• Title/Summary/Keyword: non volatile memory

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Considerations for Designing an Integrated Write Buffer Management Scheme for NAND-based Solid State Drives (SSD를 위한 쓰기 버퍼와 로그 블록의 통합 관리 고려사항)

  • Park, Sungmin;Kang, Sooyong
    • Journal of Digital Contents Society
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    • v.14 no.2
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    • pp.215-222
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    • 2013
  • NAND flash memory-based Solid State Drives (SSD) have lots of merits compared to traditional hard disk drives (HDD). However, random write in SSD is still far slower than sequential read/write and random read. There are two independent approaches to resolve this problem: 1) using part of the flash memory blocks as log blocks, and 2) using internal write buffer (DRAM or Non-Volatile RAM) in SSD. While log blocks are managed by the Flash Translation Layer (FTL), write buffer management has been treated separately from FTL. Write buffer management schemes did not use the exact status of log blocks and log block management schemes in FTL did not consider the behavior of write buffer management scheme. In this paper, we first show that log blocks and write buffer have a tight relationship to each other, which necessitates integrated management of both of them. Since log blocks also can be viewed as another type of write buffer, we can manage both of them as an integrated write buffer. Then we provide three design criteria for the integrated write buffer management scheme which can be very useful to SSD firmware designers.

Effect of Nitrogen, Titanium, and Yttrium Doping on High-K Materials as Charge Storage Layer

  • Cui, Ziyang;Xin, Dongxu;Park, Jinsu;Kim, Jaemin;Agrawal, Khushabu;Cho, Eun-Chel;Yi, Junsin
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.33 no.6
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    • pp.445-449
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    • 2020
  • Non-volatile memory is approaching its fundamental limits with the Si3N4 storage layer, necessitating the use of alternative materials to achieve a higher programming/erasing speed, larger storage window, and better data retention at lower operating voltage. This limitation has restricted the development of the charge-trap memory, but can be addressed by using high-k dielectrics. The paper reviews the doping of nitrogen, titanium, and yttrium on high-k dielectrics as a storage layer by comparing MONOS devices with different storage layers. The results show that nitrogen doping increases the storage window of the Gd2O3 storage layer and improves its charge retention. Titanium doping can increase the charge capture rate of HfO2 storage layer. Yttrium doping increases the storage window of the BaTiO3 storage layer and improves its fatigue characteristics. Parameters such as the dielectric constant, leakage current, and speed of the memory device can be controlled by maintaining a suitable amount of external impurities in the device.

Improved Uniformity in Resistive Switching Characteristics of GeSe Thin Film by Ag Nanocrystals

  • Park, Ye-Na;Shin, Tae-Jun;Lee, Hyun-Jin;Lee, Ji-Soo;Jeong, Yong-Ki;Ahn, So-Hyun;Lee, On-You;Kim, Jang-Han;Nam, Ki-Hyun;Chung, Hong-Bay
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.08a
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    • pp.237.2-237.2
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    • 2013
  • ReRAM cell, also known as conductive bridging RAM (CBRAM), is a resistive switching memory based on non-volatile formation and dissolution of conductive filament in a solid electrolyte [1,2]. Especially, Chalcogenide-based ReRAM have become a promising candidate due to the simple structure, high density and low power operation than other types of ReRAM but the uniformity of switching parameter is undesirable. It is because diffusion of ions from anode to cathode in solid electrolyte layer is random [3]. That is to say, the formation of conductive filament is not go through the same paths in each switching cycle which is one of the major obstacles for performance improvement of ReRAM devices. Therefore, to control of nonuniform conductive filament formation is a key point to achieve a high performance ReRAM. In this paper, we demonstrated the enhanced repeatable bipolar resistive switching memory characteristics by spreading the Ag nanocrystals (Ag NCs) on amorphous GeSe layer compared to the conventional Ag/GeSe/Pt structure without Ag NCs. The Ag NCs and Ag top electrode act as a metal supply source of our devices. Excellent resistive switching memory characteristics were obtained and improvement of voltage distribution was achieved from the Al/Ag NCs/GeSe/Pt structure. At the same time, a stable DC endurance (>100 cycles) and an excellent data retention (>104 sec) properties was found from the Al/Ag NCs/GeSe/ Pt structured ReRAMs.

