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The Present Status and Outlook of Nano Technology (나노기술의 국내외 현황과 전망)

  • 김용태
    • Proceedings of the International Microelectronics And Packaging Society Conference
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    • 2001.11a
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    • pp.37-39
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    • 2001
  • 21세기의 벽두부터 국내외적으로 활발히 논의되고 있는 나노기술에 대한 정의를 생각해보는 것으로부터 우리가 나아갈 방향을 살펴보고자 한다. 나노기술이란, 원자 하나 하나 혹은 분자단위의 조작을 통해 1~100nm정도의 범위 안에서 근본적으로 새로운 물질이나 구조체를 만들어 내는 기술을 말한다. 즉 앞으로 우리는 경험해 보지 못한 새로운 현상에 대한 이해를 할 수 있어야 하고, 새로운 물질 자체를 다룰 수 있는 방법이 우리가 해야 할 구체적인 일이 될 것이란 말이 된다. 뿐만 아니라 나노기술은 종래의 정보.통신.전자 분야에서 주로 추구하던 마이크로화와 달리 재료, 기계, 전자, 의학, 약학, 에너지, 환경, 화학, 생물학, 농학, 정보, 보안기술 등 과학기술 분야 전반을 위시하여 사회분야가지 새로운 인식과 철학적인 이해가 필요하게 되었다. 21세기를 맞은 인류가 나아갈 방향을 나노세계에 대한 도전으로 보아야 하며, 과학기술의 새로운 틀을 제공할 것 임에 틀림 없다. 그러나, 이와 같은 나노기술의 출발점을 살펴보면 VLSI기술로 통칭할 수 있는 마이크로전자소자 기술이란 점이다. 국내의 VLSI기술은 메모리기술이라고 해도 과언이 아닐 것이다. 문제는 종래의 메모리기술은 대규모 투자와 집중적인 인력양성을 통해서 세계 최고 수준에 도달 할 수 있었다. 그러나 여기까지 오는 동안 사식 우리는 선진국의 뒷꽁무니를 혼신의 힘을 다해 뒤쫓아 온 결과라고 보아도 틀리지 않는다. 즉, 앞선자를 보고 뒤쫓는 사람은 갈방향과 목표가 분명하므로 최선을 다하면 따라 잡을 수 있다. 그런데 나노기술은 앞선 사람이 없다는 점이 큰 차이이다 따라서 뒷껑무니를 쫓아가는 습성을 가지고는 개척해 나갈 수 없다는 점을 깨닫지 않으면 안된다. 그런 점에서 이 시간 나노기술의 국내외 현황을 살펴보고 우리가 어떻게 할 것인가를 생각해 보는데 의미가 있을 것이다.하여 분석한 결과 기존의 제한된 RICH-DP는 실시간 서비스에 대한 처리율이 낮아지며 서비스 시간이 보장되지 못했다. 따라서 실시간 서비스에 대한 새로운 제안된 기법을 제안하고 성능 평가한 결과 기존의 RICH-DP보다 성능이 향상됨을 확인 할 수 있었다.(actual world)에서 가상 관성 세계(possible inertia would)로 변화시켜서, 완수동사의 종결점(ending point)을 현실세계에서 가상의 미래 세계로 움직이는 역할을 한다. 결과적으로, IMP는 완수동사의 닫힌 완료 관점을 현실세계에서는 열린 미완료 관점으로 변환시키되, 가상 관성 세계에서는 그대로 닫힌 관점으로 유지 시키는 효과를 가진다. 한국어와 영어의 관점 변환 구문의 차이는 각 언어의 지속부사구의 어휘 목록의 전제(presupposition)의 차이로 설명된다. 본 논문은 영어의 지속부사구는 논항의 하위간격This paper will describe the application based on this approach developed by the authors in the FLEX EXPRIT IV n$^{\circ}$EP29158 in the Work-package "Knowledge Extraction & Data mining"where the information captured from digital newspapers is extracted and reused in tourist information context.terpolation performance of CNN was relatively better than NN.콩과 자연 콩이 성분 분석에서 차이를 나타내지 않았다는 점, 네 번째. 쥐를 통한 다양섭취 실험에서 아무런 이상 반응이 없었다는 점등의 결과를 기준으로 알레르기에 대한 개별 검사 없이 안전한

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Study on the Effects of BaTiO$_3$ Particle Size on Dielectric Constant and Leakage Current of Epoxy/BaTiO$_3$ Composite Films for Embedded Capacitors (BaTiO$_3$ 분말의 입자 크기가 내장형 커패시턴용 에폭시/BaTiO$_3$복합체 필름의 유전상수와 누설전류에 미치는 영향에 관한 연구)

