• Korean Journal Plant Pathology
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• v.1 no.1
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• pp.51-55
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• 1985

This study was carried out to observe the propagule of Fusarium moniliforme on the surface of rice seed and in the vascular bundle of rice stem by scanning electron microscope. Spore and mycelium of F. moniliforme were observed on the surface of rice seed and in the vascular bundle of rice stem. After seed treatment with Benlate T and Busan 3D, F. moniliforme was not isolated from chaffs, but frequently from brown rice, irrespective of disinfection period.

• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 2004.04a
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• pp.513-517
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• 2004

The nature of the signals collected by an SEM(Scanning Electron Microscope) in order to form images are all dependent on the detector used to collect them, and the quality of an acquired image is strongly influenced by detector performance. Therefore, the development of detector with high performance is very important in pulling up the resolution of SEM. In this article, electron beam-specimen interactions, the detection principle of secondary electrons and backscattered electrons, and the structure of a conventional detector are described. The structure of an experimental apparatus for the future study on our hopeful novel electron detector is presented as well.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2005.06a
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• pp.1875-1878
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• 2005

It is not efficient and scarcely out of the question to use commercial expensive electron beam lithography system widely used for semiconductor fabrication process for the manufacturing application field of various devices in the small business scope. Then scanning electron microscope based electron beam machining system is maybe regarded as a powerful model can be used for it simply. To get a complete suite of thus proper system, column unit build up with electron beam gun head unit is necessarily required more than anything else to modify scanning electron microscope. In this study, various components included ceramic isolation plate and main body which are essentially constructed for electron beam gun head unit are designed and manufactured. And this electron beam gun head unit will be used for next connected study in the development step of scanning electron microscope based electron beam machining system.

• Proceedings of the Korean Geotechical Society Conference
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• 2010.09a
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• pp.379-391
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• 2010

In order to understand the mechanism of cementation of soft soils treated with bacteria, three types of specimens(untreated, normal bacteria concentration treated, and high bacteria concentration treated) were made. Scanning Electron Microscope(SEM), EDX and X-ray diffraction(XRD) analyses were performed on the soft silt and loose sand specimens. Compared with the untreated specimen, a clearer cementation between particles was observed in the high bacteria concentration treated specimen. Based on the scanning electron microscope(SEM) EDX analyses, more calcium carbonate was observed in the specimen treated with high bacteria concentration than other specimens. On the basis of the preliminary results, it appears that microbial cementation can occur in the soft soil. Further study on the cementation of soils using bacteria is necessary to validate this result.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2004.10a
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• pp.1017-1020
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• 2004

It is not efficient and scarcely out of the question to use commercial expensive electron beam lithography system widely used for semiconductor fabrication process for the manufacturing application field of various devices in the small business scope. Then scanning electron microscope based electron beam machining system is maybe regarded as a powerful model can be used for it simply. To get a complete suite of thus proper system, column unit build up with several electo-magnetic lens is necessarily required more than anything else to modify scanning electron microscope. In this study, various components included several electro-magnetic lens and main body which are essentially constructed for column unit are designed and manufactured. And this established column unit will be used for next connected study in the development step of scanning electron microscope based electron beam machining system.

• Transactions of the Korean Society for Noise and Vibration Engineering
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• v.15 no.6 s.99
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• pp.667-673
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• 2005

This paper shows a method for design of the nano-positioning planar scanner used in the scanning probe microscope. The planar scanner is composed of flexure guides, piezoelectric actuators and feedback sensors. In the design of flexure guides, the Castigliano's theorem was used to find the stiffness of the guide. The motion amplifying mechanism was used in the piezoelectric actuator to achieve a large travel range. We found theoretically the travel range of the total system and verified using the commercial FEM(finite element method) program. The maximum travel range of the planar scanner is above than 140 $\mu$m. The 3 axis positioning capability was verified by the mode analysis using the FEM program.

• Proceedings of the KIEE Conference
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• 1987.07b
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• pp.1591-1594
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• 1987

The Scanning Acoustic Microscope(SAM) is an image device which can display the small opaque material or the interior of solid. This paper showed the design of the acoustic lens which is an important factor of the Scanning Acoustic Microscope, and analyzed the performance of the acoustic lens. Finally, I experimented the image processing of the interior of solid through the Scanning Acoustic Microscope and the change of the acoustic image (resolution,contrast) by the change of F/number.

• Proceedings of the Korean Society for Technology of Plasticity Conference
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• 2006.05a
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• pp.234-238
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• 2006

In this research, an analysis of damaged instance and forming fault for disc part in automotive steel wheel was performed. Rolled steel material, which had been used in the manufacturing of the damaged disc part, was prepared for tensile test, quantitative analysis of chemical component and acquirement of scanning electron microscope images. Although the results of mechanical properties and chemical component ratio for the material satisfied the suggested specification, some material inherent problem was found in the scanning electron microscope images. Finally, in an analysis of chemical component for the damaged disc part used in road condition, mismatching of chemical component ratio between the suggested specification and test result was found.

• Korean Journal of Optics and Photonics
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• v.14 no.1
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• pp.80-84
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• 2003

We have constructed a scanning confocal microscope by directly oscillating an optical fiber in two different ways. Either a piezoelectric transducer or a tuning fork was used for the oscillation. Six frames of $640{\times}480$ pixel image were obtained in a second with piezoelectric oscillation and only one image of the same size was obtained in a second with tuning fork oscillation. Oscillation of optical fiber did not cause amy distortion of confocal images.

• Proceedings of the KIEE Conference
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• 2006.04a
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• pp.96-98
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• 2006

A new ex-situ model to diagnose a plasma processing equipment was presented. The model was constructed by combining wavelet, scanning electron microscope, ex-situ measurement of etching profile, and neural network. The diagnosis technique was applied to a tungsten etching process, conducted in a $SF_6$ helicon plasma. The wavelet was used to characterize detailed variations of plasma-etched surface. The diagnosis model was constructed with the vertical wavelet component. For comparison, a conventional model was built by using the estimated profile data. Compared to the conventional model, the wavelet-based model, demonstrated a much improved diagnosis.