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An Efficient Data Block Replacement and Rearrangement Technique for Hybrid Hard Disk Drive (하이브리드 하드디스크를 위한 효율적인 데이터 블록 교체 및 재배치 기법)

  • Park, Kwang-Hee;Lee, Geun-Hyung;Kim, Deok-Hwan
    • Journal of KIISE:Computing Practices and Letters
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    • v.16 no.1
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    • pp.1-10
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    • 2010
  • Recently heterogeneous storage system such as hybrid hard disk drive (H-HDD) combining flash memory and magnetic disk is launched, according as the read performance of NAND flash memory is enhanced as similar to that of hard disk drive (HDD) and the power consumption of NAND flash memory is reduced less than that of HDD. However, the read and write operations of NAND flash memory are slower than those of rotational disk. Besides, serious overheads are incurred on CPU and main memory in the case that intensive write requests to flash memory are repeatedly occurred. In this paper, we propose the Least Frequently Used-Hot scheme that replaces the data blocks whose reference frequency of read operation is low and update frequency of write operation is high, and the data flushing scheme that rearranges the data blocks into the multi-zone of the rotation disk. Experimental results show that the execution time of the proposed method is 38% faster than those of conventional LRU and LFU block replacement schemes in I/O performance aspect and the proposed method increases the life span of Non-Volatile Cache 40% higher than those of conventional LRU, LFU, FIFO block replacement schemes.

Resistive Memory Switching in Ge5Se5 Thin Films

  • Kim, Jang-Han;Hwang, Yeong-Hyeon;Chung, Hong-Bay
    • Proceedings of the Korean Vacuum Society Conference
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    • 2014.02a
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    • pp.326-326
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    • 2014
  • It has been known since the mid 1960s that Ag can be photodissolved in chalcogenide glasses to form materials with interesting technological properties. In the 40 years since, this effect has been used in diverse applications such as the fabrication of relief images in optical elements, micro photolithographic schemes, and for direct imaging by photoinduced Ag surface deposition. ReRAM, also known as conductive bridging RAM (CBRAM), is a resistive switching memory based on non-volatile formation and dissolution of a conductive filament in a solid electrolyte. Especially, Ag-doped chalcogenide glasses and thin films have become attractive materials for fundamental research of their structure, properties, and preparation. Ag-doped chalcogenide glasses have been used in the formation of solid electrolyte which is the active medium in ReRAM devices. In this paper, we investigated the nature of thin films formed by the photo-dissolution of Ag into Ge-Se glasses for use in ReRAM devices. These devices rely on ion transport in the film so produced to create electrically programmable resistance states [1-3]. We have demonstrated functionalities of Ag doped chalcogenide glasses based on their capabilities as solid electrolytes. Formation of such amorphous systems by the introduction of Ag+ ions photo-induced diffusion in thin chalcogenide films is considered. The influence of Ag+ ions is regarded in terms of diffusion kinetics and Ag saturation is related to the composition of the hosting material. Saturated Ag+ ions have been used in the formation of conductive filaments at the solid electrolyte which is the active medium in ReRAM devices. Following fabrication, the cell displays a metal-insulator-metal structure. We measured the I-V characteristics of a cell, similar results were obtained with different via sizes, due to the filamentary nature of resistance switching in ReRAM cell. As the voltage is swept from 0 V to a positive top electrode voltage, the device switches from a high resistive to a low resistive, or set. The low conducting, or reset, state can be restored by means of a negative voltage sweep where the switch-off of the device usually occurs.

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A Light Incident Angle Stimulated Memristor Based on Electrochemical Process on the Surface of Metal Oxide

  • Park, Jin-Ju;Yong, Gi-Jung
    • Proceedings of the Korean Vacuum Society Conference
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    • 2014.02a
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    • pp.174-174
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    • 2014
  • Memristor devices are one of the most promising candidate approaches to next-generation memory technologies. Memristive switching phenomena usually rely on repeated electrical resistive switching between non-volatile resistance states in an active material under the application of an electrical stimulus, such as a voltage or current. Recent reports have explored the use of variety of external operating parameters, such as the modulation of an applied magnetic field, temperature, or illumination conditions to activate changes in the memristive switching behaviors. Among these possible choices of signal controlling factors of memristor, photon is particularly attractive because photonic signals are not only easier to reach directly over long distances than electrical signal, but they also efficiently manage the interactions between logic devices without any signal interference. Furthermore, due to the inherent wave characteristics of photons, the facile manipulation of the light ray enables incident light angle controlled memristive switching. So that, in the tautological sense, device orienting position with regard to a photon source determines the occurrence of memristive switching as well. To demonstrate this position controlled memory device functionality, we have fabricated a metal-semiconductor-metal memristive switching nanodevice using ZnO nanorods. Superhydrophobicity employed in this memristor gives rise to illumination direction selectivity as an extra controlling parameter which is important feature in emerging. When light irradiates from a point source in water to the surface treated device, refraction of light ray takes place at the water/air interface because of the optical density differences in two media (water/air). When incident light travels through a higher refractive index medium (water; n=1.33) to lower one (air; n=1), a total reflection occurs for incidence angles over the critical value. Thus, when we watch the submerged NW arrays at the view angles over the critical angle, a mirror-like surface is observed due to the presence of air pocket layer. From this processes, the reversible switching characteristics were verified by modulating the light incident angle between the resistor and memristor.