  • 조성동;이주연;백경욱
    • Journal of the Microelectronics and Packaging Society
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    • v.9 no.2
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    • pp.11-17
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    • 2002
  • Polymer/ceramic composite is of great interest as a dielectric material for embedded capacitors. This paper is concerned in the effects of $BaTiO_3$ particle size on epoxy/$BaTiO_3$ composite films for embedded capacitors. 6 different size powders smaller than 1 $\mu\textrm{m}$ in diameter and bisphenol-A type epoxy were used for this experiment. Dielectric constant of the epoxy/$BaTiO_3$ composite capacitors increases as the powder size increases at the same powder loading, which is due to the increase of tetragonality of the powders as particle size increases. And leakage current of the capacitors also increases dramatically as the powder size increases. It was explained that this is due to the decrease of the number of $BaTiO_3$epoxy/$BaTiO_3$ potential barriers per unit length and, moreover, the enhancement of potential barrier lowering effects caused by increase of potential drop per one barrier. As a result, there is tradeoff between high dielectric constant and low leakage current in the epoxy/$BaTiO_3$ composite capacitors. So it is important to select proper size $BaTiO_3$ powders in accordance with needs.

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Hybrid Fabrication of Screen-printed Pb(Zr,Ti)O3 Thick Films Using a Sol-infiltration and Photosensitive Direct-patterning Technique (졸-침투와 감광성 직접-패턴 기술을 이용하여 스크린인쇄된 Pb(Zr,Ti)O3 후막의 하이브리드 제작)

  • Lee, J.-H.;Kim, T.S.;Park, H.-H.
    • Journal of the Microelectronics and Packaging Society
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    • v.22 no.4
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    • pp.83-89
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    • 2015
  • In this paper, we propose a fabrication technique for enhanced electrical properties of piezoelectric thick films with excellent patterning property using sol-infiltration and a direct-patterning process. To achieve the needs of high-density and direct-patterning at a low sintering temperature (< $850^{\circ}C$), a photosensitive lead zirconate titanate (PZT) solution was infiltrated into a screen-printed thick film. The direct-patterned PZT films were clearly formed on a locally screen-printed thick film, using a photomask and UV light. Because UV light is scattered in the screen-printed thick film of a porous powder-based structure, there are needs to optimize the photosensitive PZT sol infiltration process for obtaining the enhanced properties of PZT thick film. By optimizing the concentration of the photosensitive PZT sol, UV irradiation time, and solvent developing time, the hybrid films prepared with 0.35 M of PZT sol, 4 min of UV irradiation and 15 sec solvent developing time, showed a very dense with a large grain size at a low sintering temperature of $800^{\circ}C$. It also illustrated enhanced electrical properties (remnant polarization, $P_r$, and coercive field, $E_c$). The $P_r$ value was over four times higher than those of the screen-printed films. These films integrated on silicon wafer substrate could give a potential of applications in micro-sensors and -actuators.

Fabrication and Electrical Insulation Property of Thick Film Glass Ceramic Layers on Aluminum Plate for Insulated Metal Substrate (알루미늄 판상에 글라스 세라믹 후막이 코팅된 절연금속기판의 제조 및 절연특성)

  • Lee, Seong Hwan;Kim, Hyo Tae
    • Journal of the Microelectronics and Packaging Society
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    • v.24 no.4
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    • pp.39-46
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    • 2017
  • This paper presents the fabrication of ceramic insulation layer on metallic heat spreading substrate, i.e. an insulated metal substrate, for planar type heater. Aluminum alloy substrate is preferred as a heat spreading panel due to its high thermal conductivity, machinability and the light weight for the planar type heater which is used at the thermal treatment process of semiconductor device and display component manufacturing. An insulating layer made of ceramic dielectric film that is stable at high temperature has to be coated on the metallic substrate to form a heating element circuit. Two technical issues are raised at the forming of ceramic insulation layer on the metallic substrate; one is delamination and crack between metal and ceramic interface due to their large differences in thermal expansion coefficient, and the other is electrical breakdown due to intrinsic weakness in dielectric or structural defects. In this work, to overcome those problem, selected metal oxide buffer layers were introduced between metal and ceramic layer for mechanical matching, enhancing the adhesion strength, and multi-coating method was applied to improve the film quality and the dielectric breakdown property.

