• Title/Summary/Keyword: minority minority

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Effects of the Local Lifetime Control on the Switching and Latch-up Characteristics of IGBT (Local Lifetime Control이 TGBT의 스위칭 및 래치업 특성에 미치는 영향)

  • Lee, Se-Kyu;Chung, Sang-Koo
    • Proceedings of the KIEE Conference
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    • 1999.07d
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    • pp.1953-1955
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    • 1999
  • The effects of the local lifetime control on the characteristics of IGBT are investigated using the 2-dimensional device simulator, MEDICI. Many lumped resistive turn-off simulations are carried out to analyze the effects of the minority carrier lifetime, the width, and the position of the region with a reduced local minority carrier lifetime. As a result of these simulations, it is concluded that the on state voltage drop$(V_{CE,SAT})$ is only slightly increased while the switching behavior is greatly improved if the low lifetime region is properly set. And these results are compared with IGBTs having uniform lifetime.

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후열 처리 조건에 따른 a-Si/c-Si 이종접합 태양전지 특성 분석

  • Kim, Kyung Min;Jeong, Dae Young;Song, Jun Yong;Kim, Chan Seok;Koo, Hye Young;Oh, Byung Sung;Song, Jinsoo;Lee, Jeong Chul
    • 한국신재생에너지학회:학술대회논문집
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    • 2010.11a
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    • pp.58.2-58.2
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    • 2010
  • 본 연구에서는 n-type wafer에 비정질 실리콘을 증착한 이종접합 태양전지를 열처리 방법을 이용하여 열처리의 효과를 분석함으로써 이종접합 태양전지에 효율적인 열처리 효과에 대하여 연구하였다. P, N-layer는 PECVD(Plasma-enhanced chemical vapor deposition) I-layer는 HWCVD(Hot wire chemical vapor deposition), ITO는 RF 마그네트론 스퍼터링법으로 동일한 조건에서 제작하였고 rapid thermal process를 이용하여 진공 중에서 $150^{\circ}C$, $200^{\circ}C$, $220^{\circ}C$, $250^{\circ}C$까지 열처리를 하였다. 열처리 전과 후 QSSPC로 minority carrier life time, 자외 가시선 분광분석 장치로 투과 반사도를, Ellipsometer로 흡수 계수 등의 변화를 조사하였다. 열처리 후 Minority carrier life time, Voc 및 광변환 효율이 증가하였다.

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Business Orientation, Goals and Satisfaction of Korean-American Business Owners

  • Ryu, Jay-Sang;Swinney, Jane;Muske, Glenn;Zachary, Ramona Kay
    • Asian Journal of Business Environment
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    • v.2 no.2
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    • pp.5-11
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    • 2012
  • Purpose - This research examined the relationship between business orientation and business goals and satisfaction of Korean-American business owners. Research design/data/methodology - Entrepreneurial Orientation (EO) and Small Business Orientation (SBO) were the theoretical constructs underlying this research. The responses from 200 Korean-American business owners who participated in the 2005 National Minority Business Owner Surveys were used for data analysis. Results - Noneconomic business goal was positively related to business owners' SBO tendency, and those with a SBO tendency had the higher business satisfaction than those with EO. Conclusions - The findings suggest that policy makers should develop business assistance programs that correspond with owners' business orientation.

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Phophorus External Gettering for High Quality Wafer of Silicon Heterojunction Solar Cells

  • Park, Hyo-Min;Tak, Seong-Ju;Kim, Chan-Seok;Park, Seong-Eun;Kim, Yeong-Do;Kim, Dong-Hwan
    • Proceedings of the Materials Research Society of Korea Conference
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    • 2011.05a
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    • pp.43.2-43.2
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    • 2011
  • Minority Carrier recombination should be suppressed for high efficiency solar cells. However, impurities in the silicon bulk region deteriorate the minority carrier lifetimes, causes conversion efficiency drop. In this study, we introduced phosphorus external gettering for silicon heterojunction solar cell substrates. Gettering was undergone at 750, 800, 850 and $900^{\circ}C$ in furnace for 30 minutes. Bulk lifetimes and calculated diffusion length were improved. We applied phosphorus gettering to silicon heterojunction solar cells. Gettered group and ungettered group were used as substrate of silicon heterojunction solar cells. After fabrication, characteristics of solar cells were analyzed. The results were observed to see the enhancement of substrate quality which directly connects with solar cell properties.

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The study of High-efficiency method usign Tri-crystalline Silicon solar cells (삼결정 실리콘 태양전지의 19%변환 효율 최적요건 고찰에 관한 연구)

  • 이욱재;박성현;고재경;김경해;이준신
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2002.07a
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    • pp.318-321
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    • 2002
  • This paper presents a proper condition to achieve high conversion efficiency using PC1D simulator on sri-crystalline Si solar cells. Various efficiency influencing parameters such as rear surface recombination velocity and minority carrier diffusion length in the base region, front surface recombination velocity, junction depth and doping concentration in the Emitter layer, BSF thickness and doping concentration were investigated. Optimized cell parameters were given as rear surface recombination of 1000 cm/s, minority carrier diffusion length in the base region 200 $\mu\textrm{m}$, front surface recombination velocity 100 cm/s, sheet resistivity of emitter layer 100 Ω/$\square$, BSF thickness 5 $\mu\textrm{m}$, doping concentration 5${\times}$10$\^$19/ cm$\^$-3/. Among the investigated variables, we learn that a diffusion length of base layer acts as a key factor to achieve conversion efficiency higher than 19 %.

