• Title/Summary/Keyword: polishing characteristic

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A Study on Hydro-Static Polishing for Sculptured Surface (자유곡면의 정압연마에 관한 연구)

  • Cho, Jong-Rae;Jung, Yoon-Gyo
    • Transactions of the Korean Society of Machine Tool Engineers
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    • v.15 no.1
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    • pp.119-126
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    • 2006
  • The finishing process of die requires the processing technique of a height efficiency and precision. Because the precision of die gives the quality of goods the influence directly. The hydro-static polishing device employs the hydro-static axis and is able to polish the structure of complex picture under the constant pressure and is got constant surface roughness at all polished plane. Therefore, In order to polish precision sculptured surface, it was used the hydro-static polishing device. Polishing device's polishing characteristic is estimated by polishing conditions which are size of abrasive, material of tools. And, because the surface quality of workpiece depends on polishing pattern which relates to motion of abrasive grain. The polishing characteristic according to polishing pattern was evaluated.

The Study on the Wafer Surface and Pad Characteristic for Optimal Condition in Wafer Final Polishing (최적조건 선정을 위한 Pad 특성과 Wafer Final Polishing의 가공표면에 관한 연구)

  • Won, Jong-Koo;Lee, Eun-Sang;Lee, Sang-Gyun
    • Journal of the Korean Society of Manufacturing Process Engineers
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    • v.11 no.1
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    • pp.26-32
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    • 2012
  • Polishing is one of the important methods in manufacturing of Si wafers and in thinning of completed device wafers. This study will report the characteristic of wafer according to processing time, machining speed and pressure which have major influence on the abrasion of Si wafer polishing. It is possible to evaluation of wafer abrasion by load cell and infrared temperature sensor. The characteristic of wafer surface according to processing condition is selected to use a result data that measure a pressure, machining speed, and the processing time. This result is appeared by the characteristic of wafer surface in machining condition. Through that, the study cans evaluation a wafer characteristic in variable machining condition. It is important to obtain optimal condition. Thus the optimum condition selection of ultra precision Si wafer polishing using load cell and infrared temperature sensor. To evaluate each machining factor, use a data through each sensor. That evaluation of abrasion according to variety condition is selected to use a result data that measure a pressure, machining speed, and the processing time. And optimum condition is selected by this result.

The Effect of Pad Groove Dimension on Polishing Performance in CMP (CMP에서 패드 그루브의 채수가 연마특성에 미치는 영향)

  • Park, Ki-Hyun;Kim, Hyung-Jae;Jeong, Young-Seok;Jeong, Hae-Do;Park, Jae-Hong
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2004.07b
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    • pp.1308-1311
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    • 2004
  • It is very important that get polishing characteristic that to be stable that accomplish planarization of high efficiency in chemical mechanical polishing, and there is repeatability Groove of pad causes much effects in flow of slurry among various factors that influence in polishing characteristic, is expected to cause change of lubrication state and polishing characteristic in contact between wafer and pad. Therefore, divided factors of pad groove by groove pattern, groove profile, groove dimensions. This research wishes to study effect that dimension of pad groove gets in polishing performance. When changed dimension (width, depth, pitch of groove) of groove, measured change of removal rate and friction force. According as groove dimension changes, could confirm that removal rate and friction force change. While result of this experiment studies effect of pad groove in CMP, it is expected to become small help.

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Path Control of MR Fluid Jet Polishing System for the Polishing of an Aspherical Lens Mold Core (비구면 렌즈 몰드 코어 연마를 위한 MR Fluid Jet Polishing System의 경로 제어에 관한 연구)

  • Kim, K. B.;Cho, M. W.;Ha, S. J.;Cho, Y. K.;Song, K. H.;Yang, J. K.;Cai, Y.;Lee, J. W.
    • Transactions of Materials Processing
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    • v.24 no.6
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    • pp.431-436
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    • 2015
  • MR fluid can change viscosity in the presence of a magnetic field. A characteristic of MR fluid is reduced scattering during jetting. For these reasons a MR fluid jet polishing system can be used for ultra-precision polishing. In the current paper, the polishing path was calculated considering the aspherical lens profile equation and the experimental conditions for the MR fluid jet polishing system. Then the polishing of an aspherical lens mold core using the MR fluid jet polishing system with the calculated path control was made and the results were compared before and after polishing.