Carbon strain sensor using Nd: YAG laser Direct Writing (Nd:YAG Laser 직접 각인을 이용한 Carbon 스트레인 센서)

  • Joo, Donghyun;Yoon, Sangwoo;Kim, Joohan;Park, Woo-Tae
    • Journal of the Microelectronics and Packaging Society
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    • v.25 no.1
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    • pp.35-40
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    • 2018
  • Nd:YAG laser was used to carbonize polyimide films to produce carbon films. This is a simple manufacturing process to fabricate low cost sensors. By applying this method, we studied characteristics of flexible and low-cost piezoresistive. Previously, many studies focused on carbonization of polyimide using $CO_2$ laser with wavelength of $10.6{\mu}m$. In this paper, carbonization (carbonization process) was performed on polyimide films using an Nd:YAG laser with a wavelength of $1.064{\mu}m$. In order to increase the resolution, we optimized the laser conditions of the power density ($W/cm^2$) and the beam scan rate. In previous studies using $CO_2$ laser, the minimum line width was $140{\sim}220{\mu}m$ but in this study, carbon line width was reduced to $35{\sim}40{\mu}m$. The initial sheet resistance of the carbon sensor was $100{\sim}300{\Omega}/{\square}$. The resistance decreased by 30% under stretched with a curvature radius of 21 R. The calculated gauge factor was 56.6. This work offers a simple, highly flexible, and low-cost process to fabricate piezoresistive sensors.

Structure and Growth of Tin Whisker on Leadframe with Lead-free Solder Finish (무연솔더 도금된 리드프레임에서 Sn 위스커의 성장과 구조)

  • Kim Kyung-Seob;Leem Young-Min;Yu Chong-Hee
    • Journal of the Microelectronics and Packaging Society
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    • v.11 no.3 s.32
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    • pp.1-7
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    • 2004
  • Tin plating on component finishes may grow whiskers under certain conditions, which may cause failures in electronics equipment. To protect the environment, 'lead-free' among component finishes is being promoted worldwide. This paper presents the evaluation results of whiskers on two kinds of lead-free plating materials at the plating temperature and under the reliability test. The rising plating temperature caused increasing the size of plating grain and shorting the growth of whisker. The whisker was grown under the temperature cycling the bent type in matt Sn plating and striated type in malt Sn-Bi. The whisker growth in Sn-Bi plating was shorter than that in Sn plating. In FeNi42 leadframe, the $7.0{\~}10.0{\mu}m$ diameter and the $25.0{\~}45.0{\mu}m$ long whisker was grown under 300 cycles. In the 300 cycles of Cu leadframe, only the nodule(nuclear state) grew on the surface, and in the 600 cycles, a $3.0{\~}4.0{\mu}m$ short whisker grew. After 600 cycles, the ${\~}0.34{\mu}m$ thin $Ni_3Sn_4$ formed on the Sn-plated FeNi42. However, we observed the amount of $0.76{\~}1.14{\mu}m$ thick $Cu_6Sn_5$ and ${\~}0.27{\mu}m$ thin $Cu_3Sn$ intermetallics were observed between the Sn and Cu interfaces. Therefore, the main growth factor of a whisker is the intermetallic compound in the Cu leadframe, and the coefficient of thermal expansion mismatch in FeNi42.

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Mechanical Reliability Evaluation on Solder Joint of CCB for Compact Advanced Satellite (Sherlock을 활용한 차세대 중형위성용 CCB 솔더 접합부의 기계적 신뢰성 평가)

  • Jeon, Young-Hyeon;Kim, Hyun-Soo;Lim, In-Ok;Kim, Youngsun;Oh, Hyun-Ung
    • Journal of the Korean Society for Aeronautical & Space Sciences
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    • v.45 no.6
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    • pp.498-507
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    • 2017
  • Electronic equipments comprised of high density components with various packaging types have been recently applied to a satellite. Therefore, to guarantee high reliability of electrical equipment, a design approach, which can reduce the development period and cost through an early diagnosis in potential risks of failure, should be established. In the previous research, the reliability assesment of the electronic equipments have based on Steinberg's fatigue failure theory. However, this theory was not enough for further investigation of life prediction and reliability of the electronic equipments comprised of various sizes and packaging types due to its theoretical limitations and analysis results sensitivity with regard to different modeling technic. In that case, if detailed finite element model is established, aforementioned problems can be readily solved. However, this approach might arise disadvantage of spending much time. In this paper, to establish strategy for high reliability design of electronic equipment, we performed mechanical reliability evaluation of CCB (Camera Controller Box) at qualification level based on the approach using Sherlock unlike design techniques applied to existing business.

