• Journal of Korean Society of Industrial and Systems Engineering
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• v.46 no.2
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• pp.1-12
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• 2023

To make semiconductor chips, a number of complex semiconductor manufacturing processes are required. Semiconductor chips that have undergone complex processes are subjected to EDS(Electrical Die Sorting) tests to check product quality, and a wafer bin map reflecting the information about the normal and defective chips is created. Defective chips found in the wafer bin map form various patterns, which are called defective patterns, and the defective patterns are a very important clue in determining the cause of defects in the process and design of semiconductors. Therefore, it is desired to automatically and quickly detect defective patterns in the field, and various methods have been proposed to detect defective patterns. Existing methods have considered simple, complex, and new defect patterns, but they had the disadvantage of being unable to provide field engineers the evidence of classification results through deep learning. It is necessary to supplement this and provide detailed information on the size, location, and patterns of the defects. In this paper, we propose an anomaly detection framework that can be explained through FCDD(Fully Convolutional Data Description) trained only with normal data to provide field engineers with details such as detection results of abnormal defect patterns, defect size, and location of defect patterns on wafer bin map. The results are analyzed using open dataset, providing prominent results of the proposed anomaly detection framework.

• KSII Transactions on Internet and Information Systems (TIIS)
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• v.18 no.8
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• pp.2199-2213
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• 2024

To enhance the quality of defect detection for Printed Circuit Board Assembly (PCBA) during electronic product manufacturing, this study primarily focuses on optimizing the YOLOv7-based method for PCBA defect detection. In this method, the Mish, a smoother function, replaces the Leaky ReLU activation function of YOLOv7, effectively expanding the network's information processing capabilities. Concurrently, a Squeeze-and-Excitation attention mechanism (SEAM) has been integrated into the head of the model, significantly augmenting the precision of small target defect detection. Additionally, considering angular loss, compared to the CIoU loss function in YOLOv7, the SIoU loss function in the paper enhances robustness and training speed and optimizes inference accuracy. In terms of data preprocessing, this study has devised a brightness adjustment data enhancement technique based on split-filtering to enrich the dataset while minimizing the impact of noise and lighting on images. The experimental results under identical training conditions demonstrate that our model exhibits a 9.9% increase in mAP value and an FPS increase to 164 compared to the YOLOv7. These indicate that the method proposed has a superior performance in PCBA defect detection and has a specific application value.

• Journal of Korean Society for Quality Management
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• v.31 no.1
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• pp.62-75
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• 2003

The PL(Product Liability) Law has been going into effect in Korea since July 2002. Accordingly, a company's responsibility for customers who are damaged by the defect in the product safety has been gradually strict and imposed burden on management. This paper gives suggestions as to PL prevention of manufacturing companies through the case research of PL prevention strategies and the prevention systems of the domestic S-company.

• Proceedings of the Society of Korea Industrial and System Engineering Conference
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• 2002.05a
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• pp.31-36
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• 2002

Product Liability(PL) is a legal policy to deal with global competition by improving domestic industrial competitive power and to reduce the cost of defect products. The purpose of this paper is to address the state of the art solutions to dispute on PL, in reality of a frequent occurrence of global product exchange focussing on product safety that is one of the most important functions of PL and to improve solution of the product safety and reliability responsive to PL. To minimize PL exposure, manufacturers should reflect comprehensive product safety and reliability concepts in establishing PL prevention policies. PL prevention policies are composed of administration system, product safety management system, and total quality management system in respect of prevention, safety, and defence.

• Journal of the Korea Safety Management & Science
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• v.10 no.3
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• pp.99-107
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• 2008

Product liability(PL) is the producer's compensation to customers for damage incurred by product defects. This paper studies on the organizational culture, promotion process, system construction, system level, product safety review, product safety assurance, system operation, and its effectiveness and necessity of recognition for the PL system of small and medium-sized firms in Gangwon-Do province. The results show that the firms have product safety regulations, but the number of firms which its employees understand the regulations is less than the number of firms which do not understand. Also the number of firms which is preparing PL prevention and insurance, and counterplan for accidents seems to be not in large numbers.

