• Title/Summary/Keyword: probe

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Non-contact critical current measurement of superconducting coated conductor using Hall Probe (Hall Probe를 이용한 초전도선재의 비접촉 임계전류 측정 방법)

  • Kim, Ho-Sup;Oh, Sang-Soo;Lee, Nam-Jin;Ha, Dong-Woo;Baik, Seung-Kyu;Ko, Rock-Kil;Ha, Hong-Soo
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2010.03b
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    • pp.12-12
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    • 2010
  • The hall probe measurement system was used to measure the critical current distribution of superconducting coated conductor. The system consists of reel to reel moving apparatus, 7 array hall probe, a rotary encoder and permanent magnet. The magnetic field profile across the width of superconducting coated conductor using Bean's critical state model was calculated. The effect of various parameters of the formulas on the magnetic field distribution and the effect of shape and size of artificial defects, which were formed on the surface of SmBa2Cu3O7-d(SmBCO) coated conductor using laser marking system, on the hall probe magnetic field signal of the hall probe measurement system was investigated.

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Full angle range pressure coefficient maps of five-hole probe and new calibration coefficients (5공프로브의 전 각도 범위 압력계수 지도와 새로운 보정계수)

  • Kim, Jin-Gwon;Gang, Sin-Hyeong
    • Transactions of the Korean Society of Mechanical Engineers B
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    • v.21 no.11
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    • pp.1437-1448
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    • 1997
  • Pressures of a five-hole probe were measured for a full range of yaw and pitch angles and complete pressure coefficient maps were obtained. Based on these maps, various features of five-hole probe pressures were revealed and new five-hole probe calibration coefficients were devised. The new calibration coefficients show non-diverging characteristics for any flow direction and one-to-one correspondence for a wide range of flow angles. These calibration coefficients expand the valid flow angle range of five-hole probe calibration by .+-.10 degrees and complement a critical defect of five-hole probe zone-division calibration method which has not been known yet. Moreover new non-diverging calibration coefficients have advantages in nulling methods, too.

A Probe Design Method for DNA Microarrays Using ${\epsilon}$-Multiobjetive Evolutionary Algorithms (${\epsilon}$-다중목적 진화연산을 이용한 DNA Microarray Probe 설계)

  • Cho Young-Min;Shin Soo-Yong;Lee In-Hee;Zhang Byoung-Tak
    • Proceedings of the Korean Information Science Society Conference
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    • 2006.06a
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    • pp.82-84
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    • 2006
  • 최근의 생물학적인 연구에 DNA microarray가 널리 쓰이고 있기 때문에, 이러한 DNA microarray를 구성하는데 필요한 probe design 작업의 중요성이 점차 커져가고 있다. 이 논문에서는 probe design 문제를 thermodynamic fitness function이 2개인 multi-objective optimization 작업으로 변환한 뒤, ${\epsilon}$-multiobjective evolutionary algorithm을 이용하여 probe set을 찾는다. 또한, probe 탐색공간의 크기를 줄이기 위하여 각 DNA sequence의 primer 영역을 찾는 작업을 진행하며, 사용자가 직접 프로그램을 테스트할 수 있는 웹사이트를 제공한다. 실험 대상으로는 mycoides를 선택하였으며, 이 논문에서 제안된 방법을 사용하여 성공적으로 probe set을 발견할 수 있었다.

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Development of Experimental Apparatus For Measuring Thermal Conductivity by Transient Probe Method (과도탐침법에 의한 열전도계수 측정장치 개발)

  • 배신철;김명윤
    • Journal of Biosystems Engineering
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    • v.22 no.1
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    • pp.59-67
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    • 1997
  • An experimental apparatus was developed for the rapid determination of thermal conductivity by transient probe method. The theoretical basis for transient probe method has been investigated. The mathematical model for this method is the Carslaw and Jaeger model which is used perfect line source theory. The small needle probe which is equipped with thermocouple and heating element is constructed. A software that performs data analysis and acquisition is programmed. The influence of the power dissipated per unit length of the probe has been assessed for glycerin. The result showed no significant correlation between thermal conductivity and power input. Determination made with this experimental apparatus were found to agree well with the recommended thermal conductivity data.

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Numerical Modeling of Perturbation Effects of Electrostatic Probe into 2D ICP(inductively coupled plasma) (2D-ICP(inductively coupled plasma)에서 정전 탐침 삽입 시의 플라즈마 수치 계산)

  • Joo, Jung-Hoon
    • Journal of the Korean institute of surface engineering
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    • v.44 no.1
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    • pp.26-31
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    • 2011
  • Numerical modeling is used to investigate the perturbation of a single Langmuir probe (0.2 mm diameter shielded with 6 mm insulator) inserted along the center axis of a cylindrical inductively coupled plasma chamber filled with Ar at 10 mTorr and driven by 13 MHz. The probe was driven by a sine wave. When the probe tip is close to a substrate by 24.5 mm, the probe characteristics was unperturbed. At 10 mm above the substrate, the time averaged electric potential distribution around the tip was severly distorted making a normal probe analysis impossible.