A Study on the Improvement of Performance for High Speed Cutting Tool using Magnetic Fluid Polishing Technique (자기연마기술을 이용한 고속절삭공구의 성능향상에 관한 연구)

  • Cho, Jong-Rae;Yang, Sun-Cheul;Jung, Yoon-Gyo
    • Transactions of the Korean Society of Machine Tool Engineers
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    • v.15 no.1
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    • pp.32-38
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    • 2006
  • The magnetic fluid polishing technique can polish the tool of complex shape, because the polishing method which polishes as compress the workpiece by the magnetism abrasives to arrange to the linear according to the line of magnetic force. Therefore, we producted the magnetic fluid polishing device in order that mirror like finishing processes the tool surface. In order to a polishing condition selection, polishing characteristic was estimated by polishing conditions which are magnetic flux density, polishing speed, grain size, magnetic fluid. The tool was polished to the selected polishing condition. The result to evaluate the polished tool's performance with the cutting force and tool wear, the polished tool's performance was improved compared with the tool not to polish.

Development of Chemical Mechanical Polishing machine by Conical Drum (원뿔형 드럼을 이용한 화학기계적 연마기의 개발)

  • 서헌덕
    • Proceedings of the Korean Society of Machine Tool Engineers Conference
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    • 1999.10a
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    • pp.525-529
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    • 1999
  • A cone shape drum polisher was developed to make up for the demerits of conventional CMP apparatus. The developed equipment has several superiorities. First of all, it can achieve uniform velocity profile on all the contact line because of its shape and easy to control the amount of slurry at the position of use. The whole area of wafer surface is exposed to the visual area except the contact line between wafer and drum, hence we can detect polishing end point more easily than any other polishing equipments. Also it has additional merits such as small foot print and polishing load. Polishing characteristics were investigated by developed equipment.

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Determination of Efficient Superfinishing Conditions for Mirror Surface Finishing of Stainless Steel (스테인레스 강의 경면가공을 위한 효율적 수퍼피니싱 조건의 결정)

  • Kim, Sang-Kyu;Cho, Young-Tae;Jung, Yoon-Gyo
    • Journal of the Korean Society of Manufacturing Process Engineers
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    • v.12 no.2
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    • pp.100-106
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    • 2013
  • Stainless steel has some excellent properties as the material for the mechanical component. Purpose of this study is carried out to obtain mirror surface on the surperfinishing of stainless steel with high efficiency. To achieve this, we have conducted a series of polishing experiment for stainless steel using abrasive film from the perspective of oscillation speed, the rotational speed of workpiece, contact roller hardness, contact pressure and feed rate. Abrasive film used this study is a micro-finishing film and a lapping film. Furthermore, the polishing characteristics and efficiency of stainless steel is discussed through measuring optimal polishing time and surface roughness. From the obtained results, it was confirmed that efficient superfinishing conditions and polishing characteristic of Stainless steel can be determined.

Effect of Pad Thickness on Removal Rate and Within Wafer Non-Uniformity in Oxide CMP (산화막 CMP에서 패드 두께가 연마율과 연마 불균일도에 미치는 영향)

  • Bae, Jae-Hyun;Lee, Hyun-Seop;Park, Jae-Hong;Nishizawa, Hideaki;Kinoshita, Masaharu;Jeong, Hae-Do
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.23 no.5
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    • pp.358-363
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    • 2010
  • The polishing pad is important element for polishing characteristic such as material removal rate(MRR) and within wafer non-uniformity(WIWNU) in the chemical mechanical planarization(CMP). The result of the viscoelasticity measurement shows that 1st elastic modulus is increased and 2nd elastic modulus is decreased when the top pad is thickened. The finite element analysis(FEA) was conducted to predict characteristic of polishing behavior according to the pad thickness. The result of polishing experiment was similar with the FEA, and it shows that the 1st elastic modulus affects instantaneous deformation of pad related to MRR. And the 2nd elastic modulus has an effect on WIWNU due to the viscoelasticity deformation of pad.

The Study on the Machining Characteristics of 300mm Wafer Polishing for Optimal Machining Condition (최적 가공 조건 선정을 위한 300mm 웨이퍼 폴리싱의 가공특성 연구)

  • Won, Jong-Koo;Lee, Jung-Taik;Lee, Eun-Sang
    • Transactions of the Korean Society of Machine Tool Engineers
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    • v.17 no.2
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    • pp.1-6
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    • 2008
  • In recent years, developments in the semiconductor and electronic industries have brought a rapid increase in the use of large size silicon wafer. For further improvement of the ultra precision surface and flatness of Si wafer necessary to high density ULSI, it is known that polishing is very important. However, most of these investigation was experiment less than 300mm diameter. Polishing is one of the important methods in manufacturing of Si wafers and in thinning of completed device wafers. This study reports the machining variables that has major influence on the characteristic of wafer polishing. It was adapted to polishing pressure, machining speed, and the slurry mix ratio, the optimum condition is selected by ultra precision wafer polishing using load cell and infrared temperature sensor. The optimum machining condition is selected a result data that use a pressure and table speed data. By using optimum condition, it achieves a ultra precision mirror like surface.