• Analytical Science and Technology
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• v.9 no.3
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• pp.262-269
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• 1996

The muiltiwire proportional counter for the measurement of low-level and environmental $\alpha$ particles emitting nuclides was developed. External dimension of the devloped multiwire proportional counter is $350{\times}290{\times}30mm$ and the sensitivity area is $250{\times}200mm$. The wall material of the detector was selected the stainless steel to prevent the deformation by external impact and to obtain minimum background. The anode and cathode wires were used the stainless steel material of diameter $50{\mu}m$. The spacing of each wires are 10.0mm, 5.0mm and the numbers of total wire are 21, 42 lines, respectively. The multiwire proportional counter was designed that the measurement source is placed within the detector to prevent the wall absorption effect and the efficiency variation by various source heights. The characteristics of the developed detector have been investigated to obtain the plateau, operating voltage, background, counting efficiency, position sensitivity and energy resolution etc. For the $^{241}Am$ nuclide, the calculated LLD(Lower Limit of Detection) is 5.0mBq/L which is lower than 40mBq/L of recommended LLD value by ISO(International Organization for Standardization).

• Journal of Sensor Science and Technology
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• v.4 no.4
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• pp.62-69
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• 1995

We have developed the digital radiography system applied by the one dimensional multiwire proportional chamber. X-ray position signals were obtained from anode wires which were connected to counters through amplifiers and discriminators. The chamber was made of gas flow type and detector gas was P10. The threshold voltage which gives to the discriminator is independent on the neighboring channels. This improved the uniformity of the detector. Then the differential nonlineality is ${\pm}4%$. Increasing the gas pressure, the spatial resolution is about 1.4-mm at which the pitch of the anode wire is 2-mm. The object is scanned in vertical direction to take an image. The number of pixels in the image is $32{\times}32$.

• Journal of electromagnetic engineering and science
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• v.4 no.1
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• pp.43-49
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• 2004

A low-frequency coaxial reflectometer(LCR) with a thin-wire inner conductor is designed and constructed to measure nondestructively the absorbing performance of electromagnetic absorbers in the frequency range of 10 MHz to 200 MHz. The LCR consists of a square coaxial transmission line and a network analyzer with a time-domain measurement capability. Inherent characteristics of a square coaxial line with a thin-wire inner conductor which deteriorate the impedance matching of the input port of the LCR are addressed. And the characteristics are improved by employing a multiwire inner conductor. Measured and calculated reflection losses of a flat ferrite tile absorber are presented.

• Journal of Astronomy and Space Sciences
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• v.10 no.1
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• pp.86-93
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• 1993

We experiment of the method to obtain the uniform gas multiplication in multiwire proportional counter. The general techenique of anode wire connection for the high voltage supply could not secure the uniformity of multiplication because of the edge effect at the outer anode wires. We found that the variation of the multiplication could be corrected in the accuracy of $\pm$1.6% rms using the voltage compansation method.

• Tribology and Lubricants
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• v.34 no.6
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• pp.209-216
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• 2018

Sapphire is a substrate material that is widely used in optical and electronic devices. However, the processing of sapphire into a substrate takes a long time owing to its high hardness and chemical inertness. In order to process the sapphire ingot into a substrate, ingot growth, multiwire sawing, lapping, and polishing are required. The lap grinding process using pellets is known as one of the ways to improve the efficiency of sapphire substrate processing. The lap grinding process ensures high processing efficiency while utilizing two-body abrasion, unlike the lapping process which utilizes three-body abrasion by particles. However, the lap grinding process has a high material removal rate (MRR), while its weakness is in obtaining the required surface roughness for the final polishing process. In this study, we examine the effects of free abrasives in lap grinding on the material removal characteristics of sapphire substrate. Before conducting the lap grinding experiments, it was confirmed that the addition of free abrasives changed the friction force through the pin-on-disk wear test. The MRR and roughness reduction rate are experimentally studied to verify the effects of free abrasive concentration on deionized water. The addition of free abrasives (colloidal silica) in the lap grinding process can improve surface roughness by three-body abrasion along with two-body abrasion by diamond grits.