Make Probe Head Module use of Wafer Pin Array Frame (Wafer Pin Array Frame을 이용한 Probe Head Module)

  • Lee, Jae-Ha
    • Proceedings of the Korean Institute of Surface Engineering Conference
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    • 2012.11a
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    • pp.71-71
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    • 2012
  • Memory 반도체 Test공정에서 사용되는 Probe Card의 Probing Area가 넓어지면서 종래에 사용되던 Cantilever제품의 사용이 불가능하게 되고, MEMS공정을 사용한 새로운 형태의 Advanced제품이 시장에 출현을 하였다. MEMS형의 제품은 다수의 Micro Spring을 MLC(Multi Layer Ceramic)위에 MEMS 공정을 사용하여 생성하는 방식으로서 MLC는 좁은 지역에 다수의 Pin을 생성 할 수 있는 공간을 만들어 주며, 또 다른 이유는 전기적 특성인 임피던스를 맞추고 다수의 Pin의 압력에 의하여 생기는 하중을 Ceramic기판으로 지탱하기 위한 목적도 있다. 이에 MLC와 같은 전기적 특성을 임피던스를 맞춘 RF-CPCB를 사용하여 작은 면적에 다수의 Pin접합이 가능한 방법을 마련한 후, 이 RF-PCB를 부착하여 Pin의 하중을 받는 Wafer와 유사한 열팽창을 갖는 Substrate를 사용하여 MLC를 대체하여 다양한 온도 조건에서 사용이 가능하며, 복잡하고 공정비가 많이 드는 MEMS 공정에 의한 일괄 Micro Spring 생성 공정을 전주 도금 또는 2D방식의 도금 Pin으로 대체하였으며, Probe Card의 중요한 물리적 특성인 Pin들의 정렬도를 마련하기 위해 Photo Process를 사용한 Wafer로 만든 Wafer Pin Array Frame을 사용하여 2D 제작 Pin을 일괄 또는 부분 접합이 가능한 방법으로 Probe Array Head를 제작하여 이들을 부착하여 Probe Array Head를 이전의 MEMS공정 방법에 비해 쉽고 빠르게 만들어 probe Card를 제작 할 수 있게 되었다.

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Characteristic Analysis and Design of PC Probe for Eddy Current Testing (와전류탐상을 위한 PC 프로브의 특성해석 및 설계)

  • Kim Yong Taek;Lee Hyang-beom
    • Proceedings of the KIEE Conference
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    • summer
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    • pp.965-967
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    • 2004
  • In this paper, characteristic analysis of PC(Pancake Coil) probe with the size variation is presented for eddy current testing. Characteristics of probe are numerically calculated by using the finite element method. From the numerical analysis, the optimum frequency and groups for an experiment are selected. Probes are made and experiment is performed. From the experimental results, the probe shows maximum sensitivity when the size of defect is equal to the size of probe and when the inside diameter is similar to the width of probe and when the height is low. The result can be helpful to the standard of design of PC probe for eddy current testing.

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Two-port probe for measuring the permittivity/permeability (유전율/투자율 측정을 위한 2-PORT PROBE)

  • Park, Sang-Bok;Lee, Jang-Soo;Cheon, Chang-Ul
    • Proceedings of the KIEE Conference
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    • 2006.07c
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    • pp.1747-1748
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    • 2006
  • 본 연구에서는 2-port probe를 설계, 제작하고, 이를 이용하여 유전율과 투자율을 동시에 측정해내는 기법을 연구하였다. 기존에는 유전율 측정을 위해 끝이 open되어 있는 1-port probe를 주로 이용하였지만 이는 유전율만이 측정이 가능하고 주파수 대역에 한계가 있었다. 2-port probe는 유전율과 투자율이 동시에 측정이 가능하며 주파수의 한계를 극복하였다. 2-port probe를 등가화 하여 이를 수식적으로 해석했을 경우 수많은 변수들이 발생되는데 이것을 여러 수치기법들을 이용하여 정리한 후, 유전율을 알고 있는 용액들을 이용하여 보정하였다. 또한 2-port probe에 약간의 길이 변화를 주어 주파수대역의 변화를 실험을 통해 비교 분석하였다.

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Gas Flow Rate Dependency of Etching Result: Use of VI Probe for Process Monitoring (가스 유량 변화에 따른 식각 공정 결과: VI Probe 활용 가능성 제안)

  • Song, Wan Soo;Hong, Sang Jeen
    • Journal of the Semiconductor & Display Technology
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    • v.20 no.3
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    • pp.27-31
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    • 2021
  • VI probe, which is one of various in-situ plasma monitoring sensor, is frequently used for in-situ process monitoring in mass production environment. In this paper, we correlated the plasma etch results with VI probe data with the small amount of gas flow rate changes to propose usefulness of the VI probe in real-time process monitoring. Several different sized contact holes were employed for the etch experiment, and the etched profiles were measured by scanning electron microscope (SEM). Although the shape of etched hole did not show satisfactory relationship with VI probe data, the chamber status changed along the incremental/decremental modification of the amount of gas flow was successfully observed in terms of impedance monitoring.

Development of an Optical Waveguide Loss Measuring System using an Rectangular Glass Probe

  • Choi, Young-Kyu
    • Journal of Sensor Science and Technology
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    • v.10 no.1
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    • pp.71-79
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    • 2001
  • The use of a glass-plate probe of rectangular shape is proposed for the measurement of transmission loss in optical waveguides. The light-collecting window is of a thin, rectangular shape and is perpendicular to the light streak, while the conventional fiberglass probe has a small circular face. This transversely elongated form results in a grate improvement of mechanical tolerance for the probe movement in the vortical as well as in the transverse direction. A theoretical investigation also presents a reasonable agreement with the experiments.

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