• Journal of the Korean Institute of Telematics and Electronics
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• v.24 no.3
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• pp.527-534
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• 1987

This paper proposes a new syndrome-testable design method for large MOSPLA's. In the conventional syndrome test method, the testing array circuit for testability is added but it has the defect that the circuit gives effect on the normal operation of the basic PLA circuit. Therefore, by adding the shift registers to the product lines of the basic MOSPLA's this defect is eliminated and the number of test patterns is decreased. In order to reduce the number of fault free syndromes to be predetermined, also, one output line, which is connected to all product lines is added. Therefore the number of output lines be observed is decreased. And the analytical method to compute fault free syndromes is presented. By unsing this method, the time and the effort to compute the syndromes are decreased.

• 제어로봇시스템학회:학술대회논문집
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• 2001.10a
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• pp.101.6-101
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• 2001

This paper deals with inspect algorithm using visual system. One of the major problems that arise during polymer production is the estimation of the noise of the product(bad pallets). An erroneous output can cause a lot of losses (production and financial losses). Therefore new methods for real-time inspection of the noise are demanded. For this reason, we have presented a development of vision system algorithm for the defect inspection of PE pallets. First of all, in order to detect the edge of object, the differential filter is used. And we apply to the labeling algorithm for feature extraction. This algorithm is designed for the defect inspection of pallets ...

• Journal of the Korea Institute of Information and Communication Engineering
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• v.19 no.7
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• pp.1737-1742
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• 2015

In the industrial field for product inspection needs not only on the surface of the product but also the internal components defect inspection. Generally, optical inspection is mainly used for item inspection from production process. However, this is only to check defect of surface it is difficult to perform inspection of goods internal. To overcome these limitations, Instead of optical device by using the portable X- ray DR image acquisition device system developed to obtain an image in real time at the same time and determine product defects. After obtaining the X- ray image, the inspection product within error range is passed after machine image processing. Also, the results and numbers are stored by users.

• Journal of Institute of Control, Robotics and Systems
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• v.6 no.2
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• pp.207-216
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• 2000

This paper introduces an effective system design method to develop a customer oriented product using a design optimization process and to select a set of critical design paramenters,. The process results in the development of a successful product satisfying customer needs and reducing development risk. The proposed scheme adopted a five step QFD(Quality Function Deployment) in order to extract design parameters from customer needs and evaluated their priority using risk factors for extracted design parameters. In this process we determine critical design parameters and allocate them to subsystem designers. Subsequently design engineers develop and test the product based on these parameters. These design parameters capture the characteristics of customer needs in terms of performance cost and schedule in the process of QFD, The subsequent risk management task ensures the minimum risk approach in the presence of design parameter uncertainty. An application of this approach was demonstrated in the development of weld quality monitoring system. Dominant design parameters affect linearity characteristics of weld defect feature vectors. Therefore it simplifies the algorithm for adopting pattern classification of feature vectors and improves the accuracy of recognition rate of weld defect and the real time response of the defect detection in the performance. Additionally the development cost decreases by using DSP board for low speed because of reducing CPU's load adopting algorithm in classifying weld defects. It also reduces the cost by using the single sensor to measure weld defects. Furthermore the synergy effect derived from the critical design parameters improves the detection rate of weld defects by 15% when compared with the implementation using the non-critical design parameters. It also result in 30% saving in development cost./ The overall results are close to 95% customer level showing the effectiveness of the proposed development approach.

• The Journal of Information Systems
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• v.32 no.4
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• pp.149-162
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• 2023

Purpose In the textile industry, fabric defects significantly impact product quality and consumer satisfaction. This research seeks to enhance defect detection by developing a transformer-based deep learning image segmentation model for learning high-dimensional image features, overcoming the limitations of traditional image classification methods. Design/methodology/approach This study utilizes the ZJU-Leaper dataset to develop a model for detecting defects in fabrics. The ZJU-Leaper dataset includes defects such as presses, stains, warps, and scratches across various fabric patterns. The dataset was built using the defect labeling and image files from ZJU-Leaper, and experiments were conducted with deep learning image segmentation models including Deeplabv3, SegformerB0, SegformerB1, and Dinov2. Findings The experimental results of this study indicate that the SegformerB1 model achieved the highest performance with an mIOU of 83.61% and a Pixel F1 Score of 81.84%. The SegformerB1 model excelled in sensitivity for detecting fabric defect areas compared to other models. Detailed analysis of its inferences showed accurate predictions of diverse defects, such as stains and fine scratches, within intricated fabric designs.