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Design of Small-Area MTP Memory Based on a BCD Process (BCD 공정 기반 저면적 MTP 설계)

  • Soonwoo Kwon;Li Longhua;Dohoon Kim;Panbong Ha;Younghee Kim
    • Journal of IKEEE
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    • v.28 no.1
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    • pp.78-89
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    • 2024
  • PMIC chips based on a BCD process used in automotive semiconductors require multi-time programmable (MTP) intellectual property (IP) that does not require additional masks to trim analog circuits. In this paper, MTP cell size was reduced by about 18.4% by using MTP cells using PMOS capacitors (PCAPs) instead of NMOS capacitors (NCAPs) in MTP cells, which are single poly EEPROM cells with two transistors and one MOS capacitor for small-area MTP IP design. In addition, from the perspective of MTP IP circuit design, the two-stage voltage shifter circuit is applied to the CG drive circuit and TG drive circuit of MTP IP design, and in order to reduce the area of the DC-DC converter circuit, the VPP (=7.75V), VNN (=-7.75V) and VNNL (=-2.5V) charge pump circuits using the charge pumping method are placed separately for each charge pump.

Preparation of Lead Titanate by Sol-Gel Method and Characteristic of Organic Acid Adsorption (졸겔법에 의한 티탄산납 제조 및 유기산 흡착특성)

  • Kim, Ju-Ho;Song, Jee-Hoon;Shin, Bo-Chul;Han, Sang-Oh;Song, Kun-Ho;Lee, Kwang-Rae
    • Journal of Industrial Technology
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    • v.21 no.B
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    • pp.133-139
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    • 2001
  • Generally $PbTiO_3$ is manufactured in a form of thin films which is useful for the application of infrared sensors and non-volatile memory devices. Moreover $PbTiO_3$ has a characteristic of adsorption for organic acid as well as electronic property. Organic acid adsorption properties of $PbTiO_3$ powder prepared by sol-gel method was compared with the powder purchased from Aldrich Co. Crystallization and particle size of $PbTiO_3$ are influenced by process variables, such as dilution of sol solution, catalysis, calcination temperature, calcination time, etc. As the size of $PbTiO_3$ power decreased until several nanometers, adsorption of acetic acid and formic acid was increased 1.5-fold and 1.2-fold respectively.

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Power Quality Monitoring with Electronic Watt-hour meter and Wireless communication module (전자식 전력량계와 무선모듈을 이용한 전력품질 표시 및 모니터링)

  • Jung, Deug-Il;Son, Young-Dae
    • Proceedings of the KIEE Conference
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    • 2007.10c
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    • pp.172-174
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    • 2007
  • An electronic watt-hour meter with high-precision measurement technology can provide many valuable metering data of a real-time system measurements, such as per-phase voltage, ampere, active power, reactive power, apparent power, power factor, and system frequency. Also many of accumulated metering data such as active energy, reactive energy, apparent energy, and load profile can be gettable from an electronic watt-hour meter[1]. This paper presents an approach of the small-sized AMR (Automatic Meter Reading) that provides customers with a very valuable electrical service. This AMR service transmits lots of a valuable metering data by using ZigBee communication module, so that users resided in their premises can use the information to audit a power quality and improve their electrical conditions by using the PQ monitoring device equipped with ZigBee receiver. This PQ monitoring device shows metering data on LCD and transmits to the PC through an internal network. Also, the device can keep the valuable meter data into a built-in non-volatile memory. The final goal of this paper is to better understand the power quality of electrical systems and offer the power qualify information for the convenience of all power consumers.

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The resistance characterization of OTP device using anti-fuse MOS capacitor after programming (안티퓨즈 MOS capacitor를 이용한 OTP 소자의 프로그래밍 후의 저항특성)

  • Chang, Sung-Keun;Kim, Youn-Jang
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.13 no.6
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    • pp.2697-2701
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    • 2012
  • The yield of OTP devices using anti-fuse MOS capacitor have been affected by the input resistance, the size of the pass transistor and the read transistor, and the readout voltage of programed cell. To investigate the element which gives an effect to yield, we analyze the full map data of the resistance characterization of OTP device and those data in a various experimental condition. As a result, we got the optimum conditions which is necessary to the yield improvement. The optimum conditions are as follows: Input resistance is 50 ohms, the channel length of pass transistor is 10um, read voltage is 2.8 volt, respectively.