• Advances in nano research
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• 제5권1호
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• pp.13-25
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• 2017

We examine the total optical dielectric function (TODF) of impurity doped GaAs quantum dot (QD) from the viewpoint of anisotropy, position-dependent effective mass (PDEM) and position dependent dielectric screening function (PDDSF), both in presence and absence of noise. The dopant impurity potential is Gaussian in nature and noise employed is Gaussian white noise that has been applied to the doped system via two different modes; additive and multiplicative. A change from fixed effective mass and fixed dielectric constant to those which depend on the dopant coordinate manifestly affects TODF. Presence of noise and also its mode of application bring about more rich subtlety in the observed TODF profiles. The findings indicate promising scope of harnessing the TODF of doped QD systems through expedient control of site of dopant incorporation and application of noise in desired mode.

• 한국진공학회지
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• 제16권1호
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• pp.40-45
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• 2007

본 연구에서는 광전자 소자에 폭넓게 사용되는 ZnCdSe 화합물 반도체의 end-point인 CdSe의 유전함수 spectrum을 Vacuum Ultra Violet spectroscopic ellipsometry(타원편광분석법) 측정하여 분석하였다. 측정 결과는 변수화 모델을 이용하여 분석하였으며 그 결과 6 eV 이상에 존재하는 전자전이점들을 확인할 수 있었고 CdSe의 Critical Point(CP) 구조를 수치화 함으로써 온도나 화합물 함량에 따른 광특성 의존성 연구 등에 활용될 수 있는 database를 확보하였다.

• Transactions on Electrical and Electronic Materials
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• 제13권4호
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• pp.196-199
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• 2012

CdS thin film was prepared on glass substrate by chemical bath deposition in an alkaline solution. The optical properties of CdS thin film were investigated using spectroscopic ellipsometry. The real (${\varepsilon}_1$) and imaginary (${\varepsilon}_2$) parts of the complex dielectric function ${\varepsilon}(E)={\varepsilon}_1(E)+i{\varepsilon}_2(E)$, the refractive index n(E), and the extinction coefficient k(E) of CdS thin film were obtained from spectroscopic ellipsometry. The normal-incidence reflectivity R(E) and absorption coefficient ${\alpha}(E)$ of CdS thin film were obtained using the refractive index and extinction coefficient. The critical points $E_0$ and $E_1$ of CdS thin film were shown in spectra of the dielectric function and optical constants of refractive index, extinction coefficient, normal-incidence reflectivity, and absorption coefficient. The dispersion of refractive index was analyzed by the Wemple-DiDomenico single-oscillator model.

• Journal of Korean Vacuum Science & Technology
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• 제3권2호
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• pp.112-115
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• 1999

The real ($\varepsilon$1) and imaginary ($\varepsilon$2) parts of the dielectric function of ZnS have been measured by spectroscopic ellipsometry (SE) in the 3.7-6.0 eV photon-energy range at room temperature. The obtained dielectric function spectra reveal distinct structures at energies E0/(E0+$\Delta$0) and E1 critical points. The spectrum after chemical treatment to remove surface oxide overlayer showed that these data seem to be the best representation of the dielectric function of ZnS, having the largest $\varepsilon$2 value at E1 peak region reported so far by SE. Dielectric-related optical constants of ZnS, such as the complex refractive indices (n+n=ik), absorption coefficient, and reflectance, are also presented.

• Journal of the Optical Society of Korea
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• 제17권1호
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• pp.27-32
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• 2013

Based on the dispersive feature of the dielectric function of noble metals and the wave vector conservation in physics, both the plasma effect and the complex refractive index, which are profoundly correlated to the complex dielectric function and permeability, have been studied and analyzed. The condition to induce a bulk or a surface plasma in the visible region will not be satisfied, and there will be one solution for the real and the imaginary parts of the refractive index, restricting it only to region I of the complex plane. The results given in this work will aid in understanding the properties of light transmission at the metal/dielectric interface as characterized by the law of refraction in nature.

