• 한국진공학회:학술대회논문집
• /
• 한국진공학회 2012년도 제42회 동계 정기 학술대회 초록집
• /
• pp.382-382
• /
• 2012

CIGS thin films have received great attention as a promising material for solar cells due to their high absorption coefficient, appropriate bandgap, long-term stability, and low cost production. CIGS thin films are deposited by various methods such as co-evaporation, sputtering, spray pyrolysis and electro-deposition. The deposition technique is one of the most important processes in preparing CIGS thin film solar cells. Among these methods, co-evaporation is one of the best technique for obtaining high quality and stoichiometric CIGS films. However, co-evaporation method is known to be unsuitable for commercialization. The sputtering is known to be very effective and feasible process for mass production. In this study, CIGS thin films have prepared by rf magnetron sputtering using a $Cu(In_{1-x}Ga_x)Se_2$ single quaternary target without post deposition selenization. This process has been examined by the effects of deposition parameters on the structural and compositional properties of the films. In addition, we will explore the influences of substrate temperature and additional annealing treatment after deposition on the characteristics of CIGS thin films. The thickness of CIGS films will be measured by Tencor-P1 profiler. The crystalline properties and surface morphology of the films will be analyzed using X-ray diffraction and scanning electron microscopy, respectively. The optical properties of the films will be determined by UV-Visible spectroscopy. Electrical properties of the films will be measured using van der Pauw geometry and Hall effect measurement at room temperature using indium ohmic contacts.

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 1998년도 춘계학술대회 논문집
• /
• pp.239-242
• /
• 1998

Ca $F_2$ films have superior gate insulator properties than conventional gate insulator such as $SiO_2$, Si $N_{x}$, $SiO_{x}$, and T $a_2$ $O_{5}$ to the side of lattice mismatch between Si substrate and interface trap charge density( $D_{it}$). Therefore, this material is enable to apply Thin Film Transistor(TFT) gate insulator. Most of gate oxide film have exhibited problems on high trap charge density, interface state in corporation with O-H bond created by mobile hydrogen and oxygen atom. This paper performed Ca $F_2$ property evaluation as MIM, MIS device fabrication. Ca $F_2$ films were deposited at the various substrate temperature using a thermal evaporation. Ca $F_2$ films was grown as polycrystalline film and showed grain size variation as a function of substrate temperature and RTA post-annealing treatment. C-V, I-V results exhibit almost low $D_{it}$(1.8$\times$10$^{11}$ $cm^{-1}$ /le $V^{-1}$ ) and higher $E_{br}$ (>0.87MV/cm) than reported that formerly. Structural analysis indicate that low $D_{it}$ and high $E_{br}$ were caused by low lattice mismatch(6%) and crystal growth direction. Ca $F_2$ as a gate insulator of TFT are presented in this paper paperaper

• 한국분말재료학회지
• /
• 제26권1호
• /
• pp.40-44
• /
• 2019

Tungsten trioxide ($WO_3$) is a promising candidate as a photocatalyst because of its outstanding electrical and optical properties. In this study, we prepare $WO_3$ thin films by electrodeposition and characterize the photocatalytic degradation of methylene blue using these films. Depending on the voltage conditions (static and pulse), compact and porous $WO_3$ films are fabricated on a transparent ITO/glass substrate. The morphology and crystal structure of electrodeposited $WO_3$ thin films are investigated by scanning electron microscopy, atomic force microscopy, and X-ray diffraction. An application of static voltage during electrodeposition yields a compact layer of $WO_3$, whereas a highly porous morphology with nanoflakes is produced by a pulse voltage process. Compared to the compact film, the porous $WO_3$ thin film shows better photocatalytic activities. Furthermore, a much higher reaction rate of degradation of methylene blue can be achieved after post-annealing of $WO_3$ thin films.

• 한국재료학회지
• /
• 제10권6호
• /
• pp.437-444
• /
• 2000

기판온도, 박막조성 및 증착후 열처리 등의 조건에 따른 ${La_{1-x}}{Sr_x}{MnO_{3-{\delta}}}$(0.19$\leq$x$\leq$0.31) 박막의 결절구조와 전기전도 특성을 조사하였다. 스퍼터법을 이용하여 $500^{\circ}C$에서 증착된 박막은 강한 <001> 우선배향성과 유사정방정(pseudo-tetrag-onal, a/c-=0.97) 결정체를 나타냈다. 이러한 박막의 단위포는 산소분위기 내에서 증착후 열처리에 의하여 입장정 결정계로 변하였다. $La_{0.67}Sr_{0.33}MnO_3$ 조성의 주타겟과 $La_{0.3}Sr_{0.7}MnO_3$조성의 보조타겟을 동시에 이용하여 박막의 조성을 조절하였다. 보조타겟의 개수에 따라 박막내의 Sr 함량(x)은 0.19-0.31 범위의 값을 나타내었으며, x값이 0.19로부터 0.31로 증가시 금소-반도체의 전이 온도가 상승하였고, 전지비저항이 대체로 감소하였다. 0.18 T의 자기장 하에서, $La_{0.69}Sr_{0.31}MnO_3$조성의 박막의 자기저항변화 MR((%) = (${\rho}_o-{\rho}_H/{\rho}_H$)는 약 390% 이었다.

• 한국자기학회지
• /
• 제27권4호
• /
• pp.123-128
• /
• 2017

PtMn계 스핀밸브(Spin Valve, SV) 다층박막의 하부층 구조를 달리하여 제작된 시료를 열처리 후 측정한 자기저항(magnetoresistance, MR) 곡선과 자기이력 곡선(MH loop)으로부터 얻은 등방성의 자기적 특성을 조사하였다. PtMn층이 없는 스핀밸브 구조의 Glass/Ta(10 nm)/CoFe(6 nm)/Cu(2.5 nm)/CoFe(3 nm)/Ta(4 nm) 다층박막으로 측정한 MR 곡선에서 얻은 교환결합력($H_{ex}$), 보자력($H_c$), 자기저항비(MR(%))는 각각 0 Oe, 약 25 Oe, 3.3 %이었다. Glass/Ta(10 nm)/CoFe(6 nm)/Cu(2.5 nm)/CoFe(3 nm)/PtMn(6 nm)/Ta(4 nm) 다층박막으로 측정한 MR 곡선에서 반강자성체인 PtMn 박막으로 나타낸 효과로 하여금 나비 날개 형태로 얻은 $H_{ex}$, $H_c$, MR(%)는 각각 2 Oe, 316 Oe, 4.4 %이었다. 반강자성체인 PtMn층이 중간층으로 삽입된 이중 GMR-SV 다층박막으로 측정한 MR 곡선과 MH loop에서 얻은 $H_c$는 각각 37.5 Oe과 386 Oe이었으며, MR(%)는 각각 3.5 %와 6.5 %로 2개의 히스테리시스에서 사각비가 뚜렷하게 대칭적으로 나눠져 자기적 특성을 나타내었다. PtMn계 CoFe 스핀밸브 박막의 매우 작은 $H_{ex}$ 값과 미미한 형상이방성을 갖는 효과로 하여금 비등방성을 갖는 자기적 특성을 잃게 되었다. 이러한 결과는 PtMn 박막의 하부층과 상부층에 있는 SV 다층박막에서 각 강자성체의 자화 스핀배열로 일어나는 효과를 나타내었다.