• 제목/요약/키워드: phase shifting interferometry

검색결과 78건 처리시간 0.027초

Application of Phase-Shifting Method in Speckle Interferomtery to Measurement of Micro-Scale Displacement

  • Baek, Tae-Hyun;Kim, Myung-Soo
    • 비파괴검사학회지
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    • 제26권3호
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    • pp.162-168
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    • 2006
  • Speckle interferometry with phase-shifting method has been applied to measurement of micro-scale displacement through optical signal processing. Four-step phase-shifting method by PZT is used to measure out-of-plane displacement in spot-welded cantilever and results of optical experiments are comparable to those of FEM. Phase-shifting method using Fourier transform by PZT is applied to measurement of in-plane displacement on rectangular steel plate with a circular hole. The results of optical experiment agree well with theoretical calculation. New phase-shifting method in speckle interferometry has been implemented with a quarter wave plate. In-plane displacement of specimen is measured by the new phase-shifting method. Results of optical experiment show that the quarter wave plate can be used for phase-shifting method that is cheap and easy to use in speckle interferometry.

Measurement of a Mirror Surface Topography Using 2-frame Phase-shifting Digital Interferometry

  • Jeon, Seok-Hee;Gil, Sang-Keun
    • Journal of the Optical Society of Korea
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    • 제13권2호
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    • pp.245-250
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    • 2009
  • We propose a digital holographic interference analysis method based on a 2-frame phase-shifting technique for measuring an optical mirror surface. The technique using 2-frame phase-shifting digital interferometry is more efficient than multi-frame phase-shifting techniques because the 2-frame method has the advantage of a reduced number of interferograms, and then takes less time to acquire the wanted topography information from interferograms. In this measurement system, 2-frame phase-shifting digital interferograms are acquired by moving the reference flat mirror surface, which is attached to a piezoelectric transducer, with phase step of 0 or $\pi$/2 in the reference beam path. The measurements are recorded on a CCD detector. The optical interferometry is designed on the basis of polarization characteristics of a polarizing beam splitter. Therefore the noise from outside turbulence can be decreased. The proposed 2-frame algorithm uses the relative phase difference of the neighbor pixels. The experiment has been carried out on an optical mirror which flatness is less than $\lambda$/4. The measurement of the optical mirror surface topography using 2-frame phase-shifting interferometry shows that the peak-to-peak value is calculated to be about $0.1779{\mu}m$, the root-mean-square value is about $0.034{\mu}m$. Thus, the proposed method is expected to be used in nondestructive testing of optical components.

2-step 위상 천이 디지털 간섭계를 이용한 이진 데이터 암호화 및 복호화 (Encryption and decryption of binary data with 2-step phase-shifting digital interferometry)

  • 변현중;길상근;하승호
    • 한국광학회:학술대회논문집
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    • 한국광학회 2006년도 동계학술발표회 논문집
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    • pp.335-336
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    • 2006
  • We propose a method of encryption and decryption of binary data using 2-step phase-shifting digital interferometry. This technique reduces the number of interferograms in the phase-shifting interferometry. The binary data has been expressed with random code and random phase. We remove the dc-term of the phase-shifting digital interferogram to restore the original binary data. Simulation results shows that the proposed technique can be used for binary data encryption and decryption.

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디지털망에서의 4-step 위상 천이 간섭계를 이용한 이진 데이터의 쌍방향 광 암호화 및 전송 (Bi-directional encryption and transmission of binary data with 4-step phase-shifting interferometry in digital network)

  • 이현진;길상근;전석희;김남
    • 한국광학회:학술대회논문집
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    • 한국광학회 2006년도 동계학술발표회 논문집
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    • pp.135-136
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    • 2006
  • We present a new binary data encryption and transmission technique based on 4-step phase-shifting interferometry for a security system. Phase-shifting interferometry is used for recording phase and amplitude information on CCD device. 4-step phase-shifting is implemented by moving the PZT mirror with equidistant phase steps of ${\pi}/2$. The basic idea is that we reuse a 256 gray-level digital hologram to encrypt binary data with 4-step phase-shifting interferometry.

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광 간섭계의 측정 정밀도와 구동 정밀도의 관계 (The effects of moving accuracy on inteferometric 3D shape measurement)

  • 박민철;엄창용;김승우
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 2001년도 춘계학술대회 논문집
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    • pp.110-113
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    • 2001
  • We present an interferometer system, which is able to perform both the phase shifting interferometry and white light interferometry. The interferometer system uses a d.c. motor to control the probe position with an accuracy of 10nm, which shows an outstanding performance on white light interferometry. However, the moving mechanism of d.c. motor is not accurate enough for the phase shifting interferometry that requires a moving precision less than 1 nm. We therefore propose a Fourier transform technique to calculate the phase of interferograms, which is strongly resistant to calibration errors and external vibration. Experimental results show that the Fourier transform technique is capable of reducing the measurement error caused by inaccurate movement within 0.1nm.