• 한국진공학회지
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• 제16권6호
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• pp.458-462
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• 2007

타원편광분석법은 반도체 물질의 광 특성과 전이점 연구에 유용하게 쓰이는 기술이다. 측정된 유전율 함수로부터 전이점을 구하기 위해서 전통적으로 이차 미분스펙트럼을 이용하여 분석하는데, 이 방법은 high frequency 의 잡음을 크게 증폭시키는 단점이 있다. 본 연구에서는 역 공간 푸리에 변환 (Fourier transform)을 이용하여 low-, medium-, high-index 의 푸리에 계수로부터 baseline, 정보, high frequency 잡음을 분리하는 방법을 소개하고자 한다. 이 방법을 이용하여 광전자소자에 폭넓게 사용되는 ZnCdSe 화합물 반도체의 $E_1,\;E_1+{\Delta}_1$ 전이점에 대한 연구를 하여 전통적인 이차 미분법과 비교해 보았다.

• Journal of the Optical Society of Korea
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• 제18권4호
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• pp.359-364
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• 2014

We report parameters that allow the dielectric functions ${\varepsilon}={\varepsilon}_1+i{\varepsilon}_2$ of $AlAs_xSb_{1-x}$ alloys to be calculated analytically over the entire composition range $0{\leq}x{\leq}1$ in the spectral energy range from 0.74 to 6.0 eV by using the dielectric function parametric model (DFPM). The ${\varepsilon}$ spectra were obtained previously by spectroscopic ellipsometry for x = 0, 0.119, 0.288, 0.681, 0.829, and 1. The ${\varepsilon}$ data are successfully reconstructed and parameterized by six polynomials in excellent agreement with the data. We can determine ${\varepsilon}$ as a continuous function of As composition and energy over the ranges given above, and ${\varepsilon}$ can be converted to complex refractive indices using a simple relationship. We expect these results to be useful for the design of optoelectronic devices and also for in situ monitoring of AlAsSb film growth.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2011년도 제41회 하계 정기 학술대회 초록집
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• pp.225-225
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• 2011

The dielectric and optical properties of GaInZnO (GIZO), HfInZnO (HIZO) and InZnO (IZO) thin films on glass by RF magnetron sputtering method were investiged using reflection electron energy loss spectroscopy (REELS). The band gap was estimated from the onset values of REELS spectra. The band gaps of GIZO, HIZO and IZO thin films are 3.1 eV, 3.5 eV and 3.0 eV, respectively, Hf and Ga incorporated into IZO results in an increase in the energy band gap of IZO by 0.5 eV and 0.1 eV. The dielectric functions were determined by comparing the effective cross section determined from experimental REELS with a rigorous model calculation based on the dielectric response theory, using available software package, good agreement between the experimental and fitting results gives confidence in the accuracy of the determined dielectric function. The main peak of Energy Loss Function (ELF) obtained from IZO shows at 18.42 eV, which shifted to 19.43 eV and 18.15 eV for GIZO and HIZO respectively, because indicates the corporation of cation Ga and Hf in the composition. The optical properties represented by the dielectric function e, the refractive index n, the extinction coefficient k, and the transmission coefficient, T of HIZO and IZO thin films were determined from a quantitative analysis of REELS. The transmission coefficient was increased to 93% and decreased to 87% in the visible region with the incorporation of Hf and Ga in the IZO compound.

• Journal of the Optical Society of Korea
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• 제13권2호
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• pp.286-293
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• 2009

In this paper, we present an optimal shape design method for a dielectric microlens which is used to focus an incoming infrared plane wave in wideband, by exploiting the finite difference time domain (FDTD) technique and the topology optimization technique. Topology optimization is a scheme to search an optimal shape by adjusting the material properties, which are design variables, within the design space. And by introducing the adjoint variable method, we can effectively calculate a derivative of the objective function with respect to the design variable. To verify the proposed method, a shape design problem of a dielectric microlens is tested when illuminated by a transverse electric (TE)-polarized infrared plane wave. In this problem, the design variable is the dielectric constant within the design space of a dielectric microlens. The design objective is to maximally focus the incoming magnetic field at a specific point in wideband.

• Journal of Korean Vacuum Science & Technology
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• 제6권4호
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• pp.149-152
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• 2002

We performed the modeling of the dielectric functions of C $d_{0.77}$M $g_{0.23}$Te by using parametric semiconductor model. Parametric model describes the analytic dielectric function as the summation of several energy-bounded Gaussian-broadened polynomials and provides a reasonably well parameterized function which can accurately reproduce the optical constants of semiconductor materials. We obtained the values of fitting parameters of the Mg composition 0.23 in the parametric model. From these parameters we could remove interference oscillations to obtain the dielectric function of C $d_{0.77}$M $g_{0.23}$Te alloy film for full 0.5-6.0 eV energy range.y range.