• Title/Summary/Keyword: phase-shifting interferometer

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Error Analysis for Optical Security by means of 4-Step Phase-Shifting Digital Holography

  • Lee, Hyun-Jin;Gil, Sang-Keun
    • Journal of the Optical Society of Korea
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    • v.10 no.3
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    • pp.118-123
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    • 2006
  • We present an optical security method for binary data information by using 4-step phase-shifting digital holography and we analyze tolerance error for the decrypted data. 4-step phase-shifting digital holograms are acquired by moving the PZT mirror with equidistant phase steps of ${\pi}/2$ in the Mach-Zender type interferometer. The digital hologram in this method is a Fourier transform hologram and is quantized with 256 gray level. The decryption performance of the binary data information is analyzed. One of the most important errors is the quantization error in detecting the hologram intensity on CCD. The greater the number of quantization error pixels and the variation of gray level increase, the more the number of error bits increases for decryption. Computer experiments show the results for encryption and decryption with the proposed method and show the graph to analyze the tolerance of the quantization error in the system.

Noise Elimination of Speckle Fringe Phasemap (반점 간섭무늬 위상단면도의 잡음제거)

  • 조재완;홍석경;백성훈;김철중
    • Korean Journal of Optics and Photonics
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    • v.5 no.2
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    • pp.217-224
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    • 1994
  • The combination of both phase-shifting convolution and 2-bit quantization smoothing filter was used to reduce speckle noise from saw-tooth speckle fringes phase map, obtained in phase-shifting speckle interferometer. The phase-shifting convolution showed the noise reduction capability of speckle fringe without destroying edge information across 271 jump. Also, it was shown that the 2-bit quantization smoothing filter was superior to average, low-pass filter and median filter in speeding up smoothing process and enhancing SIN ratio. Finally, a path dependent unwrapping algorithm was used to unwrap a noise reduced 271 modulo speckle phasemap. semap.

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Diffraction grating interferometer of large equivalent wavelength for flatness testing of rough surfaces (거친 표면 형상측정을 위한 큰 등가파장 회절격자 간섭계)

  • 황태준;김승우
    • Korean Journal of Optics and Photonics
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    • v.15 no.1
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    • pp.56-62
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    • 2004
  • We present a diffraction grating interferometer of large equivalent wavelength specially designed for flatness testing of rough surfaces. Two transmission diffraction gratings are illuminated on the object under test by use of two measurement beams with different angles of incidence, which yields a large equivalent wavelength. This interferometer design minimizes unnecessary diffraction rays and the systematic error caused by the diffraction gratings, and provides a large working distance and easy alignment. To improve the measurement accuracy, phase shifting technique is applied and the equivalent wavelength error caused by defocus is calibrated. Test results obtained from mirror surfaces and machined rough surfaces are discussed.

A Study on the System of Performance Test for High-order Aspheric Lens (고차 비구면 렌즈의 성능평가 시스템에 관한 연구)

  • Jang Nam-Young;Choi Pyung-Suk;Eun Jae-Jeong
    • Journal of the Institute of Convergence Signal Processing
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    • v.7 no.3
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    • pp.122-129
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    • 2006
  • We propose the Fizeau-type phase shifting interferometer(FPSI) system for the performance test of high-order aspheric lenses. The proposed system is divided into two parts : optical part and signal processing part. Those two parts are operated by a program for hardware control. We also developed an analysis program adopting the phase shifting algorithm to analyze the obtained interferograms. We can confirm that the proposed system is efficient and adequate by direct comparison with the standard criterion in Mark IV interferometric system of Zygo. The peak-to-valley and RMS values of surface errors which are used to characterize high-order aspheric lenses are 0.845 wave and 0.1871 wave, respectively. The measurement errors between the proposed system and Mark IV are less than ${\lambda}/100$ and the repeatability is also calculated at less than ${\lambda}/100$.

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Stable lateral-shearing interferometer for in-line inspection of aspheric pick-up lenses (생산 라인에서의 광 Pick-up용 비구면 대물 렌즈 측정을 위한 안정된 층밀리기 간섭계)

  • 조우종;김병창;김승우
    • Korean Journal of Optics and Photonics
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    • v.8 no.3
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    • pp.189-193
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    • 1997
  • Aspheric pick-up lenses are increasingly used in consumer products such as computer and multimedia, as their mass production has become possible owing to the injection molding process. However still much work needs to be done for more effective manufacture of aspheric lenses, one area of which is the in-line inspection of produced lenses. In this paper, we present a lateral-shearing interferometer that has specially been designed to have a high immunity to external vibration and atmospheric disturbance. The interferometer comprises four prisms. They are directly attached to each other using an immersion oil so that relative sliding motions between the prisms are allowed. Their relative displacement can readily generate necessary lateral-shearing and phase-shifting to determine the wavefront of the beam collimated by the lens under inspection. A special phase-measuring algorithm of arbitrary-bucket is adopted to compensate the phase-shifting error caused by the thickness reduction in the immersion oil. Zernike polynomial fitting has done for determinating quantitative aberration of aspheric pick-up lenses. The interferometer built in this work is robust to external mechanical vibration and atmospheric disturbance so that experimental results show that it has a repeatability of less than λ/100.

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The shape measurement of 3D object by using the method of interference pattern projection. (간섭무늬 투영 방식의 3차원 형상 측정)

  • 이연태;강영준;박낙규;황용선;백성훈
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2002.05a
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    • pp.271-274
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    • 2002
  • The 3-D measurement using interference pattern projection is very attractive because of its high measuring speed and high sensitivity. When a sinusoidal amplitude grating was projected on an object, the surface-height distribution of the object is translated into a phase distribution of the deformed grating image. The patters was generated by a interferometer, and a PZT was used to shift the fringes on the target surface. The phase-acquisition algorithms are so sufficiently simple that high-resolution phase maps using a CCD camera can be generated in a short time. A working system requires a interferometer, a PZT, and a detector array interfaced to a microcomputer. Results of measurements on the diffused test objects are described.

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Surface Form Measurement Using Single Shot Off-axis Fizeau Interferometry

  • Abdelsalam, Dahi Ghareab;Baek, Byung-Joon;Cho, Yong-Jai;Kim, Dae-Suk
    • Journal of the Optical Society of Korea
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    • v.14 no.4
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    • pp.409-414
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    • 2010
  • This paper describes the surface form measurement of a spherical smooth surface by using single shot off-axis Fizeau interferometry. The demodulated phase map is obtained and unwrapped to remove the $2\pi$ ambiguity. The unwrapped phase map is converted to height and the 3D surface height of the surface object is reconstructed. The results extracted from the single shot off-axis geometry are compared with the results extracted from four-frame phase shifting in-line interferometry, and the results are in excellent agreement.

Error analysis and Performance test of the Volumetric interferometer for Absolute distance measurement (삼차원 좌표 측정을 위한 부피 간섭계의 오차분석 및 성능평가)

  • Rhee, H.G.;Chu, J.Y.;Kim, S.W.
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2002.10a
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    • pp.387-390
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    • 2002
  • In this paper, we accomplish uncertainty evaluation and performance test of the volumetric interferometer using two spherical wavefronts emitted from the ends of two single mode fibers. We verify that the volumetric interferometer has the volume uncertainty of 690nm through the error analysis and it has the resolution of 0.1 0.1$\mu\textrm{m}$ for x axis which is the same order of repeatability for x axis. Also, we obtain the systematic error of $1\mu\textrm{m}$ for $60\times 60\times 20 mm^3$ working volume using self-calibration with an artifact plate.

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