• Proceedings of the Korean Society of Precision Engineering Conference
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• 2008.11a
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• pp.139-140
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• 2008

• Journal of the Optical Society of Korea
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• v.7 no.3
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• pp.131-134
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• 2003

We demonstrated an optical frequency synthesizer based on a femtosecond (fs) mode-locked Ti:sapphire (Ti:s) laser by simultaneously stabilizing the carrier-offset frequency, $f_{ceo}$, and repetition rate, $f_{ rep}$, referenced to the Cs atomic frequency standard. By using two wide-band digital phase-detectors we realized a phase-coherent link between $f_{rep} and f_{ceo} with the relation f_{ceo} = f_{AOM} 5/6f_{rep} ≡ 0, where f_{AOM} = 5/6f_{rep}$ is the phase-locked driving frequency of an acousto-optic modulator (AOM) in a self-referencing interferometer and $f_{rep}$ = 100 MHz. As a result, we could stabilize all components of the fs laser comb at once with an equal frequency separation $f_{rep}$ = 100 MHz with $f_{ceo}$ = 0. In our optical frequency synthesizer, the frequency of the nth component ($f_{n}$) is given exactly by the simple relation $f_n = nf_{rep}$, enabling us to use the fs laser comb as a frequency ruler in the optical frequency metrology.

• Proceedings of the Optical Society of Korea Conference
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• 1999.08a
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• pp.30-31
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• 1999

• Journal of the Korean Society of Manufacturing Technology Engineers
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• v.5 no.1
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• pp.33-42
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• 1996

The high coherence of laser beam has made it possible to observe interference effects even in the light scattered from rough surfaces. That's why, when object with a scattering surface is illuminated with laser light, we do see a speckled appearance due to random interference. This sort of unique property of laser speckle has bruht into existence the new noncontaciting techniques such as speckle metrology method of measuring deformation, displacement, and vibration etc of objects with high optical sensitivity. The measurable range of speckle metrology especially used to measure in -plane information, however, is limited by some factors, the so-called strain, rotation tilt of surface and out of displacement perpendicular to the plane of analysis This restrictions severly limits the measurable range of speckle metrology by causing the decorrelation of speckle patterns. It is the purpose of this paper to give a survey on the measurable limitation of speckle photography method that is one of speckle metrology. Namely we will discuss the mutual relationships and problems of each limitations adding the restriction on the largest and smallest displacement measurable with speckle methods.

• Proceedings of the Optical Society of Korea Conference
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• 2007.07a
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• pp.23-24
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• 2007

• Proceedings of the Optical Society of Korea Conference
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• 2006.02a
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• pp.107-108
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• 2006

• Proceedings of the Optical Society of Korea Conference
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• 2008.02a
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• pp.273-274
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• 2008

• Proceedings of the Optical Society of Korea Conference
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• 2006.07a
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• pp.21-22
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• 2006

• Current Optics and Photonics
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• v.5 no.1
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• pp.40-44
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• 2021

In this paper, LED arrays with segmented mirrors and a mask are presented as a new dark-field illuminator for reflective Fourier ptychographic microscopy (FPM). The illuminator can overcome the limitations of the size and the position of samples that the dark-field illuminator using a parabolic mirror has had. The new concept was demonstrated by measuring a USAF 1951 target, and it resolved a pattern in group 10 element 6 (274 nm) in the USAF target. The new design of the dark-field illuminator can enhance competitiveness of the reflective FPM as a versatile measurement method in industry.

• Current Optics and Photonics
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• v.6 no.4
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• pp.392-399
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• 2022

Light-measuring devices (LMDs) are frequently used to measure luminance and color coordinates of displays. However, it is very difficult to use a conventional LMD for measuring the optical properties of virtual-reality (VR) devices with a wide field of view (FOV), because of their confined spaces where the entrance pupil of a LMD is located. In this paper, a new LMD that can measure the optical properties of wide-FOV VR devices, without physical conflict with the goggles of the VR device, is proposed. The LMD is designed to fully satisfy the requirements of IEC 63145-20-10, and a pivot-point correction method for the LMD is applied to improve its accuracy. To show the feasibility of the developed LMD and the correction method, seven VR devices with wide FOV are measured with it. From the results, all of them are successfully measured without any physical conflict, and a comparison to their nominal values shows that the FOVs have been properly measured.