanning probe microscopes should be protected against external disturbances. For the design of a scanning probe microscope, the external vibrations need to be characterized and the vibrational properties of the structural frame itself should be modeled. Also, the influences of the external vibration on the apparatus need to be known for its utmost precision. In this paper, the combined vibrational-characteristics of the floor and the structural frame are analyzed and experimentally investigated.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2007.11a
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• pp.483-484
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• 2007