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A Study on Quality Degradation of Semiconductor Devices by Electron Bean Exposure (전자빔 조사에 의한 반도체 소자의 기능저하 연구)

  • Cho, Gyu-Seong;Lee, Tae-Hoon
    • Proceedings of the KIEE Conference
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    • 1997.11a
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    • pp.692-696
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    • 1997
  • 본 연구에서는 BJT(Bipolar Junction Transistor)와 MOSFET (Metal Oxide Semiconductor Field Effect Transistor) 등을 1MeV에너지의 전자빔을 선량을 변화시켜가며 조사시켜 그 특성 변화를 분석하였다. BJT에 대해서는 조사 전, 후의 전류 이득의 측정을 통해 base 에서의 minority-carrie의 수명 변화에 의해서 전류 이득이 감소하는 것으로 나타났으며, MOSFET의 경우는 oxide 지역의 전하량 변화에 의해서 문턱 전압이 영향을 받음을 확인할 수 있었다. BJT의 minority-carrier의 수명 감소량은 조사 선량이 증가함에 따라 직선적으로 변화함을 알 수 있었고, MOSFET의 문턱 전압의 변화는 nMOS와 pMOS의 경우 서로 다름을 관찰할 수 있었는데 이는 oxide내에서 발생하는 전하에 의해 차이가 남을 알 수 있었다.

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열선 CVD를 이용한 a-Si:H의 c-Si표면 passivation 및 열처리 효과 분석

  • Jeong, Dae-Young;Kim, Chan-Seok;Song, Jun-Yong;Wang, Jin-Suk;Park, Sang-Hyun;Lee, Jeong-Chul
    • 한국신재생에너지학회:학술대회논문집
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    • 2009.11a
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    • pp.397-397
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    • 2009
  • c-Si wafer에 HWCVD로 증착된 a-Si:H 박막은 초기에 낮은 passivation 특성을 가지나 열처리 공정을 통해 효과적인 passivation을 가진다. 열처리 공정은 온도와 시간에 따라 큰 차이를 보인다. 이에 열선CVD를 이용하여 n type의 c-Si 기판에 a-Si:H을 증착하여 열처리 온도에 따른 Minority carrier Lifetime를 QSSPC를 통해 passivation 특성을 측정하였다. 온도는 $150^{\circ}C{\sim}270^{\circ}C$로 변화하여 측정하였다. 또한 열처리 시간을 10분씩 증가시켜 열처리 시간에 따른 passivation을 연구, 1ms에 이르는 Minority carrier lifetime을 얻었다.

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A Study on Optimal Design of Silicon Solar Cell (실리콘 태양전지 최적설계에 관한 연구)

  • ;;;Suresh Kumar Dhungel
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.53 no.4
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    • pp.187-191
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    • 2004
  • In this work, we used the PCID simulator for simulation of solar cell and examined the effect of front-back surface recombination velocity, minority carrier diffusion length, junction depth and emitter sheet-resistance. As the effect of base thickness, the efficiency decreased by the increase in series resistance with the increase of the thickness and found decrease in efficiency by decrease of the current as the effect of the recombination. Also, as the effect of base resistivity, the efficiency increased somewhat with the decrease in resistivity, but when the resistivity exceeded certain value, the efficiency decreased as a increase in the recombination ratio. The optimum efficiency was obtained at the resistivity 0.5 $\Omega$-cm, and thickness $100\mu\textrm{m}$. We have successfully achieved 10.8% and 13.7% efficiency large area($103mm{\times}103mm$) mono-crystalline silicon solar cells without and with PECVD silicon nitride antireflection coating.

Characteristics of the Avalanche Injection on SiO2Layer in MOS Structures (MOS 구조에서의 Avalanche Injection에 관한 연구)

  • 성영권;김성진;백우현;박찬원
    • The Transactions of the Korean Institute of Electrical Engineers
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    • v.34 no.6
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    • pp.244-252
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    • 1985
  • A model is presented to explain charging phenomena into the oxide layer when a metal-oxide-silicon(MOS) capacitor is driven by a large amplitude and high frequency ac signal sufficient to produce avalanche injection in the silicon. During avalanche, minority carriers are injected. It is assumed that some of these minority carriers attain sufficient energy to surmount the potential barrier at the interface, and then inter the oxide. Measurements of C-V curves are made for the MOS capacitor with p-type silicon substrates before and after avalanche injection. This paper studies how charging in the oxide and the interface depends on oxide properties. It is concluded that this charging effect is related to the presence of water in the oxide.

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