Growth and Postharvest Freshness of $Tah$ $Tasai$ Chinese Cabbage ($Brassica$ $campestris$ var. $narinosa$) Baby Leaf Vegetable as Affected by Brushing Treatment during Cultivation (재배 시 brushing 처리에 따른 어린잎 채소 다채의 생육과 수확 후 선도 차이)

  • Lee, Jung-Soo;Do, Kyung-Ran
    • Food Science and Preservation
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    • v.19 no.1
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    • pp.19-25
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    • 2012
  • An experiment was conducted to find out the effect of brushing treatment during cultivation on the postharvest quality of the baby leaf vegetable, specifically tah tasai Chinese cabbage (Brassica campestris var. narinosa). The effect of mechanical brushing during cultivation on the postharvest quality was determined in terms of the quality changes in weight loss, gas partial pressure, leaf color, and appearance during storage using a 30-${\mu}m$-thick polypropylene film at $16^{\circ}C$. The brushing treatment included brushing with A4 paper back and forth 50 times a day. The study revealed that the growths on the brushing-treated plant group were less than those on the control group. The structure of the leaf tissue of the brushing-treated plant also tended to be less compact than that of the non-treated plant. The brushing treatment resulted in less growth and denser plant tissues as well as in differences in the gas $O_2$ consumption and $CO_2$ accumulation after packaging. For the gas partial pressure, the $O_2$ consumption and $CO_2$ accumulation of the brushing-treated plant tended to be less than those of the non-treated plant. There were no differences, however, between the brushing-treated plant and control groups in the SPAD value and appearance. The study results also suggested that after packaging, the effects of the brushing treatment during cultivation on the quality of the tah tasai Chinese cabbage baby leaf vegetable was not significant. As such, it is recommended that effective post-harvest methods of improving the product quality of the baby leaf vegetable be further investigated.

A Study on the Parameters of Design for Warpage reduction of Passive components Embedded Substrate for PoP (PoP용 패시브 소자 임베디드 기판의 warpage 감소를 위한 파라메타 설계에 관한 연구)

  • Cho, Seunghyun;Kim, Dohan;Oh, Youngjin;Lee, Jongtae;Cha, Sangsuk
    • Journal of the Microelectronics and Packaging Society
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    • v.22 no.1
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    • pp.75-81
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    • 2015
  • In this paper, numerical analysis by finite element method and parameter design by the Taguchi method were used to reduce warpage of a two passive components embedded double side substrate for PoP(Package on Package). The effect of thickness of circuit layers (L1, L2) and thickness of solder resist (SR_top, SR_BTM) were analyzed with 4 variations and 3 levels(minimum, average and maximum thickness) to find optimized thickness conditions. Also, paste effect of solder resist on unit area of top surface was analyzed. Finally, experiments was carried out to prove numerical analysis and the Taguchi method. Based on the numerical and experimental results, it was known that circuit layer in ball side of substrate was the most severe determining deviation for reducing warpage. Buried circuit layer in chip side, solder resist and were insignificant effects on warpage relatively. However, warpage decreased as circuit layer in ball side thickness increased but effect of solder resist and circuit layer in chip side thickness were conversely.

Assessment of Viscoplastic Deformation Behavior of Eutectic Solder and Lead-free Solder (유연 솔더와 무연 솔더의 점소성 변형거동 평가)

  • Lee, Bong-Hee;Joo, Jin-Won
    • Journal of the Microelectronics and Packaging Society
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    • v.18 no.2
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    • pp.17-27
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    • 2011
  • This paper describes an experimental study and finite element analysis (FEA) carried out for investigating thermal deformation behavior of solders, resulting from temperature change in the solder. With such a goal in mind, a shear specimen that was composed of two metal bars having different coefficient of thermal expansion and solder blocks placed between two bars was designed and fabricated. Two different types of solder blocks, eutectic solder (Sn/36Pb/ 2Ag) and lead-free solder (Sn/3.0Ag/0.5Cu) were tested as well. Fringe patterns for several temperature steps were recorded and analyzed for three temperature cycles using a real-time moir$\acute{e}$ setup. The experimental data was verified with FEA and used to evaluate the suitability for numerous solder constitutive models available in literatures. FEA employing Anand material model suggested by Darveaux et al. and Chang et al. were found to be in an excellent agreement with the experimental results for the eutectic solder and the lead-free solder, respectively. In addition, numerical predictions on bending displacement, shear strain and viscoplastic distortion energy are documented and viscoplastic deformation behavior of two types of solder material are compared.