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2-Bucket 알고리즘 위성 전이 간섭계를 이용한 평면 편평도 측정 (Surface Flatness Test using 2-Bucket Algorithm Phase-shifting Interferometry)

  • 정근욱;김동욱;길상근;박한규
    • 전자공학회논문지A
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    • 제29A권11호
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    • pp.62-69
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    • 1992
  • In this paper, a measurement system of surface flatness test using 2-Bucket algorithm phase-shifting interferometry is designed and constructed. In the conventional surface flatness test system using phase shifting interferometry, it is needed more than 3 fringe datas but we propose 2-Bucket algorithm phase-shifting interferometry which only uses two fringe datas. 2-Bucket algorithm uses the relative phase differences of the neighbour pixels. If we watch the result of phase-shift error test simulation, 2-Bucket algorithm has the same calculating values that 3-Bucket, 4-Bucket and 5-Bucket algorithm have them. Experiments have been carried out on the silicon wafer. The measurement of silicon wafer's surface flatness shows that the flatness topography using 2-Bucket algorithm is similar to that of other algorithms.

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Optical Encryption Scheme for Cipher Feedback Block Mode Using Two-step Phase-shifting Interferometry

  • Jeon, Seok Hee;Gil, Sang Keun
    • Current Optics and Photonics
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    • 제5권2호
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    • pp.155-163
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    • 2021
  • We propose a novel optical encryption scheme for cipher-feedback-block (CFB) mode, capable of encrypting two-dimensional (2D) page data with the use of two-step phase-shifting digital interferometry utilizing orthogonal polarization, in which the CFB algorithm is modified into an optical method to enhance security. The encryption is performed in the Fourier domain to record interferograms on charge-coupled devices (CCD)s with 256 quantized gray levels. A page of plaintext is encrypted into digital interferograms of ciphertexts, which are transmitted over a digital information network and then can be decrypted by digital computation according to the given CFB algorithm. The encryption key used in the decryption procedure and the plaintext are reconstructed by dual phase-shifting interferometry, providing high security in the cryptosystem. Also, each plaintext is sequentially encrypted using different encryption keys. The random-phase mask attached to the plaintext provides resistance against possible attacks. The feasibility and reliability of the proposed CFB method are verified and analyzed with numerical simulations.

광위상간섭에 의한 경면의 정밀 형상측정 (Precision Profile Measurement of Mirror Surfaces by Phase Shifting Interferometry)

  • 김승우;공인복;민선규
    • 대한기계학회논문집
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    • 제16권8호
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    • pp.1530-1535
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    • 1992
  • 본 연구에서는 초정밀 경면의 표면형상을 비접촉식으로 측정하기 위한 광위상 간섭법(phase shifting interferometry)에 관한 연구결과를 기술하였다. 리닉(lin- nik) 광학계를 이용한 광위상간섭에 대한 기본 측정원리를 정립하고 표면측정을 위한 간섭무늬처리 영상해석 알고리즘을 개발하였다. 그리고 실제적인 경면의 측정을 통 하여 개발한 광학계 및 측정 알고리즘의 타당성을 검증하였다.

위상이동법과 시간평균법의 면내변위 측정 비교 (Comparison of In-Plane Measurement of Phase-Shifting with Time-Average Method)

  • 김경석;김동일;정현철;강기수;이찬우;양승필;장순석
    • 한국정밀공학회지
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    • 제16권10호
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    • pp.53-58
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    • 1999
  • Even I the Electronic Speckle Pattern Interferometry(ESPI) method that measure the strain of object within wavelength of light is less visibility than Holographic Interferometry(HI) method, the merits of application, convenience and time-save have made the method practical in industry. However, the existing ESPI methods that are based on dual-exposure, real-time and time-average method have difficulties for accurate measurement, due to irregular intensity and shake of phase. Recently, in order to solve this problem, phase shifting method have been proposed. In this method, the path of reference light in interference is shifted to make improvement in distinction and precision. But this method includes too many noise, caused by the problem of relationship between object and phase. Therefore, a method to reduce noise muse be introduced. In this paper, least square fitting method is proposed. As results, the phase-map is influenced by precise phase shifting and current of notes and speckle pattern obtained by phase shifting method is improved on the existing method driven from time-average method.

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